Method for reducing warpage of glass substrate caused by chemical strengthening process, and method for producing chemically strengthened glass substrate
View Patent ↗A method includes: forming at least one layer of a film formed of an inorganic material, that contains H atoms in a concentration of 1.0×10 15 to 1.0×10 19 atom/mm 3 , on at least a top surface of a glass substrate having a bottom surface to contact a molten metal during forming and the top surface facing the bottom surface, thereby reducing a warpage of the glass substrate caused by a chemical strengthening process performed after forming the at least one layer on the top surface of the glass substrate. The glass substrate is formed by a float process.
1. A method comprising:
forming at least one layer of a film formed of an inorganic material, that contains H atoms in a concentration of 1.0×10 15 to 1.0×10 19 atom/mm 3 , on at least a top surface of a glass substrate having a bottom surface to contact a molten metal during forming and the top surface facing the bottom surface, thereby reducing a warpage of the glass substrate caused by a chemical strengthening process performed after forming the at least one layer on the top surface of the glass substrate,
wherein the glass substrate is formed by a float process.
2. The method according to claim 1 , wherein the inorganic material is an alkali-free oxide.
3. The method according to claim 2 , wherein the alkali-free oxide includes at least one of an oxide and a composite oxide, the oxide and composite oxide include at least one element selected from the group consisting of silicon, titanium, tin, aluminum, zinc, chromium, copper, manganese, iron, cobalt, nickel, zirconium, silver, niobium, molybdenum, antimony, and indium.
4. The method according to claim 1 , wherein the film formed of the inorganic material is a film formed by an atmospheric pressure CVD method.
5. A method for producing a chemically strengthened glass substrate, the method comprising:
forming at least one layer of a film formed of an inorganic material, that contains H atoms in a concentration of 1.0×10 15 to 1.0×10 19 atom/mm 3 , on at least a top surface of a glass substrate having a bottom surface to contact a molten metal during forming and the top surface facing the bottom surface; and
subjecting the glass substrate in which the film has been formed to a chemical strengthening process,
wherein the glass substrate is formed by a float process.
6. The method according to claim 5 , wherein the inorganic material is an alkali-free oxide.
7. The method according to claim 6 , wherein the alkali-free oxide includes at least one of an oxide and a composite oxide, the oxide and composite oxide include at least one element selected from the group consisting of silicon, titanium, tin, aluminum, zinc, chromium, copper, manganese, iron, cobalt, nickel, zirconium, silver, niobium, molybdenum, antimony, and indium.
8. The method according to claim 5 , wherein the film formed of the inorganic material is a film formed by an atmospheric pressure CVD method.