Scintillator array, and X-ray detector and X-ray examination device using scintillator array
In one embodiment, a scintillator array includes a plurality of scintillator blocks, and a reflective layer part interposed between the adjacent scintillator blocks. The plurality of scintillator blocks are integrated by the reflective layer part. The reflective layer part includes reflective particles dispersed in a transparent resin. The reflective particles include at least one selected from titanium oxide particles and tantalum oxide particles, and have a mean particle diameter of 2 μm or less. The number of the reflective particles existing per unit area of 5 μm×5 μm of the reflective layer part is in a range of 100 or more and 250 or less.
1. A scintillator array, comprising:
a plurality of scintillator blocks; and
a reflective layer part, interposed between adjacent scintillator blocks to integrate the plurality of scintillator blocks, the reflective layer part comprising a transparent resin and reflective particles dispersed in the transparent resin, wherein the reflective particles include at least one type of particle selected from the group consisting of titanium oxide particles and tantalum oxide particles, and have a mean particle diameter of 2 μm or less;
wherein a number of the reflective particles existing per unit area of 5 μm×5 μm of the reflective layer part is in a range of 100 or more and 250 or less;
wherein each of the scintillator blocks has an R-shaped portion at an end portion thereof, and the R-shaped portion has a shape wherein a ratio of a width W 2 of the R-shaped portion to a width W 1 of the scintillator block is in a range of 0.007 to 0.02, and a ratio of a thickness T 2 of the R-shaped portion to a thickness T 1 of the scintillator block is in a range of 0.006 to 0.02; and
wherein a warpage amount of the scintillator array is 0.2 mm or less.
2. The scintillator array according to claim 1 ,
wherein an area ratio of aggregates of the reflective particles per unit area of 10 μm×10 μm of the reflective layer part is 40% or less (including 0%).
3. The scintillator array according to claim 1 ,
wherein the reflective layer part is directly bonded to each of the adjacent scintillator blocks.
4. The scintillator array according to claim 1 ,
wherein an existing ratio of voids in a cross section in a thickness direction of the reflective layer part is 1% or less.
5. The scintillator array according to claim 1 ,
wherein the scintillator block has a surface roughness in arithmetic mean roughness Ra of 5 μm or less.
6. The scintillator array according to claim 1 ,
wherein the scintillator block includes at least one selected from the group consisting of a gadolinium oxysulfide sintered compact and an aluminum garnet sintered compact.
7. The scintillator array according to claim 1 ,
wherein the mean particle diameter of the reflective particles is 1 μm or less.
8. The scintillator array according to claim 1 ,
wherein the transparent resin comprises an epoxy resin.
9. The scintillator array according to claim 1 ,
wherein a reflectance of the reflective layer part to light with a wavelength of 510 nm is 93% or more.
10. The scintillator array according to claim 1 ,
wherein a reflectance of the reflective layer part to light with a wavelength of 670 nm is 90% or more.
11. The scintillator array according to claim 1 , further comprising:
a surface reflective layer provided at least on one surface of the scintillator array.
12. An X-ray detector comprising the scintillator array according to claim 1 .
13. An X-ray examination device comprising the X-ray detector according to claim 12 .