IP Library Granted Patent US 8,982,656
Granted Patent B2
US 8,982,656 · App. 14/168,759 · Granted Mar 17, 2015

Non-volatile semiconductor memory device and semiconductor device

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Quick Facts
Patent No.
US 8,982,656
App. No.
14/168,759
Granted
Mar 17, 2015
Kind
B2
Abstract

Provided is a semiconductor non-volatile memory device capable of improving the accuracy of trimming by creating a written state before data is written into a non-volatile memory element. The semiconductor non-volatile memory device includes: a written data transmission circuit for transmitting written data to a non-volatile memory element; a first switch connected between the non-volatile memory element and a data output terminal; a third switch connected to an output terminal of the written data transmission circuit; and a control circuit for controlling the respective switches. When a test mode signal is input, the control circuit turns on only the first switch and the third switch so as to control the written data to be output to the data output terminal before data is written into the non-volatile memory element.

Claims (18)

1. A non-volatile semiconductor memory device, comprising:

a non-volatile memory element;

a data output terminal for outputting data of the non-volatile memory element;

a latch circuit for holding the data connected to the data output terminal;

a written data transmission circuit for outputting written data to the non-volatile memory element;

a first switch connected between the non-volatile memory element and the data output terminal;

a second switch connected between the data output terminal and a low voltage side power supply terminal;

a third switch connected to an output terminal of the written data transmission circuit;

a fourth switch connected between the non-volatile memory element and a high voltage side power supply terminal; and

a control circuit for controlling the first switch, the second switch, the third switch, and the fourth switch,

the control circuit comprising a test terminal,

the control circuit being configured to, when a test mode signal is input to the test terminal, turn on the first switch by a first control signal, turn off the second switch by a second control signal, turn on the third switch by a third control signal, and turn off the fourth switch by a fourth control signal, to control the written data of the written data transmission circuit to be output to the data output terminal.

2. A non-volatile semiconductor memory device according to claim 1 , wherein:

the first switch is controlled by a signal based on the first control signal and the written data;

the second switch is controlled by a signal based on the second control signal and the written data; and

the third switch is controlled by a signal based on the third control signal and the written data.

3. A semiconductor device, comprising a trimming data memory circuit,

the trimming data memory circuit comprising the non-volatile semiconductor memory device according to claim 1 .

Assignments (5)
CHANGE OF ADDRESS Recorded Jun 8, 2023
From: ABLIC INC.
To: ABLIC INC.
Reel/Frame 064021/0575 →
CHANGE OF NAME Recorded Mar 12, 2018
From: SII SEMICONDUCTOR CORPORATION
To: ABLIC INC.
Reel/Frame 045567/0927 →
CORRECTIVE ASSIGNMENT TO CORRECT THE EXECUTION DATE PREVIOUSLY RECORDED AT REEL: 037783 FRAME: 0166. ASSIGNOR(S) HEREBY CONFIRMS THE ASSIGNMENT. Recorded Feb 23, 2016
From: SEIKO INSTRUMENTS INC
To: SII SEMICONDUCTOR CORPORATION
Reel/Frame 037903/0928 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Feb 11, 2016
From: SEIKO INSTRUMENTS INC
To: SII SEMICONDUCTOR CORPORATION .
Reel/Frame 037783/0166 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jan 31, 2014
From: MITANI, MAKOTO; WATANABE, KOTARO
To: SEIKO INSTRUMENTS INC.
Reel/Frame 032106/0741 →