IP Library Granted Patent US 9,079,026
Granted Patent B2
US 9,079,026 · App. 14/386,626 · Granted Jul 14, 2015

Particle beam scanning irradiation system

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Quick Facts
Patent No.
US 9,079,026
App. No.
14/386,626
Granted
Jul 14, 2015
Kind
B2
Abstract

A particle beam scanning irradiation method includes the steps of calculating a planned irradiating particle count of a particle beam for each of irradiation spots, on the basis of a relative amount of particle beam irradiation and a prescription particle-beam dose determined from a particle-beam therapy plan; simulating an irradiation process of the particle beam at each irradiation spot, on the basis of the planned irradiating particle count and a beam current waveform of the particle beam, and calculating a particle count of the particle beam irradiating the diseased portion during a scan shift of the particle beam; correcting the planned irradiating particle count for each irradiation spot by using the irradiating particle count during the scan shift; converting the corrected planned-irradiation particle count into a count value used in a dose monitor; and irradiating the irradiation spot with the particle beam, on the basis of the converted count value.

Claims (13)

1. A particle beam scanning irradiation system comprising:

a computer that calculates a planned irradiating particle count of a particle beam for each of a plurality of irradiation spots, on the basis of a particle-beam therapy plan; and

a particle beam irradiation device that irradiates a diseased portion with the particle beam, wherein

the computer simulates an irradiation process of the particle beam at each irradiation spot, on the basis of the planned irradiating particle count and a beam current waveform of the particle beam, and executes

a first step of calculating a particle count of the particle beam irradiating the diseased portion during a scan shift of the particle beam;

a second step of correcting the planned irradiating particle count for each irradiation spot by using the irradiating particle count during the scan shift, wherein the second step includes calculations of subtracting half the irradiating particle count during the scan shift from a planned irradiating particle count for an irradiation spot before the scan shift and from a planned irradiating particle count for an irradiation spot after the scan shift; and

a third step of converting the corrected planned-irradiating particle count into a count value used in a dose monitor, and

the particle beam irradiation device irradiates the diseased portion with the particle beam, on the basis of the count value converted in the third step.

2. The particle beam scanning irradiation system of claim 1 , further including a fourth step of smoothing the particle beam current waveform to use the smoothed beam current waveform in the second step.

3. The particle beam scanning irradiation system of claim 1 , further including a fifth step of setting, on the basis of the particle beam current waveform, a magnitude of the beam current so that the planned irradiating particle count for the irradiation spot before the scan shift and the planned irradiating particle count for the irradiation spot after the scan shift have always values larger than half the irradiating particle count during the scan shift.

4. The particle beam scanning irradiation system of claim 1 , further including a sixth step of calculating, when the particle beam moves with a blank shift, a distance between an irradiation spot before the blank shift and an irradiation spot after the blank from a shift path between the irradiation spots.

5. The particle beam scanning irradiation system of claim 4 , further including a seventh step of subtracting one-nth of an irradiating particle count during the blank shift, from an irradiating particle count, for each irradiation spot being along the blank shift path,

by comparing the blank shift distance calculated in the sixth step with the scan shift distance and by determining a number (n) of blank spots among the blank shift distance.

Assignments (3)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jul 11, 2024
From: HITACHI, LTD.
To: HITACHI HIGH-TECH CORPORATION
Reel/Frame 068292/0514 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Dec 20, 2018
From: MITSUBISHI ELECTRIC CORPORATION
To: HITACHI, LTD.
Reel/Frame 047823/0172 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Sep 19, 2014
From: PU, YUEHU; IKEDA, MASAHIRO; HONDA, TAIZO
To: MITSUBISHI ELECTRIC CORPORATION
Reel/Frame 033780/0556 →