System and device for non-destructive Raman analysis
View Patent ↗A Raman microspectrometer system extends the optical reach and analysis range of an existing Raman microspectrometer to allow analysis and/or repair of an oversized sample. The Raman microspectrometer system includes an extender for extending the optical reach of the existing microspectrometer and a supplemental stage which extends the analysis range of the existing microspectrometer by providing travel capabilities for non-destructive analysis of an entire oversized sample. Such an arrangement decreases manufacturing costs associated with testing oversized samples such as mammography panels, enabling analysis and/or repair to be performed without destruction.
1. A Raman microspectrometer system for non-destructive analysis of an oversized sample that includes amorphous selenium comprising:
a Raman microspectrometer comprising an optical microscope coupled to a spectrometer by an optical transfer tube, the optical microscope comprising a lens and a stage; and
an optical extender removably coupled to the optical microscope and having a proximal orifice aligned with the lens and a distal orifice, the optical extender for extending an optical reach of the microscope to the distal orifice, wherein a sensitivity of the Raman microspectrometer to some molecular vibrations corresponding to crystallized selenium is increased with the optical reach of the microscope extended and decreased with the optical reach of the microscope not extended.
2. The Raman microspectrometer of claim 1 , wherein the extender comprises a plurality of mirrors including a first minor positioned adjacent to the proximal orifice and a second mirror positioned adjacent to the distal orifice, and wherein the first mirror is positioned to direct an optical signal between the proximal orifice and the second minor and the second minor is positioned to direct the optical signal between the first mirror and the distal orifice.
3. The Raman microspectrometer of claim 1 wherein a strength of the lens is adjustable.
4. The Raman microspectrometer of claim 1 further comprising a supplemental stage, coupled to a controller of the stage of the optical microscope, for moving the oversized sample along a travel distance along the at least one track in at least one of a x, y and z dimensions that exceeds a travel capability of the stage of the optical microscope in a corresponding dimension, wherein the supplemental stage comprises a motorized stage wherein travel distances of the supplemental stage correspond to a size of a mammography imaging panel.
5. The Raman microspectrometer of claim 4 wherein the supplemental stage moves along at least the z-axis and wherein the Raman microspectrometer system is configured to analyze the oversized sample at different depths.
6. The Raman microspectrometer of claim 1 wherein the extender is rotatable around the proximal orifice.
7. The Raman microspectrometer of claim 1 wherein movement of the extender is software controlled.
8. The Raman microspectrometer of claim 1 wherein the extender is a telescoping extender.
9. The Raman microspectrometer of claim 1 wherein the extender is configured to variably extend.
10. The Raman microspectrometer of claim 9 wherein movement of the extender is software controlled.
11. The Raman microspectrometer of claim 1 further comprising a lens mounting plate surrounding the distal orifice.
12. The Raman microspectrometer of claim 11 wherein the extender comprises a mounting plate positioned proximate to the proximal orifice, wherein the mounting plate conforms in shape to the lens mounting plate and wherein the mounting plate secures the extender to a lens mount of the optical microscope.
13. The Raman microspectrometer of claim 12 wherein the mounting plate is a first mounting plate, and wherein the extender further comprises a second mounting plate positioned around the distal orifice and configured to accept the lens.
14. The Raman microspectrometer of claim 1 wherein a housing of the extender comprises wave guide materials.
15. The apparatus of claim 14 wherein the waveguide materials are selected from a group including liquid optical materials and solid optical materials.
16. The Raman microspectrometer of claim 1 wherein the extender comprises a suspension arm for supporting of the extender on a body of the optical microscope.
17. The Raman microspectrometer of claim 16 wherein the suspension arm mounts to and corresponds in shape with a body of the microscope so that the suspension arm hangs from the lens.
18. The Raman microspectrometer of claim 1 wherein the system is configured to be less sensitive to layers above or below a focal plane of the system.
19. The Raman microspectrometer of claim 1 further comprising a motor disposed above the rails and operably coupled to the supplemental stage to control the movement of the supplemental stage in the x and y dimensions.
20. The Raman microspectrometer of claim 1 , wherein the track is an elevated elongated structure above a base of the supplemental stage.