IP Library Granted Patent US 10,451,470
Granted Patent B2
US 10,451,470 · App. 14/397,582 · Granted Oct 22, 2019

Flow rate measurement device

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Quick Facts
Patent No.
US 10,451,470
App. No.
14/397,582
Granted
Oct 22, 2019
Kind
B2
Abstract

A flow rate measurement device of the present invention includes a flow rate signal detection unit for detecting a flow rate signal of a fluid to be measured flowing through flow path, flow rate calculation unit for calculating a flow rate from the flow rate signal detected by the flow rate signal detection unit, and oscillation circuit for generating a reference clock. Furthermore, the flow rate measurement device includes temperature calculation unit for calculating a temperature from a frequency change resulting from a temperature change of oscillation circuit, and flow rate correction unit for correcting the flow rate calculated by the flow rate calculation unit by obtaining an offset flow rate at a desired temperature based on the temperature calculated by temperature calculation unit. Thus, accuracy of flow rate measurement can be improved.

Claims (19)

1. A flow rate measurement device comprising:

a flow rate signal detection unit for detecting a flow rate signal of a fluid to be measured flowing through a flow path;

a flow rate calculation unit for calculating a flow rate from the flow rate signal detected by the flow rate signal detection unit, the flow rate calculation unit having stored therein an offset flow rate determined by measuring flow rates at zero fluid flow;

an oscillation circuit for generating a reference clock;

a temperature calculation unit for calculating a temperature from a frequency change resulting from a temperature change of the oscillation circuit; and

a flow rate correction unit for correcting the flow rate calculated by the flow rate calculation unit by obtaining a corrected offset flow rate at a desired temperature, based on the temperature calculated by the temperature calculation unit using a zero point flow reference voltage at two different temperatures spaced apart about a reference temperature and a corresponding reference clock signal of the oscillation circuit, and correcting the flow rate to reflect a temperature offset to the offset flow rate due to a temperature change by applying the corrected offset flow rate to the offset flow rate,

wherein the flow rate correction unit stores predetermined relations between temperatures and offset flow rates with respect to two or more temperatures at two or more distinct time points.

2. A flow rate measurement device comprising:

a pair of oscillators provided in a flow path through which a fluid to be measured flows, the oscillators transmitting and receiving an ultrasonic wave signal;

a transmitting unit for driving a first oscillator of the pair of oscillators;

a receiving unit for receiving the ultrasonic wave signal from a second oscillator of the pair of oscillators;

a time measurement unit for measuring propagation time between transmission and reception of the ultrasonic wave signal;

a flow rate calculation unit which measures a flow velocity of the fluid to be measured from the propagation time measured by the time measurement unit, and calculates a flow rate from the flow velocity, the flow rate calculation unit having stored therein an offset flow rate determined by measuring flow rates at zero fluid flow;

an oscillation circuit for generating a reference clock for measuring the propagation time;

a temperature calculation unit for calculating a temperature from a frequency change resulting from a temperature change of the oscillation circuit; and

a flow rate correction unit for correcting the flow rate calculated by the flow rate calculation unit by obtaining a corrected offset flow rate at a desired temperature based on the temperature calculated by the temperature calculation unit using a zero point flow reference voltage at two different temperatures spaced apart about a reference temperature and a corresponding reference clock signal of the oscillation circuit, and correcting the flow rate to reflect a temperature offset to the offset flow rate due to temperature change by applying the corrected offset flow rate to the offset flow rate,

wherein the flow rate correction unit stores predetermined relations between temperatures and offset flow rates with respect to two or more temperatures at two or more distinct time points.

3. The flow rate measurement device according to claim 1 , wherein the flow rate correction unit includes a correction learning unit for learning a correction value of the offset flow rate specified by the propagation time measured by a time measurement unit and the temperature calculated by the temperature calculation unit.

4. The flow rate measurement device according to claim 2 , wherein the flow rate correction unit includes a correction learning unit for learning a correction value of the offset flow rate specified by the propagation time measured by the time measurement unit and the temperature calculated by the temperature calculation unit.

Assignments (2)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Feb 18, 2015
From: PANASONIC CORPORATION
To: PANASONIC INTELLECTUAL PROPERTY MANAGEMENT CO., LTD.
Reel/Frame 035045/0413 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Nov 27, 2014
From: SHIBA, FUMIKAZU; NAKABAYASHI, YUJI; TAKEMURA, KOUICHI; FUJII, YUJI
To: PANASONIC CORPORATION
Reel/Frame 034275/0790 →