Standardizing fluorescence microscopy systems

1. A method for standardizing a fluorescence microscopy imaging system, the method comprising:

by a first imaging system to be standardized, capturing a drift image comprising an image of a drift reference slide;

calculating a drift measurement using the drift image;

by the first imaging system, capturing a first normalization image comprising an image of a normalization slide, wherein the normalization slide comprises a specimen which is prepared with a fluorochrome;

by a reference imaging system, capturing a reference normalization image comprising an image of the normalization slide;

comparing the first normalization image to the reference normalization image; and

determining a gamma value and offset value for the first imaging system based on the comparison.

2. The method of claim 1 , wherein capturing a first normalization image, comparing the first normalization image to the reference normalization image, and determining a gamma value and offset value for the first imaging system are all performed for each of a plurality of normalization slides, wherein each of the plurality of normalization slides comprises a specimen which is prepared with a different fluorochrome.

3. A method for standardizing a fluorescence microscopy imaging system, the method comprising:

by a first imaging system to be standardized, capturing a drift image comprising an image of a drift reference slide;

calculating a drift measurement using the drift image;

by the first imaging system, capturing a first normalization image comprising an image of a normalization slide;

by a reference imaging system, capturing a reference normalization image comprising an image of the normalization slide;

comparing the first normalization image to the reference normalization image, wherein comparing the first normalization image to the reference normalization image comprises calculating a first histogram based on the first normalization image, calculating a reference histogram based on the reference normalization image, and comparing the first histogram to the reference histogram; and

determining a gamma value and offset value for the first imaging system based on the comparison.

4. The method of claim 3 , wherein comparing the first normalization image to the reference normalization image further comprises:

identifying a reference area in the reference normalization image;

calculating a root-mean-squared difference of each of one or more candidate areas of the first normalization image to the reference area; and

identifying one of the one or more candidate areas having the lowest root-mean-squared difference to the reference area.

5. The method of claim 3 , wherein comparing the first histogram to the reference histogram comprises:

calculating a reference cumulative distribution function for the reference histogram;

calculating a first cumulative distribution function for the first histogram; and

determining one or more corresponding intensities in the first normalization image and the reference normalization image for which the first cumulative distribution function and the reference cumulative distribution function match.

6. The method of claim 5 , wherein determining a gamma value and offset value for the first imaging system comprises:

determining a gamma function based on the one or more corresponding intensities; and

applying a linear regression to the gamma function to generate a linear equation comprising the gamma value and the offset value.

7. The method of claim 6 , further comprising estimating a standard error in the linear regression.

8. A system for standardizing a fluorescence microscopy imaging system, the system comprising:

at least one hardware processor; and

at least one executable module that, when executed by the at least one hardware processor,

receives a drift image comprising an image of a drift reference slide captured by a first imaging system,

calculates a drift measurement using the drift image,

receives a first normalization image comprising an image of a normalization slide captured by the first imaging system,

receives a reference normalization image comprising an image of the normalization slide captured by a reference imaging system,

compares the first normalization image to the reference normalization image, wherein comparing the first normalization image to the reference normalization image comprises calculating a first histogram based on the first normalization image, calculating a reference histogram based on the reference normalization image, and comparing the first histogram to the reference histogram; and

determines a gamma value and offset value for the first imaging system based on the comparison.

9. The system of claim 8 , wherein comparing the first normalization image to the reference normalization image further comprises:

identifying a reference area in the reference normalization image;

calculating a root-mean-squared difference of each of one or more candidate areas of the first normalization image to the reference area; and

identifying one of the one or more candidate areas having the lowest root-mean-squared difference to the reference area.

10. The system of claim 8 , wherein comparing the first histogram to the reference histogram comprises:

calculating a reference cumulative distribution function for the reference histogram;

calculating a first cumulative distribution function for the first histogram; and

determining one or more corresponding intensities in the first normalization image and the reference normalization image for which the first cumulative distribution function and the reference cumulative distribution function match.

11. The system of claim 10 , wherein determining a gamma value and offset value for the first imaging system comprises:

determining a gamma function based on the one or more corresponding intensities; and

applying a linear regression to the gamma function to generate a linear equation comprising the gamma value and the offset value.