IP Library Granted Patent US 9,306,593
Granted Patent B2
US 9,306,593 · App. 14/267,790 · Granted Apr 5, 2016

Semiconductor device and semiconductor device operating method

Inventor: Takahiro Kawano (Yokohama, JP)
Assignee: Renesas Electronics Corporation
H03M1/502
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Quick Facts
Patent No.
US 9,306,593
App. No.
14/267,790
Granted
Apr 5, 2016
Kind
B2
Abstract

A semiconductor device includes an analog-digital converter circuit. The analog-digital converter circuit includes a delay cell array and an encoder. The delay cell array contains n number of serially-coupled delay cells, receives a reference clock signal, and utilizes an analog input signal as the power supply voltage for the delay cells in each stage. The encoder encodes an output signal from the delay cell in each stage for the delay cell array and outputs the encoded output signal as a digital output signal. The n number of delay cells includes delay quantities weighted for each delay cell. The encoder encodes the output signal of the delay cells in each stage for the delay cell array by weighting corresponding to the number of delay cell stage.

Claims (70)

1. A semiconductor device comprising:

an analog-digital converter circuit,

wherein the analog-digital converter circuit includes:

a delay cell array that includes n-number (n is a natural number of 2 or more) of serially-coupled delay cells, receives a reference clock signal, and utilizes an analog input signal as the power supply voltage for delay cells in each stage; and

an encoder that encodes the output signal of the delay cells in each stage of the delay cell array,

wherein the n number of delay cells include a delay quantity weighted for each delay cell,

wherein the encoder encodes the output signal of the delay cell in each stage of the delay cell array by weighting corresponding to the number of delay cell stages,

wherein the first stage of the delay cell for the delay cell array increases or reduces the delay quantity of the first stage of the delay cell in response to a delay quantity control signal that regulates the delay quantity, and

wherein the encoder changes the weighting corresponding to the number of delay cell stages for each n-number of delay cells in response to the delay quantity control signal.

2. The semiconductor device according to claim 1 ,

wherein the encoder includes:

a latch array that includes n number of flip-flops to latch n number of delay cell output signals in response to common delay clock signals; and

a latch signal encoder that encodes the latch signal of the flip-flop in each stage for the latch array by weighting corresponding to the number of delay cell stages.

3. The semiconductor device according to claim 2 ,

wherein the latch signal encoder includes:

a weighting encoder that outputs the latch signals of the flip-flop in each stage for the latch array encoded by weighting corresponding to the number of delay cell stages; and

a binary conversion encoder to perform binary conversion of the encoded signals.

4. The semiconductor device according to claim 2 ,

wherein the output timing of the delay clock signal can be changed, and

wherein the latch signal encoder changes the weighting corresponding to the number of delay cell stages for each n-number of delay cells in response to the change in the output timing of the delay clock signal.

5. The semiconductor device according to claim 4 ,

wherein the encoder further includes a delay circuit that outputs the delay clock signal,

wherein the delay circuit speeds up or delays the output timing of the delay clock signal in response to the reference voltage circuit delay quantity control signal that regulates the output timing of the delay clock signal, and

wherein the latch signal encoder changes the weighting corresponding to the number of delay cell stages for each n-number of delay cells in response to the reference voltage circuit delay quantity control signal.

6. The semiconductor device according to claim 4 ,

wherein the encoder further includes:

a delay circuit that outputs the delay clock signal; and

a power supply voltage control circuit that outputs a reference voltage to regulate the output timing of the delay clock signal as the power supply voltage for the delay circuit,

wherein the latch signal encoder changes the weighting corresponding to the number of delay cell stages for each n-number of delay cells in response to a reference voltage notification signal corresponding to the size of the reference voltage.

7. A semiconductor device comprising:

an analog-digital converter circuit,

wherein the analog-digital converter circuit includes:

a delay cell array that includes n-number (n is a natural number of 2 or more) of serially-coupled delay cells, receives a reference clock signal, and utilizes an analog input signal as the power supply voltage for delay cells in each stage;

an encoder that encodes the output signal of the delay cells in each stage of the delay cell array,

wherein the n number of delay cells include a delay quantity weighted for each delay cell, and

wherein the encoder encodes the output signal of the delay cell in each stage of the delay cell array by weighting corresponding to the number of delay cell stages;

a driver circuit that drives the output transistor; and

a control circuit that regulates the driver circuit,

wherein the analog-digital conversion circuit utilizes the output voltage of the output transistor as an analog input signal, and outputs a digital output signal, and

wherein the control circuit outputs a control signal that regulates the driver circuit based on the digital output signal and the output target value.

8. The semiconductor device according to claim 1 , further comprising:

an analog receiver unit that processes a wireless signal received at an antenna, and outputs an analog receive signal; and

a demodulator,

wherein the analog-digital conversion circuit utilizes the analog receive signal as the analog input signal, and outputs a digital output signal, and

wherein the demodulator demodulates the digital output signal.

9. An operating method for the semiconductor device,

the semiconductor device including:

an analog-digital converter circuit,

the analog-digital converter circuit including:

a delay cell array that includes n-number (n is a natural number of 2 or more) of serially-coupled delay cells; and

an encoder, and

the n number of delay cells including the delay quantity weighted for each of the delay cells,

the operating method for the semiconductor device comprising:

inputting a reference clock signal and utilizing the analog input signal as the power supply voltage for each delay cell stage by way of the delay cell array;

encoding the output signal of the delay cell in each stage for the delay cell array by way of an encoder by weighting corresponding to the number of delay cell stages, and outputting the encoded output signal as a digital output signal,

the semiconductor device further including a driver circuit and a control circuit;

inputting the output voltage of the output transistor as an analog input signal, and outputting the digital output signal by way of the analog-digital converter circuit;

outputting a control signal b way the control circuit that controls the driver circuit based on the digital output signal and the output target value; and

driving the output transistor by the driver circuit.

10. The operating method for the semiconductor device according to claim 9 , the semiconductor device further including an analog receiver unit and a demodulator,

the operating method further comprising:

processing a wireless signal received at an antenna, and outputting the analog receive signals by way of the analog receiver unit;

inputting the analog receive signal as the analog input signal, and outputting the digital output signals by way of the analog-digital converter circuit; and

demodulating the digital output signals in the demodulator.

11. The semiconductor device according to claim 1 , wherein at least a portion of the n number of delay cells have a different delay quantity weighted for each of the portion of the n number of delay cells.

12. The semiconductor device according to claim 1 , wherein the delay cells having above a predetermined delay quantity contain delay quantities corresponding to plural bits,

wherein the delay cell is defined as containing a delay quantity corresponding to one bit as a unit delay cell, and a delay cell is defined as containing a delay quantity corresponding to plural bits as one delay cell which functions identical to plural unit delay cells, and

wherein the n number of delay cells have a variable delay quantity weighted for each of delay cells.

13. The semiconductor device according to claim 1 , wherein the encoder encodes weighting signals output from the each stage of the delay cells by weighting that corresponds to the number of stages of the delay cells.

14. The semiconductor device according to claim 1 , wherein the n number of delay cells have a different delay quantity weighted for each of the delay cells.

Assignments (2)
CHANGE OF ADDRESS Recorded Nov 29, 2017
From: RENESAS ELECTRONICS CORPORATION
To: RENESAS ELECTRONICS CORPORATION
Reel/Frame 044928/0001 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded May 2, 2014
From: KAWANO, TAKAHIRO
To: RENESAS ELECTRONICS CORPORATION
Reel/Frame 032813/0040 →
Priority Claims (1)
JP 2013-114404 · May 30, 2013 · national
Continuity (1)
Related Publication 20140354461A1 · Dec 4, 2014