Method for treating a semiconductor
View Patent ↗Methods for treating a semiconductor material, and for making devices containing a semiconducting material, are presented. One embodiment is a method for treating a semiconductor material that includes a chalcogenide. The method comprises contacting at least a portion of the semiconductor material with a chemical agent. The chemical agent comprises a solvent, and an iodophor dissolved in the solvent.
1. A method for treating a semiconductor material, comprising:
reacting a semiconductor material with an iodine containing chemical agent, wherein the iodine containing chemical agent comprises a complex between a solvent and elemental iodine.
2. The method of claim 1 , wherein the semiconductor material comprises a chalcogenide.
3. The method of claim 2 , further comprising a step of forming a chalcogen-rich region within the semiconductor material.
4. The method of claim 3 , wherein the chalcogen-rich region is a tellurium-rich region.
5. The method of claim 1 , further comprising contacting at least a portion of the semiconductor material with a contacting composition comprising a dopant to incorporate the dopant into the semiconductor material.
6. The method of claim 5 , wherein the step of contacting at least a portion of the semiconductor material with a contacting composition further comprises forming a chalcogenide species of the dopant.
7. A method for making a photovoltaic device, comprising
disposing a chalcogen containing semiconductor material on a support;
contacting at least a portion of the semiconductor material with a passivating agent;
introducing a first dopant to the semiconductor material and forming a first region in the semiconductor material;
reacting the semiconductor material with an iodine containing chemical agent to form a chalcogen rich region;
introducing a second dopant to the semiconductor material and forming a chalcogenide species of the second dopant.
8. The method of claim 7 , wherein the first dopant and second dopant are the same.
9. The method of claim 7 , wherein the first dopant and second dopant are different.
10. The method of claim 7 , wherein the passivating agent is one of a solution of cadmium chloride and a cadmium chloride vapor.
11. The method of claim 7 , wherein the step of contacting at least a portion of the semiconductor material with a passivating agent further includes a heat treatment.
12. The method claim of 11 , wherein the heat treatment is performed at a temperature within a range from about 300° C. to about 500° C.
13. The method of claim 11 , wherein the heat treatment step is performed for a time duration within a range from about 1 minute to about 60 minutes.
14. The method of claim 11 , wherein the heat treatment is performed in an inert environment.
15. The method of claim 11 , wherein the heat treatment is performed in an oxidizing environment.
16. The method of claim 7 , further comprising the step of contacting at least a portion of the semiconductor material with a cleaning agent, after the step of contacting at least a portion of the semiconductor material with a passivating agent.
17. The method of claim 16 , wherein the cleaning agent is one of ethylene diamine, ammonium hydroxide, and a combination of ethylene diamine and ammonium hydroxide.