Scanning laser microscope
View Patent ↗Brightness information with a wide dynamic range is acquired and observed while preventing degradation of a detector. The invention provides a microscope system including a scanner that two-dimensionally scans laser light emitted from a light source unit on a specimen; a detector ( 41 ) that detects light from the specimen on which the laser light is scanned by the scanner and outputs a light intensity signal corresponding to the light intensity of the detected light; a PC that converts the light intensity signal output from the detector ( 41 ) to brightness information at each pixel corresponding to the scanning position of the scanner and that generates an image of the specimen; a second integrating circuit ( 70 ) that calculates an integrated value corresponding to the total light intensity signal output from the detector ( 41 ) within a given time; a comparator ( 55 ) that determines whether or not that integrated value of a voltage signal exceeds a prescribed threshold; and a high-voltage control portion ( 87 ) that stops detection of light by the detector ( 41 ) when it is determined by the comparator ( 55 ) that the voltage signal exceeds the prescribed threshold.
1. A scanning laser microscope comprising:
a scanner that two-dimensionally scans laser light emitted from a light source on a specimen;
a detector that detects light from the specimen on which the laser light is scanned by the scanner and that outputs a light intensity signal that corresponds to a light intensity of the detected light;
a computer that converts the light intensity signal output from the detector to brightness information at each pixel corresponding to a scanning position of the scanner and that generates an image of the specimen;
an integrating circuit that calculates light intensity information corresponding to a total light intensity signal output from the detector within a given time;
a comparator that determines whether or not the light intensity information calculated by the integrating circuit exceeds a prescribed threshold; and
a controller that stops detection of light by the detector when it is determined by the comparator that the light intensity information exceeds the prescribed threshold,
wherein the computer generates the image of the specimen by accumulating the brightness information converted at each pixel at a prescribed pixel clock; and
wherein the integrating circuit sets, as the light intensity information, an integrated value obtained by integrating, over a period longer than the pixel clock of the computer, the light intensity signal output from the detector within the given time.
2. A scanning laser microscope according to claim 1 , wherein the integrating circuit performs integration processing during a scanning period in which the laser light is scanned on the specimen by the scanner and a flyback period in which emission of laser light from the light source is stopped and a scanning line of the laser light is returned to an original position.
3. A scanning laser microscope according to claim 1 , wherein:
the computer generates the image of the specimen using first brightness information obtained by accumulating the light intensity signal at each pixel at the prescribed pixel clock; and
the integrating circuit sets, as the light intensity information, second brightness information obtained by adding-up the first brightness information for a plurality of pixel clocks.
4. A scanning laser microscope according to claim 3 , wherein:
the computer includes an A/D convertor that converts the first brightness information to a digital signal at a sampling period that is an integer fraction of the prescribed pixel clock;
the integrating circuit includes a management portion that compares the first brightness information converted by the A/D convertor at the sampling period with an upper limit at which A/D conversion is possible by the A/D convertor and that sets brightness information to be added-up, a storage unit that stores the first brightness information and a sampling time thereof in association with each other, when it is determined by the management portion that the first brightness information is smaller than the upper limit, and an adder that adds-up the brightness information to be added-up, which is set by the management portion, at a period that is longer than the pixel clock; and
when the first brightness information is smaller than the upper limit as a result of comparison at the individual pixel clocks, the management portion sets the first brightness information as the brightness information to be added-up, and when the first brightness information is equal to the upper limit, the management portion sets an estimated value based on the first brightness information and the sampling time thereof, which are stored in the storage unit, as the brightness information to be added-up.
5. A scanning laser microscope according to claim 1 , wherein:
the computer generates the image by adding-up the brightness information converted at each pixel at the prescribed pixel clock; and
the integrating circuit sets, as the light intensity information, an addition value obtained by adding-up the light intensity signal output from the detector in a given time at a period longer than the pixel clock of the computer.
6. A scanning laser microscope according to claim 1 , wherein the controller turns ON/OFF a control voltage applied to the detector.
7. A scanning laser microscope according to claim 1 , wherein the controller inserts and removes a blocking member that blocks light that would otherwise be incident on the detector.