IP Library Granted Patent US 9,899,616
Granted Patent B2
US 9,899,616 · App. 14/390,692 · Granted Feb 20, 2018

Organic field effect transistor and method for producing the same

Inventors: Bjoern Luessem (Kent, OH); Alexander Zakhidov (Austin, TX); Hans Kleeman (Dresden, DE); Karl Leo (Dresden, DE)
Assignee: NOVALED GMBH
H01L51/0562B82Y10/00H01L51/002H01L51/0002H01L51/0021H01L51/105H01L51/001H01L51/0046H01L51/0059H01L51/102
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Quick Facts
Patent No.
US 9,899,616
App. No.
14/390,692
Granted
Feb 20, 2018
Kind
B2
Abstract

The disclosure relates to organic field effect transistors, and methods for producing organic field effect transistors. The organic field effect transistors may include a first electrode, and a second electrode, the electrodes providing a source electrode and a drain electrode, an intrinsic organic semiconducting layer in electrical contact with the first and second electrode, a gate electrode, a gate insulator provided between the gate electrode and the intrinsic organic semiconducting layer, and a doped organic semiconducting layer including an organic matrix material and an organic dopant.

Claims (26)

1. An organic field effect transistor, comprising:

a first electrode and a second electrode, the first and second electrodes providing a source electrode and a drain electrode,

an intrinsic organic semiconducting layer in electrical contact with the first electrode and the second electrode,

a gate electrode,

a gate insulator arranged between the gate electrode and the intrinsic organic semiconducting layer, and

a doped organic semiconducting layer comprising a first organic matrix material and a first organic dopant, wherein the first organic dopant is a first electrical dopant, wherein the doped organic semiconducting layer is arranged between the gate insulator and the intrinsic organic semiconducting layer,

wherein

the doped organic semiconducting layer comprises a charge carrier channel arranged between the first electrode and the second electrode,

an injection layer is arranged adjacent to at least one of the first electrode and the second electrode, and

the injection layer comprises a second organic matrix material and a second dopant, wherein the second dopant is a second electrical dopant, and wherein the second dopant is of a type that is opposite the first dopant of the doped organic semiconducting layer.

2. The transistor according to claim 1 , wherein the intrinsic organic semiconducting layer and the doped organic semiconducting layer comprise the first organic matrix material.

3. The transistor according to claim 1 , wherein a mixed layer comprising a hole transport material and an electron transport material is in electrical contact with at least one of the first electrode and the second electrode.

4. The transistor according to claim 1 , wherein the thickness of the doped organic semiconducting layer is between 1 nm and 20 nm.

5. The transistor according to claim 1 , wherein the intrinsic organic semiconducting layer and the doped organic semiconducting layer are in direct contact with each other.

6. The transistor according to claim 1 , wherein at least one electrode selected from the group consisting of the following electrodes is made of a metallic material: the first electrode, the second electrode, and the gate electrode.

7. The transistor according to claim 1 , wherein the doped organic semiconducting layer has a dopant concentration of up to 4 wt %.

8. The transistor according to claim 1 , wherein at least one of the first electrode, the second electrode and the injection layer is configured to inject minority charge carriers into the charge carrier channel.

9. The transistor according to claim 8 , wherein the doped organic semiconducting layer is configured to form a minority charge carrier channel through which minority charge carriers can move between the first electrode and the second electrode.

10. A method for producing an organic field effect transistor, wherein the method comprises the following steps:

providing a substrate,

coating the substrate with a first electrode material to form a gate electrode,

depositing an insulating material to form an insulating layer,

co-evaporating a first organic matrix material and a first organic dopant material to form a doped organic semiconducting layer, wherein the first organic dopant material is an electrical dopant,

depositing an organic material to form an intrinsic organic semiconducting material,

depositing an injection material comprising a second organic matrix material and a second dopant material to form a doped injection layer, wherein the second dopant material is an electrical dopant, and

depositing a second electrode material to form a first electrode and a second electrode that are in electrical contact with one of the injection layer and the intrinsic organic semiconducting layer, wherein the second dopant material is of a type that is opposite the first dopant material of the doped organic semiconducting layer.

Assignments (4)
CHANGE OF NAME Recorded Oct 11, 2016
From: NOVALED AG
To: NOVALED GMBH
Reel/Frame 040315/0818 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Oct 11, 2016
From: TECHNISCHE UNIVERSITÄT DRESDEN
To: NOVALED GMBH
Reel/Frame 039988/0210 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded May 29, 2015
From: LUESSEM, BJOERN; ZAKHIDOV, ALEXANDER; KLEEMANN, HANS; LEO, KARL
To: TECHNISCHE UNIVERSITAT DRESDEN
Reel/Frame 035746/0517 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded May 29, 2015
From: TECHNISCHE UNIVERSITAT DRESDEN
To: NOVALED AG
Reel/Frame 035746/0541 →
Priority Claims (2)
EP 12163472 · Apr 5, 2012 · regional
EP 12166029 · Apr 27, 2012 · regional
Continuity (1)
Related Publication 20150270503A1 · Sep 24, 2015