X-ray theodolite
View Patent ↗Methods and apparatus for determining the distance to a specified point or distances between specified points on one or more objects, where the specified points are obscured behind an opaque barrier and cannot be viewed. Specified points are illuminated with penetrating radiation from two or more successive locations, and scattered radiation from the specified points is detected, and distance is calculated based on illumination angles. The apparatus has a source of penetrating radiation, a beam scanner for directing the penetrating radiation, a detector for detecting scattered radiation, and a processor for calculating the distance.
1. A method for ascertaining a distance between two specified stationary scattering points, comprising:
a. illuminating a first angular region including the two specified stationary scattering points with a first pencil beam of penetrating radiation emanating from a first location;
b. detecting scattered radiation from the two specified stationary scattering points;
c. illuminating a second angular region including the two specified stationary scattering points with a second pencil beam of penetrating radiation emanating from a second location, the second location displaced relative to the first location by a known distance;
d. detecting scattered penetrating radiation from the two specified stationary scattering points; and
e. calculating the distance between the two specified stationary scattering points based on illumination angles characterizing the two specified stationary scattering points as illuminated by the first and second pencil beams of penetrating radiation.
2. A method according to claim 1 , wherein a visually opaque surface is disposed between the first location and each of the two specified stationary scattering points.
3. The method according to claim 1 , wherein the steps of illuminating include scanning with at least one X-ray source.
4. A method for ascertaining a distance from an x-ray measurement apparatus to a specified stationary scattering point, the method comprising:
a. illuminating an object that includes the stationary scattering point with a first pencil beam of penetrating radiation emanating from a first location;
b. detecting scattered radiation from the stationary scattering point on the object;
c. illuminating the object with a second pencil beam of penetrating radiation emanating from a second location displaced by a known distance relative to the first location;
d. detecting scattered radiation from the stationary scattering point on the object; and
e. calculating the distance from the x-ray measurement apparatus to the specified object based on illumination angles characterizing the stationary scattering point as illuminated by the first and second pencil beams of penetrating radiation.
5. An apparatus for ascertaining a distance between two specified stationary scattering points, comprising:
a. a source of penetrating radiation adapted to illuminate a plurality of angular regions including the two specified stationary scattering points, each angular region illuminated from a plurality of successive locations;
b. a beam scanner for directing a pencil beam of penetrating radiation over each angular region from each successive location of the source;
c. a detector for detecting scattered radiation from the two specified stationary scattering points; and
d. a processor for calculating the distance between the two specified stationary scattering points based on illumination angles characterizing the two points as illuminated by the pencil beam of penetrating radiation at each successive location of the source.
6. The apparatus according to claim 5 , wherein the source of penetrating radiation is an X-ray source.