IP Library Granted Patent US 9,702,198
Granted Patent B1
US 9,702,198 · App. 14/199,571 · Granted Jul 11, 2017

Polycrystalline diamond compacts and methods of fabricating same

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Quick Facts
Patent No.
US 9,702,198
App. No.
14/199,571
Granted
Jul 11, 2017
Kind
B1
Abstract

Embodiments of the invention relate to methods of fabricating leached polycrystalline diamond compacts (“PDCs”) in which a polycrystalline diamond table thereof is leached and resized to provide a leached region having a selected geometry. Creating a leached region having such a selected geometry may improve the performance of the PDC in various conditions, such as impact strength and/or thermal stability.

Claims (22)

1. A method for fabricating a leached polycrystalline diamond compact, comprising:

providing a polycrystalline diamond compact including a polycrystalline diamond table bonded to a substrate, the polycrystalline diamond table including a plurality of bonded diamond grains defining a plurality of interstitial regions having an interstitial constituent disposed therein, the polycrystalline diamond table further including an upper surface and at least one side surface;

forming a first chamfer extending between the upper surface and the at least one side surface of the polycrystalline diamond table, the first chamfer exhibiting a first chamfer height measured from the upper surface to a bottom of the first chamfer;

after forming the first chamfer, leaching the polycrystalline diamond table to at least partially remove the interstitial constituent to form a leached region; and

after the act of leaching, forming a second chamfer extending between the upper surface and the at least one side surface of the polycrystalline diamond table, the second chamfer exhibiting a second chamfer height.

2. The method of claim 1 , wherein forming the second chamfer reduces a volume of the leached region.

3. The method of claim 1 , wherein the second chamfer height is greater than the first chamfer height.

4. The method of claim 1 , further comprising, after forming the first chamfer, removing material from a lateral surface of the polycrystalline diamond compact to a second depth.

5. The method of claim 4 , wherein the second depth is at least about equal to the first chamfer height.

6. The method of claim 1 , wherein the first chamfer height is less than about 400 μm.

7. The method of claim 1 , wherein the first chamfer height is about 100 μm to about 250 μm.

8. The method of claim 1 , wherein the first chamfer height is less than about 20 μm.

9. The method of claim 1 , wherein the leached region of the polycrystalline diamond table extends from the upper surface of the polycrystalline diamond table to a depth that is within 100 μm of the second chamfer height.

10. The method of claim 9 , wherein the depth is less than about 100 μm greater than the second chamfer height.

11. The method of claim 9 , wherein the depth is about 50 μm to about 100 μm greater than the second chamfer height.

12. The method of claim 1 , wherein the interstitial constituent includes a metallic catalyst.

13. A method for fabricating a polycrystalline diamond compact, comprising:

providing a polycrystalline diamond compact including a polycrystalline diamond table bonded to a substrate, the polycrystalline diamond table including a first chamfer extending between an upper surface and at least one side surface, the polycrystalline diamond table further including a leached region that is substantially free of an interstitial constituent;

removing a lateral portion of the polycrystalline diamond compact; and

forming a second chamfer extending between the upper surface of the polycrystalline diamond table and the at least one side surface of the polycrystalline diamond table, the second chamfer removing the first chamfer.

14. The method of claim 13 , wherein the first chamfer exhibits a first chamfer height, and wherein the second chamfer exhibits a second chamfer height that is greater than the first chamfer height.

15. The method of claim 13 , wherein the first chamfer exhibits a first chamfer height, and wherein the second chamfer exhibits a second chamfer height that is about 1.5 to about 3 times the first chamfer height.

Assignments (6)
SECURITY INTEREST Recorded Jul 18, 2025
From: US SYNTHETIC CORPORATION
To: KEYBANK NATIONAL ASSOCIATION
Reel/Frame 074973/0089 →
RELEASE OF SECURITY INTEREST IN PATENTS Recorded Jul 17, 2025
From: JPMORGAN CHASE BANK, N.A.
To: CHAMPIONX LLC; APERGY ESP SYSTEMS, LLC; APERGY BMCS ACQUISITION CORP; HARBISON-FISCHER, INC.; NORRIS RODS, INC.,; NORRIS RODS, INC.,; NORRISEAL-WELLMARK, INC.; PCS FERGUSON, INC.; QUARTZDYNE, INC.; US SYNTHETIC CORPORATION
Reel/Frame 072004/0019 →
RELEASE OF SECURITY INTEREST Recorded Jun 7, 2022
From: BANK OF AMERICA, N.A.
To: ACE DOWNHOLE, LLC; HARBISON-FISCHER, INC.; NORRIS RODS, INC.; PCS FERGUSON, INC.; QUARTZDYNE, INC.; SPIRIT GLOBAL ENERGY SOLUTIONS, INC.; THETA OILFIELD SERVICES, INC.; APERGY BMCS ACQUISITION CORP.; NORRISEAL-WELLMARK, INC.; US SYNTHETIC CORPORATION; WINDROCK, INC.
Reel/Frame 060305/0001 →
SECURITY INTEREST Recorded Jun 5, 2020
From: ACE DOWNHOLE, LLC; APERGY BMCS ACQUISITION CORP.; HARBISON-FISCHER, INC.; NORRIS RODS, INC.; NORRISEAL-WELLMARK, INC.; PCS FERGUSON, INC.; QUARTZDYNE, INC.; SPIRIT GLOBAL ENERGY SOLUTIONS, INC.; THETA OILFIELD SERVICES, INC.; US SYNTHETIC CORPORATION; WINDROCK, INC.
To: BANK OF AMERICA, N.A.
Reel/Frame 053790/0001 →
SECURITY AGREEMENT Recorded May 9, 2018
From: APERGY (DELAWARE) FORMATION, INC.; APERGY BMCS ACQUISITION CORP.; APERGY ENERGY AUTOMATION, LLC; HARBISON-FISCHER, INC.; NORRISEAL-WELLMARK, INC.; PCS FERGUSON, INC.; QUARTZDYNE, INC.; SPIRIT GLOBAL ENERGY SOLUTIONS, INC.; US SYNTHETIC CORPORATION; WINDROCK, INC.
To: JPMORGAN CHASE BANK, N.A.
Reel/Frame 046117/0015 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Mar 10, 2014
From: TOPHAM, GREG CARLOS
To: US SYNTHETIC CORPORATION
Reel/Frame 032392/0532 →