IP Library Granted Patent US 9,791,523
Granted Patent B2
US 9,791,523 · App. 14/218,771 · Granted Oct 17, 2017

Magnetic sensor utilizing magnetization reset for sense axis selection

Inventor: Phil Mather (Phoenix, AZ)
Assignee: Fairchild Semiconductor Corporation
G01R33/096
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Quick Facts
Patent No.
US 9,791,523
App. No.
14/218,771
Granted
Oct 17, 2017
Kind
B2
Abstract

This document discusses, among other things, a first magnetic sensor configured to sense first and second components of a magnetic field in respective, orthogonal directions, using first, second, third, and fourth sense elements, each on an angled surface sloped with respect to a surface, each including respective first, second, third, and fourth longitudinal axes, each parallel to each other. Further, a second magnetic sensor on the same surface can sense second and third components of a magnetic field in respective, orthogonal directions, using first, second, third, and fourth sense elements, each on an angled surface sloped with respect to the first surface, each including respective first, second, third, and fourth longitudinal axes, each parallel to each other and orthogonal to the longitudinal axes of the first magnetic sensor.

Claims (46)

1. A system comprising:

a first material providing a first surface; and

a first magnetic sensor configured to sense first and second components of a magnetic field in respective, orthogonal directions, the first component in one of an X direction or a Y direction parallel to the first surface, and the second component in a Z direction orthogonal to the first surface,

wherein the first magnetic sensor includes first, second, third, and fourth sense elements, each on an angled surface sloped with respect to the first surface, wherein the first, second, third, and fourth sense elements of the first magnetic sensor include respective first, second, third, and fourth longitudinal axes, each parallel to each other, and

wherein each of the first, second, third, and fourth sense elements of the first magnetic sensor include a plurality of bias elements disposed on a surface of a respective sense element longitudinally at a 45-degree angle with respect to the longitudinal axis of the respective sense element to deflect magnetization from the longitudinal axis of the respective sense element.

2. The system of claim 1 , including:

a second magnetic sensor configured to sense the second component of the magnetic field and a third component of the magnetic field in respective, orthogonal directions, the second component in the Z direction orthogonal to the first surface, and the third component in one of the X direction or the Y direction parallel to the first surface and orthogonal to the first component,

wherein the second magnetic sensor includes first, second, third, and fourth sense elements, each on an angled surface sloped with respect to the first surface, wherein the first, second, third, and fourth sense elements of the second magnetic sensor include respective first, second, third, and fourth longitudinal axes, each parallel to each other, wherein the longitudinal axes of the second magnetic sensor are orthogonal to the longitudinal axes of the first magnetic sensor.

3. The system of claim 2 , wherein the first component of the magnetic field is in the Y direction, parallel to the first surface, wherein the second component of the magnetic field is the Z direction, orthogonal to the first surface, and wherein the third component of the magnetic field is in the X direction, parallel to the first surface and orthogonal to the Y direction.

4. The system of claim 2 , including:

a first reset line having a longitudinal axis parallel to the longitudinal axes of the first magnetic sensor; and

a second reset line having a longitudinal axis parallel to the longitudinal axes of the second magnetic sensor.

5. The system of claim 1 , wherein the first material includes a substrate including first, second, third, and fourth angled surfaces, wherein the first, second, third, and fourth sense elements of the first magnetic sensor are formed on the respective first, second, third, and fourth angled surfaces.

6. The system of claim 1 , including a first reset line having a longitudinal axis parallel to the longitudinal axis of the first sense element and configured to provide a field along the longitudinal axis of the first sense element.

7. The system of claim 6 , wherein the first material includes a dielectric material including first, second, third, and fourth angled surfaces, wherein the first, second, third, and fourth sense elements of the first magnetic sensor are formed on the respective first, second, third, and fourth angled surfaces, wherein the system further includes a second reset line having a longitudinal axis parallel to the longitudinal axis of the first sense element and configured to provide a field along the longitudinal axis of the first sense element, and wherein the first sense element is between the first and second reset lines.

8. The system of claim 1 , wherein the first component of the magnetic field is in the Y direction, parallel to the first surface, and wherein the second component of the magnetic field is in the Z direction, orthogonal to the first surface.

9. The system of claim 1 ,

wherein the plurality of bias elements disposed on the first sense element of the first magnetic sensor are parallel to each other, and

wherein the plurality of bias elements disposed on the second sense element of the first magnetic sensor are parallel to each other and form a 90degree angles with respect to the plurality of bias elements disposed on the first sense element.

10. The system of claim 1 , wherein the first, second, third, and fourth sense elements of the first magnetic sensor include ferromagnetic sense elements.

11. A method, comprising:

sensing first and second components of a magnetic field in respective, orthogonal directions, the first component in one of an X direction or a Y direction parallel to the first surface, and the second component in a Z direction orthogonal to the first surface,

wherein sensing the first and second components includes using a first magnetic sensor including first, second, third, and fourth sense elements, each on an angled surface sloped with respect to a first surface of a first material, wherein the first, second, third, and fourth sense elements of the first magnetic sensor include respective first, second, third, and fourth longitudinal axes, each parallel to each other, and

biasing each respective sense element of the first, second, third, and fourth sense elements of the first magnetic sensor using separate pluralities of bias elements disposed on a surface of each of the first, second, third, and fourth sense elements longitudinally at a 45-degree angle with respect to the longitudinal axis of the respective sense element to deflect magnetization from the longitudinal axis of the respective sense element.

12. The method of claim 11 , including:

sensing the second component of the magnetic field and a third component of the magnetic field in respective, orthogonal directions using a second magnetic sensor, the second component in the Z direction orthogonal to the first surface, and the third component in one of the X direction or the Y direction parallel to the first surface and orthogonal to the first component,

wherein the second magnetic sensor includes first, second, third, and fourth sense elements, each on an angled surface sloped with respect to the first surface, wherein the first, second, third, and fourth sense elements of the second magnetic sensor include respective first, second, third, and fourth longitudinal axes, each parallel to each other, and wherein the longitudinal axes of the second magnetic sensor are orthogonal to the longitudinal axes of the first magnetic sensor.

13. The method of claim 12 , wherein sensing the first component of the magnetic field includes sensing a component of the magnetic field in the Y direction, parallel to the first surface, wherein the sensing the second component of the magnetic field includes sensing a component of the magnetic field in the Z direction, orthogonal to the first surface, and wherein the sensing the third component of the magnetic field includes sensing a component of the magnetic field in the X direction, parallel to the first surface and orthogonal to the Y direction.

14. The method of claim 11 , wherein the first material includes a substrate including first, second, third, and fourth angled surfaces, wherein the first, second, third, and fourth sense elements of the first magnetic sensor are formed on the respective first, second, third, and fourth angled surfaces.

15. The method of claim 11 , including:

providing a field along the longitudinal axis of the first sense element using a first reset line having a longitudinal axis parallel to the longitudinal axis of the first sense element.

16. The method of claim 11 , including:

providing a field along the longitudinal axis of the first sense element using first and second reset lines, each having a longitudinal axis parallel to the longitudinal axis of the first element, wherein the first sense element is between the first and second reset lines.

17. The method of claim 11 , wherein sensing the first component of the magnetic field includes sensing a component of the magnetic field in the Y direction, parallel to the first surface, and wherein the sensing the second component of the magnetic field includes sensing a component of the magnetic field in the Z direction, orthogonal to the first surface.

18. The method of claim 11 , including:

biasing the first sense element using a first plurality of bias elements disposed on the first sense element of the first magnetic sensor at 45-degree angles with respect to the longitudinal axis of the first sense element, wherein the first plurality of bias elements are parallel to each other.

19. The method of claim 18 , including:

biasing the second sense element using a second plurality of bias elements disposed on the second sense element of the first magnetic sensor at 45-degree angles with respect to the longitudinal axis of the first sense element, wherein the second plurality of bias elements are parallel to each other and form a 90degree angles with respect to the first plurality of bias elements.

20. A system comprising:

a first material providing a first surface;

a first magnetic sensor configured to sense first and second components of a magnetic field in respective, orthogonal directions; and

a second magnetic sensor configured to sense the second component of the magnetic field and a third component of the magnetic field in respective, orthogonal directions,

wherein the first component of the magnetic field is in a Y direction parallel to the first surface, the second component of the magnetic field in a Z direction orthogonal to the first surface, and the third component of the magnetic field in an X direction parallel to the first surface and orthogonal to the Y direction,

wherein the first magnetic sensor includes first, second, third, and fourth sense elements, each on an angled surface sloped with respect to the first surface, wherein the first, second, third, and fourth sense elements include respective first, second, third, and fourth longitudinal axes, each parallel to each other,

wherein the second magnetic sensor includes first, second, third, and fourth sense elements, each on an angled surface sloped with respect to the first surface, wherein the first, second, third, and fourth sense elements include respective first, second, third, and fourth longitudinal axes, each parallel to each other, and

wherein the longitudinal axes of the second magnetic sensor are orthogonal to the longitudinal axes of the first magnetic sensor.

Assignments (7)
RELEASE OF SECURITY INTEREST IN PATENTS RECORDED AT REEL 058871, FRAME 0799 Recorded Jun 23, 2023
From: DEUTSCHE BANK AG NEW YORK BRANCH, AS COLLATERAL AGENT
To: SEMICONDUCTOR COMPONENTS INDUSTRIES, LLC; FAIRCHILD SEMICONDUCTOR CORPORATION
Reel/Frame 065653/0001 →
RELEASE OF SECURITY INTEREST IN PATENTS RECORDED AT REEL 040075, FRAME 0644 Recorded Jun 22, 2023
From: DEUTSCHE BANK AG NEW YORK BRANCH, AS COLLATERAL AGENT
To: SEMICONDUCTOR COMPONENTS INDUSTRIES, LLC; FAIRCHILD SEMICONDUCTOR CORPORATION
Reel/Frame 064070/0536 →
SECURITY INTEREST Recorded Nov 12, 2021
From: SEMICONDUCTOR COMPONENTS INDUSTRIES, LLC
To: DEUTSCHE BANK AG NEW YORK BRANCH, AS COLLATERAL AGENT
Reel/Frame 058871/0799 →
RELEASE OF SECURITY INTEREST Recorded Oct 28, 2021
From: DEUTSCHE BANK AG NEW YORK BRANCH
To: FAIRCHILD SEMICONDUCTOR CORPORATION
Reel/Frame 057969/0206 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Aug 3, 2021
From: FAIRCHILD SEMICONDUCTOR CORPORATION
To: SEMICONDUCTOR COMPONENTS INDUSTRIES, LLC
Reel/Frame 057694/0374 →
PATENT SECURITY AGREEMENT Recorded Sep 19, 2016
From: FAIRCHILD SEMICONDUCTOR CORPORATION
To: DEUTSCHE BANK AG NEW YORK BRANCH, AS COLLATERAL AGENT
Reel/Frame 040075/0644 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded May 6, 2014
From: MATHER, PHIL
To: FAIRCHILD SEMICONDUCTOR CORPORATION
Reel/Frame 032832/0707 →
Continuity (2)
Provisional Application 61793367 · Mar 15, 2013
Related Publication 20140266187A1 · Sep 18, 2014