OLED with sporadic flattening layer between two barrier layers
View Patent ↗According to one embodiment, an organic semiconductor device includes a supporting substrate, a plurality of organic EL light emitting elements, a first barrier layer, a flattening layer, and a second barrier layer. The flattening layer exists sporadically and makes gentle in inclination steep elevation change present in the surface of the first barrier layer. The first barrier layer and the second barrier layer are made of moisture penetration preventive material.
1. A method of manufacturing an organic semiconductor device, comprising:
forming a plurality of anodes and a plurality of organic layers including an emitting layer respectively, any one of the anodes and a corresponding one of the organic layers constituting a corresponding one of a plurality of pixels;
forming a cathode covering the organic layer and extending over the pixels;
forming out of moisture penetration preventive material a first barrier layer having a surface, covering the cathode and extending over the pixels;
forming a flattening layer sporadically existent on the first barrier layer to make gentle in inclination any steep elevation change present in the surface of the first barrier layer; and
forming out of moisture penetration preventive material a second barrier layer extending over the pixels and covering the first barrier layer and the flattening layer,
wherein
the flattening layer is formed by vaporously spraying on the supporting substrate in a vacuum environment a solvent having been obtained by mixing a polymeric resin and a polymerization initiator so as to form bodies of the sprayed solvent sporadically existent on the supporting substrate, applying ultraviolet light to the bodies to cause the bodies to be cured and to form a sporadically existent polymeric resin layer, and removing thin film portions of the sporadically existent polymeric resin layer by etching.
2. The method of claim 1 , wherein the first barrier layer includes at least on of silicon nitride, silicon oxide, and silicon oxynitride.
3. The method of claim 1 , wherein the second barrier layer includes at least on of silicon nitride, silicon oxide, and silicon oxynitride.
4. The method of claim 1 , wherein the flattening layer includes a macromolecular organic film cured by polymerization reaction.
5. The method of claim 1 , wherein the cathode is formed by evaporation.