Sensor chip for SPFS measurement, SPFS measurement method using sensor chip for SPFS measurement, and SPFS measurement device equipped with sensor chip for SPFS measurement
[Problem] To provide a sensor chip for SPFS measurement, by which, irrespective of environmental conditions, fluctuations are low in characteristics such as signal, noise, or detection sensitivity, quantitative property can be ensured, and a highly precise and accurate SPFS measurement can be carried out. [Solution] A sensor chip for SPFS measurement which has a dielectric member having been produced by carrying out injection molding of a resin, when viewing from the metal thin film-formed surface side of the dielectric member and taking as b the distance of the side end surface position of the resin inlet to the position on the metal thin film-formed surface that is farthest from the side end surface position of the resin inlet, the center of a ligand immobilization part is located in the area between the 3b/8 position and the 6b/8 position from the side end surface position of the resin inlet.
1. A sensor chip for SPFS (Surface Plasmon-field enhanced Fluorescence Spectroscopy) measurement which has a dielectric member constituting a prism, said dielectric member having been produced by carrying out injection molding of a resin, characterized in that said sensor chip for SPFS measurement has been arranged such that
a resin inlet is set on one side end surface of the dielectric member, said one side end surface intersecting with an excitation light incoming surface of said dielectric member, a metal thin film-formed surface of said dielectric member, and a reflected light outgoing surface through which a reflected light that comes in through said excitation light incoming surface and is reflected by the metal thin film-formed surface of said dielectric member goes out; and,
when viewing from the metal thin film-formed surface side of said dielectric member and taking as b the distance of the side end surface position of said resin inlet to the end surface position of the metal thin film-formed surface that does not have the resin inlet,
the center of a ligand immobilization part, which is a reaction part, is located on the metal thin film in the area between the 3b/8 position and the 6b/8 position from the side end surface position of said resin inlet;
on said sensor chip for SPFS measurement, positioning and fixing parts to carry out positioning and fixing of the sensor chip for SPFS measurement in an SPFS measurement device with which detection is carried out are provided;
said positioning and fixing parts have been formed in said dielectric member; and
wherein the positioning and fixing part is the resin inlet.
2. The sensor chip for SPFS measurement according to claim 1 , characterized in that, on the metal thin film-formed surface of said dielectric member, a channel into which a specimen can be introduced has been formed.
3. The sensor chip for SPFS measurement according to claim 2 , characterized by having been arranged such that,
in said channel, said ligand immobilization part has been formed, and
the direction of the flow in said channel is parallel to the directions of said excitation light incoming surface and said reflected light outgoing surface of said dielectric member.
4. The sensor chip for SPFS measurement according to claim 1 , characterized in that said positioning and fixing parts have been formed in a channel lid member equipped on said dielectric member.
5. An SPFS measurement device, characterized by being equipped with the sensor chip for SPFS measurement according to claim 1 ,
wherein the SPFS measurement device comprises a light source for applying an excitation light to the metal thin film through the excitation light incoming surface of the dielectric member constituting the sensor chip for SPFS measurement, and a light receiving sensor for receiving a fluorescence excited at a position of the ligand immobilization part on the metal thin film.
6. A SPFS (Surface Plasmon-field enhanced Fluorescence Spectroscopy) measurement method, characterized in that
a sensor chip for SPFS measurement which has a dielectric member constituting a prism, said dielectric member having been produced by carrying out injection molding of a resin,
wherein a resin inlet is set on one side end surface of the dielectric member, said one side end surface intersecting with an excitation light incoming surface of said dielectric member, a metal thin film-formed surface of said dielectric member, and a reflected light outgoing surface through which a reflected light that comes in through said excitation light incoming surface and is reflected by the metal thin film-formed surface of said dielectric member goes out,
is used;
a sample solution containing an analyte conjugated with a fluorescent substance is flowed on the metal thin film;
when viewing from the metal thin film-formed surface side of said dielectric member and taking as b the distance of the side end surface position of said resin inlet to the end surface position of the metal thin film-formed surface that does not have the resin inlet,
an excitation light is irradiated to at least a portion of a metal thin film through the excitation light incoming surface of said dielectric member, said metal thin film having been formed on said dielectric member, said portion being located on the metal thin film in the area between the 3b/8 position and the 6b/8 position from the side end surface position of said resin inlet;
fluorescence that is emitted by the fluorescent substance labeling the analyte immobilized by a ligand on said metal thin film is received to calculate the amount of the analyte for the SPFS measurement;
on said sensor chip for SPFS measurement, positioning and fixing parts to carry out positioning and fixing of the sensor chip for SPFS measurement in an SPFS measurement device with which detection is carried out are provided;
said positioning and fixing parts have been formed in said dielectric member; and
wherein the positioning and fixing part is the resin inlet.
7. The SPFS measurement method according to claim 6 , characterized in that, on the metal thin film-formed surface of said dielectric member, a channel into which a specimen can be introduced has been formed.
8. The SPFS measurement method according to claim 7 , characterized by having been arranged such that,
in said channel, a ligand immobilization part has been formed, and
the direction of the flow in said channel is parallel to the directions of said excitation light incoming surface and said reflected light outgoing surface of said dielectric member.
9. The SPFS measurement method according to claim 7 , characterized in that, on said sensor chip for SPFS measurement, positioning and fixing parts to carry out positioning and fixing of the sensor chip for SPFS measurement in an SPFS measurement device with which detection is carried out are provided.
10. The SPFS measurement method according to claim 8 , characterized in that, on said sensor chip for SPFS measurement, positioning and fixing parts to carry out positioning and fixing of the sensor chip for SPFS measurement in an SPFS measurement device with which detection is carried out are provided.
11. The SPFS measurement method according to claim 6 , characterized in that said positioning and fixing parts have been formed in a channel lid member equipped on said dielectric member.