High-voltage energy-dispersive spectroscopy using a low-voltage scanning electron microscope
View Patent ↗A scanning electron microscopy (SEM) and energy dispersive spectroscopy (EDS) apparatus that includes a scanning electron microscope, an x-ray detector, and an auxiliary acceleration voltage source. The scanning electron microscope includes a sample holder, and a layered electron beam column arranged to output an electron beam towards the sample holder at an initial beam energy. The auxiliary acceleration voltage source is to apply an auxiliary acceleration voltage between the sample holder and the layered electron beam column to accelerate the electron beam to a final beam energy. At the final beam energy, the electron beam is capable of generating x-rays at multiple wavelengths from a larger range of atomic species than the electron beam at the initial beam energy.
1. A scanning electron microscopy (SEM) an energy dispersive spectroscopy (EDS) apparatus, comprising:
a scanning electron microscope comprising a sample holder, undo layered electron beam column arranged to output an electron beam towards the sample holder at an initial beam energy;
an x-ray detector; and
an auxiliary acceleration voltage source to apply an auxiliary acceleration voltage between the sample holder and the layered electron beam column to accelerate the electron beam to a final beam energy, the electron beam at the final beam energy capable of generating x-rays at multiple wavelengths from a larger range of atomic species than the electron beam at the initial beam energy.
2. The spectroscopy apparatus of claim 1 , in which the x-ray detector comprises a silicon drift detector.
3. The spectroscopy apparatus of claim 2 , in which the silicon drift detector is part of a silicon drift detector die mounted on the layered electron beam column.
4. The spectroscopy apparatus of claim 3 , in which the silicon drift detector die is mounted on a surface of the layered electron beam column facing the sample holder.
5. The spectroscopy apparatus of claim 3 , in which:
the layered electron beam column comprises a detector mounting chamber defined therein, the detector mounting chamber comprising an inclined detector mounting surface; and
the silicon drift detector die is mounted on the inclined detector mounting surface.
6. The spectroscopy apparatus of claim 5 , in which:
the layered electron beam column comprises one or more additional inclined detector mounting surfaces defined therein; and
the spectroscopy apparatus additionally comprises:
a respective additional silicon drift detector die mounted on each of the additional inclined detector mounting surfaces, and
a summing circuit to sum x-ray detection signal components generated by the silicon drift detector dies to generate an x-ray detection signal having a higher signal-to-noise ratio than the x-ray detection signal components.
7. The spectroscopy apparatus of claim 3 , additionally comprising:
additional silicon drift detector dies mounted on the surface of the layered electron beam column facing the sample holder; and
a summing circuit to sum x-ray detection signal components generated by the silicon drift detector dies to generate an x-ray detection signal having a higher signal-to-noise ratio than the x-ray detection signal components.
8. The spectroscopy apparatus of claim 2 , in which the silicon drift detector and a silicon photodiode electron detector are integrated on a common multi-detector die mounted on a surface of the layered electron beam column facing the sample holder.
9. The spectroscopy apparatus of claim 2 , in which:
the silicon drift detector and a silicon photodiode electron detector are integrated on a common multi-detector die; and
the layered electron beam column comprises a detector mounting chamber defined therein, the detector mounting chamber comprising an inclined detector mounting surface on which the multi-detector die is mounted.
10. The spectroscopy apparatus of claim 2 , in which:
the x-ray detector additionally comprises thermoelectric cooler comprising a cold face; and
the silicon drift detector is mounted on the cold face of the thermoelectric cooler.
11. The spectroscopy apparatus of claim 2 , in which the x-ray detector additionally comprises an amplifier electrically connected to the silicon drift detector.
12. The spectroscopy apparatus of claim 1 , in which the auxiliary acceleration voltage source sets the sample holder to a voltage more positive than the layered electron beam column.
13. The spectroscopy apparatus of claim 1 , in which the auxiliary acceleration voltage source comprises a high-voltage power supply.
14. The spectroscopy apparatus of claim 1 , in which the auxiliary acceleration voltage source comprises an electrical connector to receive the auxiliary acceleration voltage from an external high-voltage power supply.
15. The spectroscopy apparatus of claim 1 , additionally comprising a controller to correct x-ray image distortion resulting from the auxiliary acceleration voltage.
16. The spectroscopy apparatus of claim 1 , additionally comprising an electrical connector in series between the auxiliary acceleration voltage source and the sample holder, the electrical connector automatically disconnecting upon removal of the sample holder from the spectroscopy apparatus.
17. The spectroscopy apparatus of claim 1 , in which:
the auxiliary acceleration voltage is additionally to dive electrons away from the x-ray detector; and
the x-ray detector lacks an electron trap.
18. A scanning electron microscopy (SEM) and energy dispersive spectroscopy (EDS) apparatus, comprising:
a scanning electron microscope comprising a sample holder, and an electron beam column arranged to output an electron beam towards the sample holder, the electron beam column subject to a voltage limitation that limits the electron beam to an initial beam energy incapable of generating x-rays at multiple wavelengths from atomic species having atomic numbers greater than a threshold atomic number;
an x-ray detector; and
an auxiliary acceleration voltage source to apply an auxiliary acceleration voltage between the sample holder and the electron beam column to accelerate the electron beam to a final beam energy, the electron beam at the final beam energy capable of generating x-rays at multiple wavelengths from atomic species having atomic numbers greater than the threshold atomic number.
19. The spectroscopy apparatus of claim 18 , in which the x-ray detector comprises a silicon drift detector die mounted on the electron beam column, the silicon drift detector die comprising a silicon drift detector.
20. The spectroscopy apparatus of claim 18 , in which the x-ray detector comprises a multi-detector die mounted on the electron beam column, the multi-detector die comprising a silicon drift detector and additionally comprising an electron detector.