IP Library Granted Patent US 9,000,462
Granted Patent B2
US 9,000,462 · App. 14/206,468 · Granted Apr 7, 2015

Light emitting device

Inventor: Tae Yun Kim (Gwangju, KR)
Assignee: LG Innotek Co., Ltd.
H01L33/32H01L33/12H01L21/0254H01L21/0262
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Quick Facts
Patent No.
US 9,000,462
App. No.
14/206,468
Granted
Apr 7, 2015
Kind
B2
Abstract

Disclosed is a light emitting device. A light emitting device comprises a plurality of N-type semiconductor layers including a first N-type semiconductor layer and a second N-type semiconductor layer on the first N-type semiconductor layer, an active layer on the second N-type semiconductor layer, and a P-type semiconductor layer on the active layer, wherein the first N-type semiconductor layer comprises a Si doped Nitride layer and the second N-type semiconductor layer comprises a Si doped Nitride layer, and wherein the first and second N-type semiconductor layers have a Si impurity concentration different from each other.

Claims (34)

1. A light emitting device comprising:

a substrate;

at least two n-type semiconductor layers on the substrate, each of the at least two n-type semiconductor layers having a different Si concentration;

a first n-type semiconductor layer on the at least two n-type semiconductor layers, the first n-type semiconductor layer having less Si concentration than 5×10 18 /cm 3 ;

an active layer directly on the first n-type semiconductor layer;

a p-type semiconductor layer on the active layer; and

an electrode on the p-type semiconductor layer.

2. The light emitting device according to claim 1 , wherein the first n-type semiconductor layer has a Si concentration lower than a Si concentration of the at least two n-type semiconductor layers.

3. The light emitting device according to claim 1 , wherein the at least two n-type semiconductor layers comprises an n-type GaN layer.

4. The light emitting device according to claim 1 , further comprising an undoped GaN layer between the first n-type semiconductor layer and a top layer of the at least two n-type semiconductor layers.

5. The light emitting device according to claim 1 , wherein the first n-type semiconductor layer has a dislocation density lower than a dislocation density of the at least two n-type semiconductor layers.

6. The light emitting device according to claim 1 , further comprising a first electrode on a first portion of the first n-type semiconductor layer, and

a second electrode on the p-type semiconductor layer.

7. The light emitting device according to claim 1 , wherein the first n-type semiconductor layer comprises a GaN layer.

8. The light emitting device according to claim 1 , wherein the at least two n-type semiconductor layers comprise a first GaN layer and a second GaN layer disposed on the first GaN layer.

9. The light emitting device according to claim 1 , wherein the active layer comprises InGaN/GaN layer.

10. The light emitting device according to claim 1 , wherein the p-type semiconductor layer comprises a GaN layer.

11. The light emitting device according to claim 6 , further comprising an ohmic electrode layer between the second electrode and the p-type semiconductor layer.

12. A light emitting device comprising:

at least two n-type semiconductor layers, each of the at least two n-type semiconductor layers having a different Si concentration;

an undoped GaN layer on a top surface of the at least two n-type semiconductor layers;

a first n-type semiconductor layer on the at least two n-type semiconductor layers, the first n-type semiconductor layer having less Si concentration than 5×10 18 /cm 3 ;

an active layer directly on a first portion of the first n-type semiconductor layer;

a p-type semiconductor layer on the active layer;

a first electrode on a second portion of the first n-type semiconductor layer;

a second electrode on the p-type semiconductor layer.

13. The light emitting device according to claim 12 , wherein the first n-type semiconductor layer has a Si concentration lower than a Si concentration of the at least two n-type semiconductor layers.

14. The light emitting device according to claim 12 , wherein the at least two n-type semiconductor layers comprises an n-type GaN layer.

15. The light emitting device according to claim 12 , wherein the first n-type semiconductor layer has a dislocation density lower than a dislocation density of the at least two n-type semiconductor layers.

16. The light emitting device according to claim 12 , further comprising an ohmic electrode layer between the second electrode and the p-type semiconductor layer.

17. The light emitting device according to claim 12 , wherein the first n-type semiconductor layer comprises a GaN layer.

18. The light emtting device according to claim 12 , wherein the at least two n-type semiconductor layers comprise a first GaN layer and a second GaN layer disposed on the first GaN layer.

19. The light emitting device according to claim 12 , wherein the active layer comprises InGaN/GaN layer.

20. The light emitting device according to claim 12 , wherein the p-type semiconductor layer comprises a GaN layer.

Assignments (1)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded May 25, 2021
From: LG INNOTEK CO., LTD.
To: SUZHOU LEKIN SEMICONDUCTOR CO., LTD.
Reel/Frame 056366/0335 →
Priority Claims (1)
KR 10-2007-0039534 · Apr 23, 2007 · national
Continuity (4)
Continuation 13589974 · Aug 20, 2012
Continuation 13046520 · Mar 11, 2011
Continuation 12107256 · Apr 22, 2008
Related Publication 20140191245A1 · Jul 10, 2014