Covering method and organic EL element manufacturing method
View Patent ↗A covering method including: preparing a mixture containing insulative material and a solvent; applying the mixture over a defective portion; and covering the defective portion with the insulative material by causing the solvent to evaporate from the mixture. In the covering method, the solvent has a boiling point no lower than 178 degrees Celsius, and in the mixture, a weight ratio percentage of the insulative material to the solvent is no lower than 10%. Thus, the defective portion, which may result in a dark spot, can be efficiently covered with insulative material while ensuring that a non-light-emission area that is formed accordingly has the smallest-necessary size and that sufficient insulation is achieved.
1. A covering method of covering a defective portion of a body having a layer structure with insulative material, the layer structure including a pixel electrode and a common electrode, the covering method comprising:
preparing a mixture containing the insulative material and a solvent, the insulative material being one of a monomer and an oligomer configured to undergo cross-linking;
applying the mixture over the defective portion, the defective portion being one of: a downward protrusion that is formed in an upper surface of the pixel electrode in a forming process of the pixel electrode; and a combination of the downward protrusion in the upper surface of the pixel electrode and a plurality of downward protrusions each formed in a different functional layer of the layer structure due to a presence of the downward protrusion in the upper surface of the pixel electrode;
covering the defective portion with the insulative material by causing the solvent to evaporate from the mixture; and
heating the insulative material after causing the solvent to evaporate from the mixture to cause the insulative material to undergo the cross-linking, wherein
the solvent has a boiling point no lower than 178 degrees Celsius, and in the mixture, a weight ratio percentage of the insulative material to the solvent is no lower than 10%.
2. The covering method of claim 1 , wherein
the boiling point of the solvent is no higher than 210 degrees Celsius, and
the weight ratio percentage of the insulative material to the solvent is no higher than 40%.
3. The covering method of claim 2 , wherein
given x denoting the weight ratio percentage of the insulative material to the solvent and y denoting the boiling point of the solvent in centigrade,
x and y satisfy 10≦x≦20, 178≦y≦210, y≦3.2x+146, and y≧0.97x+20.5 in the mixture.
4. The covering method of claim 1 , wherein
in the preparing of the mixture, the mixture is loaded to a container having an opening, and
in the applying of the mixture, after inserting an application member having a bar shape into the container through the opening, a tip portion of the application member is put in contact with the defective portion to apply the mixture with respect to the defective portion, the mixture adhering to the tip portion of the application member when the application member is inserted into the container through the opening.
5. The covering method of claim 1 , wherein
the body having the layer structure is an organic EL element including:
a base substrate;
the pixel electrode disposed on the base substrate;
two or more functional layers disposed on or above the pixel electrode; and
the common electrode disposed on or above the functional layers.
6. The covering method of claim 1 , further comprising:
forming a bank on a functional layer of the layer structure, the bank defining an opening in which an organic light-emission layer is to be formed, the heating being performed during the forming of the bank.
7. A manufacturing method of manufacturing an organic EL element that includes: a base substrate; a pixel electrode disposed on the base substrate; two or more functional layers disposed on or above the pixel electrode; and a common electrode disposed on or above the functional layers, the manufacturing method comprising:
forming a pixel electrode;
detecting a defective portion, the detecting performed at any point after the forming of the pixel electrode and before the common electrode is formed, the defective portion being one of: a downward protrusion that is formed in an upper surface of the pixel electrode in the forming of the pixel electrode; and a combination of the downward protrusion in the upper surface of the pixel electrode and a plurality of downward protrusions each formed in a different one of the functional layers due to a presence of the downward protrusion in the upper surface of the pixel electrode; and
covering the defective portion detected through the detecting with insulative material, the covering performed before forming one of the functional layers or before forming the common electrode, wherein
the covering includes:
preparing a mixture containing the insulative material and a solvent, the insulative material being one of a monomer and an oligomer configured to undergo cross-linking;
applying the mixture over the defective portion;
covering the defective portion with the insulative material by causing the solvent to evaporate from the mixture; and
heating the insulative material after causing the solvent to evaporate from the mixture to cause the insulative material to undergo the cross-linking, and
the solvent has a boiling point no lower than 178 degrees Celsius, and in the mixture, a weight ratio percentage of the insulative material to the solvent is no lower than 10%.
8. The manufacturing method of claim 7 , wherein
the defective portion is located on the pixel electrode.
9. The manufacturing method of claim 7 , further comprising:
forming a bank on one of the functional layers, the bank defining an opening in which an organic light-emission layer is to be formed, the heating being performed during the forming of the bank.