Multi-focal structured illumination microscopy systems and methods
View Patent ↗A multi-focal selective illumination microscopy (SIM) system for generating multi-focal patterns of a sample is disclosed. The multi-focal SIM system performs a focusing, scaling and summing operation on each multi-focal pattern in a sequence of multi-focal patterns that completely scan the sample to produce a high resolution composite image.
1. A microscopy system for multi-focal structured illumination microscopy comprising:
a light source for transmitting a single light beam;
a beam splitter for splitting the single light beam into a plurality of light beams forming a multi-focal pattern;
a scanner for scanning the plurality of light beams that forms the multi-focal pattern onto a sample such that the sample generates a plurality of fluorescent emissions with each multi-focal pattern;
a focusing component defining an aperture configured to block out-of-focus fluorescence emissions of the plurality of fluorescent emissions for each multi-focal pattern and allowing through in-focus fluorescent emissions to pass through the aperture;
a scaling component for scaling down the plurality of in-focus fluorescent emissions for each multi-focal pattern, wherein each of the plurality of in-focus fluorescent emissions defines a respective geometric center, and wherein scaling down the plurality of in-focus fluorescent emissions causes each of the in-focus fluorescent emissions to locally contract by a predetermined factor relative to each other such that the distance between each respective geometric center remains the same;
a detector for detecting the plurality of scaled in-focus fluorescent emissions that results from each of the multi-focal patterns; and
a processor in operative communication with the detector for summing each of the plurality of scaled in-focus fluorescent emissions detected by the detector to produce a plurality of summed, scaled in-focus fluorescent emissions that form a composite image of the plurality of summed, scaled in-focus fluorescent emissions.
2. The microscopy system of claim 1 , wherein the beam splitter is a micro-lens array.
3. The microscopy system of claim 1 , wherein the focusing component is a pinhole array.
4. The microscopy system of claim 1 , wherein each multi-focal pattern defines a plurality of respective focal points for each of the plurality of in-focus fluorescent emissions, wherein the scaling component scales the plurality of focal points in a local contraction in which each of the plurality of focal points in the multi-focal pattern maintains the same proportional distance from the other plurality of focal points of the multi-focal pattern as the plurality of fluorescent emissions contract by a predetermined factor.
5. The microscopy system of claim 1 ,
wherein the processor deconvolves the composite image.
6. The microscopy system of claim 1 , further comprising:
a dichroic mirror for allowing the plurality of light beams to pass through in one direction and redirecting the plurality of fluorescent emissions from the opposite direction.
7. The microscopy system of claim 1 , further comprising:
a first lens for imaging the plurality of light beams through a tube lens and an objective lens to illuminate the sample.
8. The microscopy system of claim 1 , wherein the plurality of light beams has a wavelength between 350 nm to 1200 nm.
9. The microscopy system of claim 1 , wherein the plurality of fluorescent emissions has a wavelength between 350 nm to 1200 nm.
10. The microscopy system of claim 1 , further comprising:
a detector for detecting the plurality of scaled in-focus fluorescent emissions.
11. The microscopy system of claim 1 , wherein the scanner re-scans the scaled, in-focus fluorescent emissions to the detector.