Granted Patent B2

US 9,964,399 · App. 14/207,140 · Granted May 8, 2018

Abstract

Claims (37)

1. A method comprising:

acquiring a profile of a surface of a component by an optical profilometry system, the surface being one of a plurality of component surfaces;

acquiring a photographic image of each surface of the plurality of surfaces concurrent with acquiring the profile of each surface of the plurality surfaces;

classifying a condition of the surface based on the acquired profile and photographic image, and

displaying a map of each surface of the plurality of surfaces comprising an iconic representation of each surface of the plurality of surfaces in a pattern corresponding to the physical arrangement of the surfaces with the iconic representation color to visually indicate surface degradation.

2. The method of claim 1 wherein the profile comprises a two-dimensional surface profile.

3. The method of claim 1 wherein the optical profilometry system comprises a laser.

4. The method of claim 3 further comprising illuminating a location on the surface with the laser at an angle normal to the surface and determining a depth at the location on the surface based on a lateral shift of the reflected illumination.

5. The method of claim 1 further comprising concurrently displaying the two-dimensional surface profile and the image of the surface.

6. The method of claim 1 further comprising repairing or replacing the component.

7. A non-transitory storage medium storing instructions readable and executable by a computer to perform operations comprising:

controlling an optical surface profilometry system to acquire a surface profile of a plurality of components;

controlling a camera to acquire a photographic image of the plurality of components concurrent with acquiring the surface profile of the plurality of components;

classifying the plurality of components based on the acquired surface profile and acquired photographic image respective to degradation of the plurality of components;

repeating the acquiring and classifying steps for the plurality of components; and

displaying a map of the plurality of components comprising an iconic representation of the plurality of components in a pattern corresponding to a physical arrangement of the plurality of components with each iconic representation color coded to indicate degradation of each of the plurality of components.

8. An inspection system comprising:

an optical surface profilometry system configured to acquire a profile of a surface of a component;

a camera configured to acquire a photographic image of the surface of the component;

a non-transitory storage medium storing instructions readable and executable by an electronic data processing device;

a computer configured to read and execute instructions stored on the non-transitory storage medium to control the optical surface profilometry system to concurrently acquire the profile and the photographic image and to classify a condition of the surface based on the acquired profile and photographic image, and configured to read and execute instructions stored on the non-transitory storage medium to create and display a map of a plurality of surfaces of the component comprising an iconic representation of the plurality of surfaces of the component in a pattern corresponding to a physical arrangement of the plurality of surfaces with each iconic representation color coded to indicate surface degradation.

9. The inspection system of claim 8 wherein the optical surface profilometry system is configured to interface with the component and wherein the computer is configured to read and execute the instructions stored on the non-transitory storage medium to control the optical surface profilometry system to acquire the profile of the surface, to control the camera to acquire the photographic image of the surface, and to classify the condition of the surface based on the acquired profile and photographic image of the surface.

10. The inspection system of claim 8 wherein the optical surface profilometry system comprises a laser profilometry system configured to illuminate a location on a surface with a laser at an angle respective to a surface normal of the surface and computing a surface depth at the location on the surface based on a lateral shift of the reflected illumination.

11. The inspection system of claim 8 wherein the non-transitory storage medium performs operations comprising:

controlling an optical surface profilometry system to acquire the profile of the surface; and

classifying the condition of the surface based on the acquired profile.

12. A method of inspecting a component subject to degradation, the method comprising:

acquiring at a first time a first profile of a surface of the component with an optical surface profilometry system and a first photographic image of the surface;

acquiring at a second time a second profile of the surface of the component and a second photographic image of the surface of the component classifying a first condition of the component based on the acquired first profile and first photographic image;

classifying a second condition of the component based on the acquired second profile and first photographic image component, and creating and displaying a map of a plurality of surfaces of the component comprising an iconic representation of the plurality of surfaces of the component in a pattern corresponding to a physical arrangement of the plurality of surfaces with each iconic representation color coded to indicate surface degradation.

13. The method of claim 12 further comprising:

illuminating a location on the surface of the component with a laser of the optical profilometry system at an angle respective to a surface normal of the surface of the component; and

determining a surface depth at the location on the surface of the component based on a lateral shift of reflected illumination.

14. The method of claim 12 further comprising trending degradation of the component based on data obtained from the compared first and second conditions of the component.

15. The method of claim 12 further comprising developing a predictive model of degradation of the component based on data obtained from the compared first and second conditions of the component.

16. The method of claim 12 wherein a camera is integrated with the optical surface profilometry system.

17. The method of claim 12 wherein the component comprises a baseplate of a cyclonic steam separator.

Assignments (11)