In-band OSNR measurement on polarization-multiplexed signals
View Patent ↗There is provided a system and a method for determining an in-band noise parameter representative of the optical noise contribution (such as OSNR) on a polarization-multiplexed optical Signal-Under-Test (SUT) comprising two polarized phase-modulated data-carrying contributions and an optical noise contribution. For each of a multiplicity of distinct polarization-analyzer conditions, the SUT is analyzed to provide at least one polarization-analyzed component of the SUT and the polarization-analyzed component is detected with an electronic bandwidth at least ten times smaller than the symbol rate of the SUT to obtain a corresponding acquired electrical signal; for each acquired electrical signal, a value of a statistical parameter is determined from the ac component of the acquired electrical signal, thereby providing a set of statistical-parameter values corresponding to the multiplicity of distinct polarization-analyzer conditions; and, from the set of statistical-parameter values, the in-band noise parameter is mathematically determined.
1. A method for estimating an Optical Signal-to-Noise Ratio (OSNR), on a polarization-multiplexed optical Signal-Under-Test (SUT) comprising two polarized phase-modulated data-carrying contributions and an optical noise contribution, the method comprising:
for each of a multiplicity of distinct polarization-analyzer conditions, analyzing said SUT to provide at least one polarization-analyzed component of the SUT and detecting said at least one component with an electronic bandwidth at least ten times smaller than the symbol rate of said SUT to obtain a corresponding acquired electrical signal;
for each acquired electrical signal, determining a value of a statistical parameter from the ac component of the acquired electrical signal, thereby providing a set of statistical-parameter values corresponding to said multiplicity of distinct polarization-analyzer conditions; and
mathematically determining, from the set of statistical-parameter values, said OSNR representative of said optical noise contribution.
2. The method as claimed in claim 1 , wherein for each of said distinct polarization-analyzer conditions, the SUT is simultaneously analyzed according to two mutually-orthogonal states of polarization, the corresponding acquired electrical signal being a differential electrical signal proportional to the difference between two mutually-orthogonal polarization-analyzed components of the SUT.
3. The method as claimed in claim 2 , wherein the acquired electrical signal is ac-coupled.
4. The method as claimed in claim 3 , wherein said statistical parameter corresponds to a measured rms value of the differential electrical signal.
5. The method as claimed in claim 1 , wherein said multiplicity of polarization-analyzer conditions comprise three conditions that are mutually orthogonal in Stokes-parameter space, thereby providing a set of three statistical-parameter values corresponding to respective Stokes-parameter values, and wherein the three polarization-analyzer conditions are obtained simultaneously.
6. The method as claimed in claim 5 , wherein said mathematically determining comprises calculating, from said set of statistical-parameter values, a thickness parameter related to a deformation of a lens-shaped distribution in Stokes-parameter space defined by polarization-analyzed components corresponding to the three polarization-analyzer conditions, said deformation being at least partly induced from said optical noise contribution, and wherein said mathematically determining further comprises determining said OSNR as a predetermined function of said thickness parameter.
7. The method as claimed in claim 1 , wherein said polarization-analyzer conditions are obtained successively using at least one polarization beam splitter and a polarization controller to vary a state of polarization of the SUT at the input of the polarization beam splitter.
8. The method as claimed in claim 7 , wherein said mathematically determining said OSNR comprises calculating a thickness parameter at least from a minimum of said set of statistical-parameter values and estimating said OSNR based on a predetermined function of said thickness parameter.
9. The method as claimed in claim 8 , wherein said calculating a thickness parameter comprises calculating said thickness parameter from a ratio of a maximum to a minimum of said set of statistical-parameter values.
10. The method as claimed in claim 1 , wherein the electronic bandwidth of said differential electrical signal is between one over a hundred thousand to one over a hundred of the symbol rate of each of said modulated signal carriers of said SUT.
11. The method as claimed in claim 1 , wherein the electronic bandwidth of said differential electrical signal is between one over a ten thousand to one over a thousand of the symbol rate of each of said modulated signal carriers of said SUT.
12. The method as claimed in claim 1 , further comprising determining a value of a dc component of each acquired electrical signal and determining a value representative of a polarization dependent loss therefrom.
13. The method as claimed in claim 12 , wherein said mathematically determining said OSNR accounts for said polarization dependent loss.
14. The method as claimed in claim 1 , further comprising determining a value representative of an effective differential group delay and wherein said mathematically determining said OSNR accounts for said effective differential group delay.
15. The method as claimed in claim 1 , wherein a modulation format corresponding to said data-carrying contributions is a single-amplitude phase-modulation format.
16. A system for estimating an in-band noise parameter on a polarization-multiplexed optical Signal-Under-Test (SUT) comprising two polarized phase-modulated data-carrying contributions and an optical noise contribution, the system comprising:
a polarization-optics arrangement for analyzing said SUT according to each of a multiplicity of distinct polarization-analyzer conditions to provide at least one polarization-analyzed component of the SUT;
at least one optical detector to obtain a corresponding electrical signal, said optical detector having an electronic bandwidth at least ten times smaller than the symbol rate of said SUT;
a true-rms converter receiving said electrical signal for determining a value of a statistical parameter from the ac component of the electrical signal, thereby providing a set of statistical-parameter values corresponding to said multiplicity of distinct polarization-analyzer conditions; and
a noise calculator receiving said set of statistical-parameter values and configured for mathematically determining therefrom said in-band noise parameter representative of said optical noise contribution.
17. The system as claimed in claim 16 , wherein said polarization-optics arrangement comprises a polarization beam splitter for analyzing the SUT simultaneously according to two mutually-orthogonal states of polarization for each of said distinct polarization-analyzer conditions, said at least one optical detector comprising at least two optical detectors corresponding respectively to the two mutually-orthogonal polarization-analyzed components of the SUT, said amplifier being a differential amplifier to provide a differential electrical signal proportional to the difference between two mutually-orthogonal polarization-analyzed components of the SUT.
18. The system as claimed in claim 16 , wherein said polarization-optics arrangement comprises a polarization controller to vary a state of polarization of the SUT at the input of the polarization beam splitter in order to provide successively said polarization-analyzer conditions, said polarization-analyzer conditions being arbitrary relative to one another.
19. The system as claimed in claim 18 , wherein said noise calculator is configured for calculating a thickness parameter at least from a minimum of said set of statistical-parameter values and for estimating said in-band noise parameter based on a predetermined function of said thickness parameter.
20. The system as claimed in claim 19 , wherein said noise calculator is configured for calculating said thickness parameter from a ratio of a maximum to a minimum of said set of statistical-parameter values.
21. The system as claimed in claim 16 , wherein said polarization-optics arrangement comprises a polarimeter for analyzing the SUT simultaneously according to three conditions that are mutually orthogonal in Stokes-parameter space, thereby providing a set of three statistical-parameter values corresponding to Stokes-parameter values.
22. The system as claimed in claim 21 , wherein said noise calculator is configured for calculating, from said set of statistical-parameter values, a thickness parameter related to a deformation of a lens-shaped distribution in Stokes-parameter space defined by polarization-analyzed components corresponding to the three polarization-analyzer conditions, and wherein said noise calculator is further configured for determining said in-band noise parameter as a predetermined function of said thickness parameter.
23. The system as claimed in claim 16 , wherein the electronic bandwidth of said differential electrical signal is between one over a hundred thousand to one over a hundred of the symbol rate of each of said modulated signal carriers of said SUT.
24. The system as claimed in claim 16 , wherein the electronic bandwidth of said optical detector is between one over a ten thousand to one over a thousand of the symbol rate of each of said modulated signal carriers of said SUT.
25. The system as claimed in claim 23 , wherein said in-band noise-related parameter is an optical signal-to-noise ratio.
26. The system as claimed in claim 16 , wherein a modulation format corresponding to said data-carrying contributions is a single-amplitude phase-modulation format.