IP Library Granted Patent US 9,741,761
Granted Patent B2
US 9,741,761 · App. 14/245,872 · Granted Aug 22, 2017

Photosensitive imaging devices and associated methods

Inventors: Jutao Jiang (Tigard, OR); Jeffrey McKee (Tualatin, OR); Martin U. Pralle (Wayland, MA)
Assignee: SiOnyx, LLC
H01L27/14649H01L25/167H01L27/1461H01L27/1464H01L27/14612H01L27/14625H01L27/14645H01L27/14647H04N5/2256H04N5/3765H04N5/37452H04N9/045H01L2924/0002
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Quick Facts
Patent No.
US 9,741,761
App. No.
14/245,872
Granted
Aug 22, 2017
Kind
B2
Abstract

A monolithic sensor for detecting infrared and visible light according to an example includes a semiconductor substrate and a semiconductor layer coupled to the semiconductor substrate. The semiconductor layer includes a device surface opposite the semiconductor substrate. A visible light photodiode is formed at the device surface. An infrared photodiode is also formed at the device surface and in proximity to the visible light photodiode. A textured region is coupled to the infrared photodiode and positioned to interact with electromagnetic radiation.

Claims (14)

1. A monolithic sensor for detecting infrared and visible light, comprising

a semiconductor substrate;

a visible light pixel configured to detect visible light, the visible light pixel being formed over the semiconductor substrate and including a first plurality of pixel transistors; and

an infrared pixel configured to detect infrared light, the infrared pixel being formed over the semiconductor substrate, in proximity to the visible light pixel, and including a second plurality of pixel transistors;

wherein the second plurality of pixel transistors includes at least one transfer transistor configured to synchronize detection of the infrared light, at the infrared pixel, with a pulse of an illuminating light, by gating an accumulation node such that:

in an open state of the transfer transistor, electrical charge generated by infrared light incident on the infrared pixel is accumulated for duration of the pulse of the illuminating light; and

in a closed state of the transfer transistor, the infrared pixel is held at reset, while visible light is detected by the visible light pixel.

2. The sensor of claim 1 , further comprising a textured region coupled to the second pixel and positioned to interact with electromagnetic radiation.

3. The sensor of claim 1 , wherein the second pixel has a pixel architecture that is capable of performing a global shutter operation.

4. The sensor of claim 1 , wherein the visible light pixel further comprises a plurality of visible light pixels each being configured to detect a different color of visible light.

5. The sensor of claim 1 , wherein the infrared pixel further comprises a pixel configured to detect infrared light having a wavelength of greater than 1000 nm.

6. The sensor of claim 1 , further comprising an infrared narrow bandpass filter coupled to the infrared pixel.

7. The sensor of claim 1 , further comprising image processing circuitry for combining a first output from the infrared pixel with a second output from the visible light pixel to form a composite image.

8. The sensor of claim 1 , further comprising circuitry for synchronizing light capture of the infrared pixel with a pulse frequency of an infrared light source.

Assignments (2)
CHANGE OF NAME Recorded Jan 6, 2016
From: SIONYX, INC.
To: SIONYX, LLC
Reel/Frame 037449/0544 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Dec 22, 2015
From: JIANG, JUTAO; MCKEE, JEFFREY; PRALLE, MARTIN U.
To: SIONYX, INC.
Reel/Frame 037346/0608 →
Continuity (3)
Continuation 13091969 · Apr 21, 2011
Provisional Application 61326489 · Apr 21, 2010
Related Publication 20140332665A1 · Nov 13, 2014