IP Library Granted Patent US 9,810,600
Granted Patent B2
US 9,810,600 · App. 14/369,960 · Granted Nov 7, 2017

Method for detecting a leak on a non-rigid test specimen

Inventors: Daniel Wetzig (Köln, DE); Silvio Decker (Köln, DE)
Assignee: Infinicon GMBH
G01M3/36G01M3/3218G01M3/3281G01M3/38G01M3/40
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Quick Facts
Patent No.
US 9,810,600
App. No.
14/369,960
Granted
Nov 7, 2017
Kind
B2
Abstract

The invention relates to a simplified method for detecting leaks on a non-rigid test specimen, comprising the steps of: introducing the test specimen into a film chamber, lowering the pressure in the film chamber outside of said test specimen, and detecting a leak in the test specimen on the basis of a spatial change in the film of said film chamber.

Claims (12)

1. A method for detecting leaks on a non-rigid test specimen, comprising the steps of:

introducing the test specimen into a film chamber,

lowering the pressure in the film chamber outside of said test specimen, and

detecting a leak in the test specimen on the basis of a spatial change in a film of said film chamber; and

wherein the pressure in the film chamber is reduced to a pressure that is lower than the pressure in the test specimen by at least 500 mbar and preferably by at least 950 mbar.

2. The method of claim 1 , wherein, after the introduction of the test specimen, the closed film chamber shows a leakage rate during detection that is at least as high or at least twice as high as a leakage rate of the test specimen.

3. The method of claim 1 , wherein the spatial change in the film is measured by laser-optical measurement of a position of the film surface.

4. The method of claim 3 , wherein the laser-optical measurement is performed by measuring the change in deflection of a laser directed onto the film surface.

5. The method of claim 1 , wherein the spatial change in the film is detected by measuring the capacitance change of a metalized film surface.

6. The method of claim 1 , wherein the spatial change in the film is detected by means of a device that indicates contact or the absence of contact with the film surface.

7. The method of claim 1 , wherein the leakage rate of a gas escaping through the leak in the test specimen is calculated in dependence on the measured spatial change in the film.

8. The method of claim 1 , wherein the reduction of the pressure in the film chamber is performed while maintaining the atmospheric pressure in the test specimen.

Assignments (1)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jun 30, 2014
From: WETZIG, DANIEL; DECKER, SILVIO
To: INFICON GMBH
Reel/Frame 033214/0351 →
Priority Claims (1)
DE 10 2012 200 063 · Jan 3, 2012 · national
Continuity (1)
Related Publication 20140326051A1 · Nov 6, 2014