System and method for damage diagnosis
View Patent ↗The object of the invention is to provide a damage diagnostic system that uses a damage detection system that obtains propagation intensity distribution data, which is expanded in the two dimensions frequency and propagation time, by converting the output value from an oscillation detection sensor that was obtained when oscillation is performed by an oscillator, and for one mode or two or more modes that are selected from the fundamental mode and higher mode of Lamb waves, obtains certain characteristic values from the data, for example three indices, which are the slope of the mode dispersion of the A1 mode (rate of change of the propagation time with respect to the frequency), the amount of decrease in the propagation time of the A1 mode, and the amount of increase in the propagation time of the S0 and S1 modes, and outputs the measurement results. The measurement results are displayed on a display device.
1. A system for damage diagnosis for diagnosing damage on or within an object constructed of a Carbon Fiber Reinforced Plastic (CFRP) material, the system comprising:
two oscillators, each oscillator comprising an MFC (Macro Fiber Composite) actuator having a piezoelectric element, with one oscillator being attached to one surface, and the other oscillator being attached to a second, opposing surface in the thickness direction of the object, for applying a broadband ultrasonic oscillation to the object to generate in the object a broadband Lamb wave comprising at least a one-dimensional asymmetric (A1) mode by causing strain orthogonal to an axial direction of the piezoelectric element, which is a direction parallel to a direction of wave propagation;
an oscillation detection sensor comprising an FBG (Fiber Bragg Grating) optical fiber placed near a location of the damage diagnoses, for detecting the broadband Lamb wave propagating through the object by detecting strain occurring in an axial direction of the FBG optical fiber;
a spectrum analyzer, connected to the oscillation detection sensor, comprising a light source that includes all oscillation areas of reflected wavelengths of the oscillation detection sensor; and
a processing unit, being connected to the oscillator, the spectrum analyzer, and the oscillation detection sensor, and having processes for
(1) executing an oscillation control process to control the oscillators, wherein the processing unit controls the two oscillators so that an asymmetrical mode Lamb wave having directivity, is generated in the object,
(2) obtaining, via output wave data acquired from the spectrum analyzer, a two-dimensional propagation intensity distribution of the broadband Lamb wave according to propagation time and frequency based on a time-frequency transformation,
(3) analyzing a portion of the two-dimensional propagation intensity distribution, the portion indicating the propagation of the A1 mode in terms of the propagation time and frequency, wherein the A1 mode is converted to a fundamental symmetric (S0) mode in a peeling section and converted back to the A1 mode after the peeling section, wherein the propagation time changes due to the mode conversion in the peeling section as compared to the propagation time in the absence of the peeling section, and wherein the propagation time of the A1 mode decreases as the length of the peeling section increases,
(4) generating reference data indicating relationships between the propagation time and the frequency of the A1 mode for different lengths of the peeling section based on the process (3), and
(5) determining the length of an unknown peeling section by comparing measured data to the reference data.
2. The system for damage diagnosis according to claim 1 , wherein
the references data is configured to illustrate a rate of change in the frequency with respect to the propagation time for the A1 mode for each of different lengths of the peeling section.
3. The system for damage diagnosis according to claim 1 , wherein
the A1 mode includes a plurality of waves having mutually different frequencies; and
the propagation time of the A1 mode is a propagation time of a maximum intensity portion of at least one of the plurality of waves.
4. The system for damage diagnosis according to claim 1 , wherein
the processing unit, in the oscillation control process, controls the two oscillators so that an symmetric mode is canceled out and an asymmetric mode is emphasized by adding the broadband Lamb waves.
5. The system for damage diagnosis according to claim 1 , wherein
the time-frequency transformation is any one of the wavelet transformation, short-time Fourier transformation, chirplet transformation, Wigner transformation, and Stockwell transformation, or a combination of any two or more of said transformations.
6. The system for damage diagnosis according to claim 1 , wherein
the oscillator is attached to the object.
7. The system for damage diagnosis according to claim 1 , wherein
the oscillation detection sensor is attached to the object.
8. A method for damage diagnosis for diagnosing damage on or within an object constructed of a Carbon Fiber Reinforced Plastic (CFRP) material, the method using:
two oscillators, each oscillator comprising an MFC (Macro Fiber Composite) actuator having a piezoelectric element, with one oscillator being attached to one surface, and the other oscillator being attached to a second, opposing surface in the thickness direction of the object, for applying a broadband ultrasonic oscillation to the object to generate in the object a broadband Lamb wave comprising at least a one-dimensional asymmetric (A1) mode by causing strain orthogonal to an axial direction of the piezoelectric element, which is a direction parallel to a direction of wave propagation;
an oscillation detection sensor comprising an FBG (Fiber Bragg Grating) optical fiber placed near a location of the damage diagnoses, for detecting the broadband Lamb wave propagating through the object by detecting strain occurring in an axial direction of the FBG optical fiber;
a spectrum analyzer, connected to the oscillation detection sensor, comprising a light source that includes all oscillation areas of reflected wavelengths of the oscillation detection sensor; and
a processing unit, being connected to the oscillator, the spectrum analyzer, and the oscillation detection sensor,
the method comprising:
(1) executing an oscillation control process to control the oscillators, wherein the processing unit controls the two oscillators so that an asymmetrical mode Lamb wave having directivity, is generated in the object,
(2) obtaining, via output wave data acquired from the spectrum analyzer, a two-dimensional propagation intensity distribution of the broadband Lamb wave according to propagation time and frequency based on a time-frequency transformation,
(3) analyzing a portion of the two-dimensional propagation intensity distribution, the portion indicating the propagation of the A1 mode in terms of the propagation time and frequency, wherein the A1 mode is converted to a fundamental symmetric (S0) mode in a peeling section and converted back to the A1 mode after the peeling section, wherein the propagation time changes due to the mode conversion in the peeling section as compared to the propagation time in the absence of the peeling section, and wherein the propagation time of the A1 mode decreases as the length of the peeling section increases,
(4) generating reference data indicating relationships between the propagation time and the frequency of the A1 mode for different lengths of the peeling section based on the process (3), and
(5) determining the length of an unknown peeling section by comparing measured data to the reference data.
9. The method for damage diagnosis according to claim 8 , wherein
the references data is configured to illustrate a rate of change in the frequency with respect to the propagation time for the A1 mode for each of different lengths of the peeling section.
10. The method for damage diagnosis according to claim 8 , wherein
the time-frequency transformation is any one of the wavelet transformation, short-time Fourier transformation, chirplet transformation, Wigner transformation, and Stockwell transformation, or a combination of any two or more of said transformations.