Apparatuses and methods for testing electrochemical cells by measuring frequency response

1. A method of estimating an impedance of a device to be measured, comprising:

generating a stimulus signal comprising a summation of two or more sinusoidal signals at different frequencies with a frequency step factor therebetween;

advancing the stimulus signal by one sample-time step;

applying the advanced stimulus signal to the device to be measured with an impedance measurement device;

detecting a response signal with the impedance measurement device, the response signal comprising a response of the device to be measured to the advanced stimulus signal; and

estimating the impedance of the device to be measured using a sum-of-sines analysis of the response signal; and

calibrating the impedance measurement device before applying the advanced stimulus signal by:

pre-emphasizing a magnitude and phase of each of the two or more sinusoidal signals;

applying the advanced and pre-emphasized stimulus signal to one or more shunt impedances at a known Root Mean Square (RMS) current;

detecting a current calibration response signal of the one or more shunt impedances with the impedance measurement device;

determining calibration coefficients from the current calibration response signal;

scaling the magnitude of calibration coefficients to each of the two or more sinusoidal signals to an RMS value less than or equal to the known RMS current; and

applying the calibration coefficients to each of the two or more sinusoidal signals.

2. The method of claim 1 , wherein frequency ranges of the two or more sinusoidal signals at different frequencies are predetermined.

3. The method of claim 2 , wherein:

the pre-determined frequency ranges have some overlap and a longest frequency range of the pre-determine frequency ranges is used for the act of applying the advanced and pre-emphasized stimulus signal to the one or more shunt impedances at the known Root Mean Square (RMS) current; and

the method further includes scaling the two or more sinusoidal signals to a number of frequencies that is a subset of the frequencies in the longest frequency range.

4. The method of claim 1 , wherein calibrating the impedance measurement device before applying the advanced stimulus signal further comprises:

selectively enabling one or more shunts in the impedance measurement device to be coupled to the stimulus signal; and

pre-emphasizing a magnitude of each of the two or more sinusoidal signals before applying the advanced stimulus signal such that a magnitude of the response signal is substantially flat over a frequency range encompassing all of the two or more sinusoidal signals.

5. The method of claim 1 , wherein calibrating the impedance measurement device before applying the advanced stimulus signal further comprises:

selectively enabling one or more shunts in the impedance measurement device to be coupled to the stimulus signal; and

pre-emphasizing a phase of each of the two or more sinusoidal signals before applying the advanced stimulus signal such that a phase shift of the response signal is substantially near zero.

6. The method of claim 1 , wherein calibrating the impedance measurement device before applying the advanced stimulus signal further comprises:

pre-emphasizing a magnitude of each of the two or more sinusoidal signals;

applying the advanced and pre-emphasized stimulus signal to the impedance measurement device with a first shunt impedance and detecting a first response signal of the impedance measurement device with the first shunt impedance;

applying the advanced and pre-emphasized stimulus signal to the impedance measurement device with a second shunt impedance and detecting a second response signal of the impedance measurement device with the second shunt impedance;

applying the advanced and pre-emphasized stimulus signal to the impedance measurement device with a third shunt impedance and detecting a third response signal of the impedance measurement device with the third shunt impedance;

combining the first response signal, the second response signal and the third response signal using a least squares linear regression to determine a magnitude calibration for each of the one or more sinusoidal signals; and

applying the magnitude calibration to each of the two or more sinusoidal signals of the advanced stimulus signal.

7. The method of claim 1 , wherein calibrating the impedance measurement device before applying the advanced stimulus signal further comprises:

pre-emphasizing a phase of each of the two or more sinusoidal signals;

applying the advanced and pre-emphasized stimulus signal to the impedance measurement device with a first phase shift on a shunt impedance and detecting a first response signal of the impedance measurement device;

applying the advanced stimulus and pre-emphasized signal to the impedance measurement device with a second phase shift on the shunt impedance and detecting a second response signal of the impedance measurement device;

applying the advanced stimulus and pre-emphasized signal to the impedance measurement device with a third phase shift on the shunt impedance and detecting a third response signal of the impedance measurement device;

combining the first response signal, the second response signal and the third response signal using a least squares linear regression to determine a phase calibration for each of the one or more sinusoidal signals; and

applying the phase calibration to each of the two or more sinusoidal signals of the advanced stimulus signal.

8. The method of claim 1 , wherein before applying the advanced stimulus signal to the device to be measured, the method further comprises calibrating the method by:

determining a gain correction for each frequency of the two or more sinusoidal signals using three or more shunt impedances encompassing an expected magnitude of the impedance of the device to be measured by:

pre-emphasizing a magnitude of each of the two or more sinusoidal signals in the advanced stimulus signal;

applying the advanced and pre-emphasized stimulus signal to each of the three or more shunt impedances and detecting a magnitude-calibration response signal for each of the three or more shunt impedances; and

combining the magnitude-calibration response signals with a least squares linear regression for magnitude to develop the gain corrections for each frequency of the two or more sinusoidal signals;

further calibrating the method by determining a phase correction for each frequency of the two or more sinusoidal signals using three or more phase shifts by:

pre-emphasizing a phase of each of the two or more sinusoidal signals in the advanced stimulus signal using the three or more phase shifts;

applying the advanced and pre-emphasized stimulus signal to one shunt impedance and detecting a phase-calibration response signal for each of the three or more phase shifts; and

combining the phase-calibration response signals with a least squares linear regression for phase to develop the phase corrections for each frequency of the two or more sinusoidal signals; and

applying the corresponding gain corrections and the corresponding phase corrections to each frequency of the two or more sinusoidal signals of the advanced stimulus signal.

9. The method of claim 1 , wherein the known RMS current is substantially 500 mA.

10. A method of estimating an impedance of a device to be measured, comprising:

generating a stimulus signal comprising two or more sinusoidal signals at different frequencies with a frequency step factor therebetween;

determining a final buck voltage by:

comparing a buck voltage to a bias voltage comprising a voltage of the device to be measured;

modifying the buck voltage;

continuously repeating the comparing and modifying of the buck voltage until the comparison is within an error tolerance; and

once within the error tolerance, maintaining the buck voltage as the final buck voltage; and

after determining the final buck voltage:

applying the stimulus signal to the device to be measured to develop a response signal, the response signal comprising a response of the device to be measured to the stimulus signal and including the bias voltage;

continuously comparing the final buck voltage to the response signal to develop a bias-removed response signal comprising the response signal with the final buck voltage subtracted out; and

estimating the impedance of the device to be measured responsive to the bias-removed response signal using the impedance measurement device.

11. The method of claim 10 , wherein comparing the buck voltage to the bias voltage and comparing the final buck voltage to the response signal comprise comparing mid-range voltages.

12. The method of claim 11 , wherein the mid-range voltages are substantially equal to 50 volts.

13. The method of claim 10 , wherein comparing the buck voltage to the bias voltage and comparing the final buck voltage to the response signal comprise comparing high-range voltages.

14. The method of claim 13 , wherein the high-range voltages are substantially equal to 300 volts.

15. The method of claim 10 , wherein the final buck voltage is a final coarse buck voltage and the method further comprising:

after determining the final coarse buck voltage and before applying the stimulus signal, determining a final fine buck voltage, by:

comparing a fine buck voltage to the voltage of the device to be measured;

modifying the fine buck voltage;

continuously repeating the comparing and modifying of the fine buck voltage until the comparison is within the error tolerance; and

once within the error tolerance, maintaining the final fine buck voltage; and

wherein continuously comparing the final buck voltage to the response signal comprises comparing the response signal to a combination of the final coarse buck voltage and the final fine buck voltage to develop the bias-removed response signal.

16. The method of claim 15 , wherein the final coarse buck voltage and the final fine buck voltage are determined using a digital feedback system with total ground isolation.

17. An impedance measurement device, comprising:

a processor;

a data acquisition system;

a sum-of-sines generator for generating a stimulus signal to be applied to a device to be measured, the stimulus signal including a summation of two or more sinusoidal signals at different frequencies with a frequency step factor therebetween; and

a preamplifier for:

detecting a bias voltage comprising a voltage of the device to be measured;

receiving a buck voltage;

applying the stimulus signal to the device to be measured; and

detecting a response signal comprising a response of the device to be measured to the stimulus signal and including the bias voltage; and

wherein one or more of the processor and the data acquisition system are configured to:

perform the functions of the sum-of-sines generator;

determine a final buck voltage by:

comparing the buck voltage to the bias voltage;

modifying the buck voltage;

continuously repeating the comparing and modifying of the buck voltage until the comparison is within an error tolerance; and

once within the error tolerance, maintaining the buck voltage as the final buck voltage;

continuously apply the final buck voltage to the preamplifier to subtract the final buck voltage from the response signal to generate a bias-removed response signal; and

estimate the impedance of the device to be measured responsive to the bias-removed response signal.

18. The impedance measurement device of claim 17 , wherein the preamplifier is further configured to interface to the device to be measured with the stimulus signal, the response of the device to be measured, and the final buck voltage as mid-range voltages.

19. The impedance measurement device of claim 18 , wherein the mid-range voltages are substantially equal to 50 volts.

20. The impedance measurement device of claim 17 , wherein the preamplifier is further configured to interface to the device to be measured with the stimulus signal, the response of the device to be measured, and the final buck voltage as high-range voltages.

21. The impedance measurement device of claim 20 , wherein the high-range voltages are substantially equal to 300 volts.

22. The impedance measurement device of claim 17 , wherein the preamplifier further comprises a current driver that is configured to generate current for the stimulus signal at a mid-range voltage.

23. The impedance measurement device of claim 17 , wherein the preamplifier further comprises a differential amplifier configured to determine an analog difference between a voltage from the device to be measured and the final buck voltage to perform the subtraction of the final buck voltage from the response signal.

24. The impedance measurement device of claim 17 , wherein the preamplifier further comprises a current driver that is configured to generate current for the stimulus signal at a high-range voltage through a blocking capacitor.

25. An impedance measurement device comprising:

a processor;

a data acquisition system;

a sum-of-sines generator for generating a stimulus signal to be applied to a device to be measured, the stimulus signal including a summation of two or more sinusoidal signals at different frequencies with a frequency step factor therebetween;

a preamplifier configured to interface to the device to be measured with the stimulus signal, a response of the device to be measured, and a final buck voltage as high-range voltages and for:

detecting a bias voltage comprising a voltage of the device to be measured;

supplying the final buck voltage matching the bias voltage;

applying the stimulus signal to the device to be measured; and

detecting a response signal comprising a response of the device to be measured to the stimulus signal and including the bias voltage; and

a circuit combination including a coupling capacitor, and two or more relays configured for interfacing to the high-range voltages such that:

one or more first relays close to charge the coupling capacitor to the high-range voltage of the device to be measured while a second relay isolates the impedance measurement device from the coupling capacitor;

after the coupling capacitor is charged, the second relay closes to couple the impedance measurement device to the coupling capacitor to apply the stimulus signal; and

after the sampling of the response signal, the one or more first relays open to decouple the device to be measured from the coupling capacitor;

wherein one or more of the processor and the data acquisition system are configured to:

perform the functions of the sum-of-sines generator;

continuously apply the final buck voltage to the preamplifier to subtract the final buck voltage from the response signal to generate a bias-removed response signal; and

estimate the impedance of the device to be measured responsive to the bias-removed response signal.