Dual clock edge triggered memory
View Patent ↗Memory circuitry includes memory components operable in response to first edges of an internal clock. The memory circuitry also includes internal clock generating circuitry to generate the internal clock in response to a system clock. The first edges of the internal clock are generated in response to both a rising and a falling edge of the system clock.
1. Memory circuitry comprising:
memory components operable in response to first edges of an internal clock; and
internal clock generating circuitry configured to generate the internal clock in response to a system clock, wherein the first edges of the internal clock are generated in response to both a rising and a falling edge of the system clock, and wherein the internal clock generating circuitry receives a reset signal.
2. The memory circuitry of claim 1 wherein the first edges are one of rising edges and falling edges.
3. The memory circuitry of claim 1 wherein the internal clock generating circuitry comprises:
a pulse generation circuit configured to generate a pulse in response to an edge of the system clock.
4. The memory circuitry of claim 3 wherein the internal clock generating circuit comprises an edge detection circuit to generate the first edges in response to the pulse.
5. The memory circuitry of claim 4 wherein the internal clock generating circuitry further comprises:
a hold circuit configured to receive the first edges from the edge detection circuit and hold a value to which the first edges transitions in response to the pulse.
6. The memory circuitry of claim 5 wherein the hold circuit is configured to hold a value of the internal clock until receipt of the reset signal.
7. The memory circuitry of claim 6 further comprising:
self-time circuitry, the self-time circuitry being configured to generate the reset signal.
8. The memory circuitry of claim 3 wherein the edge detection circuit further comprises:
an enable input configured to receive an enable signal.
9. The memory circuitry of claim 1 wherein read and write operations of the memory components are triggered at the first edges.
10. The memory circuitry of claim 1 wherein reset events of the memory components are timed according to self-timing circuitry.
11. The memory circuitry of claim 10 wherein the reset events are at least one of sense amplifier enable, bit line pre-charge on, word line off and clock generator reset.
12. The memory circuitry of claim 1 wherein the memory components are configured for synchronous self-timed memory functions.
13. A system comprising:
at least one dual edge triggered synchronous component; memory circuit coupled to the at least one dual edge triggered synchronous component and comprising:
memory components operable in response to first edges of an internal clock; and
internal clock generating circuitry configured to generate the internal clock in response to a system clock, wherein the first edges of the internal clock are generated in response to both a rising and a falling edge of the system clock, and wherein the internal clock generating circuitry receives a reset signal.
14. The system of claim 13 wherein the at least one dual edge triggered synchronous comprises a flip-flop.
15. The system of claim 13 wherein the at least one edge triggered synchronous component comprises at least one combinational logic component.
16. A memory device comprising:
functional means for carrying out a memory function in response to first edges of an internal clock; and
clock generating means for generating the internal clock in response to a system clock, wherein the first edges of the internal clock are generated in response to both a rising and a falling edge of the system clock, and wherein the clock generating means receives a reset signal pulse.
17. The memory device of claim 16 wherein the clock generating means comprises:
pulse generating means for generating a pulse in response to an edge of the system clock.
18. The memory device of claim 17 wherein the clock generating means further comprises an edge detection circuit to generate the first clock edges in response to the pulse.
19. The memory device of claim 18 wherein the clock generating means comprises:
holding means for receiving the first clock edges from the edge detection means and holding a value to which the first edges transition in response to the pulse.
20. The memory device of claim 19 wherein the holding means is further for holding a value of the internal clock until receipt of the reset signal pulse.
21. The memory device of claim 20 further comprising:
self-time means for generating the reset signal pulse.
22. The memory device of claim 18 wherein the edge detector circuit further comprises:
enable input means for receiving an enable signal.
23. The memory device of claim 16 wherein read and write operations are triggered at the first edges of the internal clock.
24. The memory device of claim 16 wherein reset events are timed according to a self-timing circuitry.
25. The memory device of claim 24 wherein the reset events are at least one of sense amplifier enable, bit line pre-charge on, word line off and clock generator means reset.
26. The memory device of claim 16 wherein the functional means and clock generating means are configured for synchronous self-timed memory operations.