Calibration of voltage regulator
View Patent ↗A voltage regulator calibrator analyzes voltage regulator output and compares the output with known electrical loads. The calibrator selects a known electrical load, applies the known electrical load to a voltage regulator, receives from the voltage regulator measured output power characteristics of the voltage regulator, compares the known electrical load with the measured output power characteristics, and generates a voltage regulator adjustment value based on the compared values. Embodiments of the present disclosure also include a method for calibrating, the method including selecting a known electrical load, applying the known electrical load to a voltage regulator, receiving measured output power characteristics of the voltage regulator, comparing the known electrical load with the measured output power characteristics, and generating a voltage regulator adjustment value based on the compared values.
1. A method, comprising:
selecting a known electrical load;
applying the known electrical load, using a programmable load device that is external to an Information Handling System (IHS) and coupled to a motherboard of the IHS via probes oriented in an overlay fixture, to a voltage regulator configured to provide a regulated electrical output to a component of the IHS, where the applying occurs while the component is disconnected from the motherboard;
receiving, from the voltage regulator via a digital communication bus, measured output power characteristics of the voltage regulator;
comparing the known electrical load with the measured output power characteristics; and
generating a voltage regulator adjustment value based on the comparing.
2. The method of claim 1 , where the voltage regulator adjustment value comprises an offset value and a gain value.
3. The method of claim 2 , further comprising:
first applying a first known electrical load, receiving a first measured output characteristic, and comparing the first known electrical load with the first measured output characteristic;
second applying a second known electrical load, receiving a second measured output characteristic, and comparing the second known electrical load with the second measured output characteristic; and
calculating the offset value and the gain value based on the first applying and the second applying.
4. The method of claim 1 , further comprising iteratively performing the selecting, the applying, the receiving, the comparing, and the generating for each of a plurality of phases of the voltage regulator.
5. The method of claim 1 , further comprising initializing the voltage regulator over a digital communication bus.
6. The method of claim 5 , where the digital communication bus is one of a power management bus, a system management bus, a SVID bus, or an I2C bus.
7. The method of claim 1 , further comprising storing the generated voltage regulator adjustment value and updating the voltage regulator with the generated voltage regulator adjustment value.
8. A memory device having program instructions stored thereon that, upon execution by a processing device, cause the processing device to:
select a known electrical load;
apply the known electrical load to a voltage regulator using a programmable load device coupled to a motherboard of the IHS via probes oriented in an overlay fixture, where the voltage regulator is configured to provide a regulated electrical output to a component of the IHS;
receive, from the voltage regulator via a digital communication bus, measured output power characteristics of the voltage regulator;
compare the known electrical load with the measured output power characteristics; and
generate a voltage regulator adjustment value based on the comparing.
9. The memory device of claim 8 , where the voltage regulator adjustment value comprises an offset value and a gain value.
10. The memory device of claim 9 , wherein the program instructions, upon execution, further cause the processing device to:
first apply a first known electrical load, receive a first measured output characteristic, and compare the first known electrical load with the first measured output characteristic;
second apply a second known electrical load, receive a second measured output characteristic, and compare the second known electrical load with the second measured output characteristic; and
calculate the offset value and the gain value based on the first applying and the second applying.
11. The memory device of claim 8 , wherein the program instructions, upon execution, further cause the processing device to:
iteratively perform the selecting, the applying, the receiving, the comparing, and the generating for each of a plurality of phases of the voltage regulator.
12. The memory device of claim 8 , wherein the program instructions, upon execution, further cause the processing device to initialize the voltage regulator over a digital communication bus.
13. The memory device of claim 12 , where the digital communication bus is one of a power management bus, a system management bus, a SVID bus, or an I2C bus.
14. The memory device of claim 8 , wherein the program instructions, upon execution, further cause the processing device to update the voltage regulator with the generated voltage regulator adjustment value.
15. A computing device, comprising:
a processor; and
a memory coupled to the processor and configured to store program instructions that, upon execution by the processor, cause the computing device to:
select a known electrical load;
apply the known electrical load to a voltage regulator using a programmable load device that is external to the computing device and coupled to a motherboard of the computing device via probes oriented in an overlay fixture, where the voltage regulator is configured to provide a regulated electrical output to a component of an Information Handling System (IHS), and where the applying occurs while the component is absent from the IHS;
receive, from the voltage regulator via a digital communication bus, measured output power characteristics of the voltage regulator;
compare the known electrical load with the measured output power characteristics; and
generate a voltage regulator adjustment value based on the comparing.
16. The computing device of claim 15 , where the voltage regulator adjustment value comprises an offset value and a gain value.
17. The computing device of claim 16 , where the computing device is further configured to iteratively identify a plurality of formatting instructions in a logging stream.
18. The computing device of claim 15 , wherein the computing device is further configured to:
first apply a first known electrical load, receive a first measured output characteristic, and compare the first known electrical load with the first measured output characteristic;
second apply a second known electrical load, receive a second measured output characteristic, and compare the second known electrical load with the second measured output characteristic; and
calculate an offset value and a gain value based on the first applying and the second applying.
19. The computing device of claim 15 , where the computing device is further configured to iteratively select, apply, receive, compare, and generate for each of a plurality of phases of the voltage regulator.
20. The computing device of claim 15 , where the computing device is further configured to iteratively select, apply, receive, compare, and generate in response to an indication of a change in voltage of the voltage regulator.
21. The computing device of claim 15 , where the computing device is further configured to store the generated voltage regulator adjustment value in a non-volatile storage device, where the non-volatile storage device is coupled with the voltage regulator.