IP Library Granted Patent US 9,543,947
Granted Patent B2
US 9,543,947 · App. 14/287,203 · Granted Jan 10, 2017

Semiconductor device

Inventor: Masahiro Araki (Kanagawa, JP)
Assignee: Renesas Electronics Corporation
H03K17/962H03K2217/960705H03K2217/960725
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Quick Facts
Patent No.
US 9,543,947
App. No.
14/287,203
Granted
Jan 10, 2017
Kind
B2
Abstract

A semiconductor device containing a terminal, a power supply voltage dropping circuit that generates a constant voltage, a switch circuit to periodically apply a constant voltage to a terminal in response to a first clock, a current-controlled oscillator circuit, and a counter, and in which the power supply voltage dropping circuit supplies a first current to the switch circuit, the current-controlled oscillator circuit generates a second clock whose frequency changes in response to the value of the first current, and the counter counts the number of second clocks within the counting time.

Claims (55)

1. A semiconductor device comprising:

a terminal;

a power supply voltage dropping circuit that generates a constant voltage and includes a first transistor that outputs a first current;

a switch circuit that is supplied with the first current and that periodically applies the constant voltage to the terminal in response to a first clock;

a first current-controlled oscillator circuit that generates a second clock;

a first counter that counts the second clock in a counting time; and

a current mirror circuit that includes the first transistor and a second transistor, and the second transistor supplies a second current to the first current-controlled oscillator circuit,

wherein a frequency of the second clock changes in response to a value of the first current and a value of the second current.

2. The semiconductor device according to claim 1 , further comprising:

a first constant current source that supplies a third current to the switch circuit.

3. The semiconductor device according to claim 1 ,

wherein the switch circuit is an inverter circuit.

4. The semiconductor device according to claim 3 , further comprising:

a touch electrode coupled to the terminal,

wherein a value of the first current changes in response to a change in a parasitic capacitance value of the touch electrode coupled to the terminal.

5. The semiconductor device according to claim 4 ,

wherein the change in the parasitic capacitance value of the touch electrode is detected based on a change in the count of the second clock.

6. A semiconductor device comprising:

a terminal;

a power supply voltage dropping circuit that generates a constant voltage;

a switch circuit that periodically applies the constant voltage to the terminal in response to a first clock;

a first current-controlled oscillator circuit; and

a first counter,

wherein the power supply voltage dropping circuit supplies a first current to the switch circuit,

wherein the first current-controlled oscillator circuit generates a second clock whose frequency changes in response to a value of the first current,

wherein the first counter counts the second clock in a counting time,

wherein the semiconductor device further comprises:

a second transistor,

wherein the power supply voltage dropping circuit includes a first transistor that outputs the first current,

wherein a current mirror circuit includes the first transistor and the second transistor, and

wherein the second transistor supplies a second current to the first current-controlled oscillator circuit.

7. The semiconductor device according to claim 6 ,

wherein a frequency of the second clock changes in response to a value of the second current.

8. The semiconductor device according to claim 7 , further comprising:

a first constant current source that supplies a third current to the switch circuit.

9. The semiconductor device according to claim 7 ,

wherein the switch circuit is an inverter circuit.

10. The semiconductor device according to claim 9 ,

wherein the value of the first current changes in response to a change in a parasitic capacitance value of a touch electrode coupled to the terminal.

11. The semiconductor device according to claim 10 ,

wherein the change in the parasitic capacitance value of the touch electrode is detected based on a change in the count of the second clock.

12. A semiconductor device comprising:

a terminal;

a power supply voltage dropping circuit that generates a constant voltage and includes a first transistor that outputs a first current;

a switch circuit that is supplied with the first current and that periodically applies the constant voltage to the terminal in response to a first clock;

a first current-controlled oscillator circuit that generates a second clock;

a first counter that counts the second clock in a counting time;

a current mirror circuit that includes the first transistor and a second transistor, and the second transistor supplies a second current to the first current-controlled oscillator circuit; and

a touch electrode coupled to the terminal,

wherein a frequency of the second clock changes in response to a value of the first current and a value of the second current, and

wherein a value of the first current changes in response to a change in a parasitic capacitance value of the touch electrode coupled to the terminal.

13. The semiconductor device according to claim 12 , further comprising:

a first constant current source that supplies a third current to the switch circuit.

14. The semiconductor device according to claim 12 , further comprising:

wherein the switch circuit is an inverter circuit.

Assignments (2)
CHANGE OF ADDRESS Recorded Nov 29, 2017
From: RENESAS ELECTRONICS CORPORATION
To: RENESAS ELECTRONICS CORPORATION
Reel/Frame 044928/0001 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded May 27, 2014
From: ARAKI, MASAHIRO
To: RENESAS ELECTRONICS CORPORATION
Reel/Frame 032962/0041 →
Priority Claims (1)
JP 2013-135092 · Jun 27, 2013 · national
Continuity (1)
Related Publication 20150002219A1 · Jan 1, 2015