IP Library Patent Application 14411382
Patent Application
App. No. 14/411,382

HIGH CONDUCTIVITY HIGH FREQUENCY VIA FOR ELECTRONIC SYSTEMS

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Quick Facts
Patent No.
US None
App. No.
14/411,382
Abstract

A through silicon via is described that has conductivity at high frequencies. In one example, the via includes a channel through at least a portion of a silicon die. A first conductive layer has a first electrical conductivity. A second conductive layer covers the outer surface of the first conductive layer and has a second electrical conductivity higher than the first electrical conductivity.

Claims (32)

1 - 28 . (canceled)

29 . In a silicon die, a through silicon via to connect. a first metal layer to a second metal layer, the through silicon via comprising:

a channel through at least a portion of the silicon die;

a first conductive layer extending through the via, the first conductive layer having an outer surface and a first electrical conductivity; and

a second conductive layer covering the outer surface of the first conductive layer, the second conductive layer having a second electrical conductivity higher than the first electrical conductivity.

30 . The via of claim 29 , further comprising a metal barrier layer surrounding the first and second layer within the via.

31 . The via of claim 29 , further comprising a dielectric layer surrounding the second conductive layer to isolate the first and second conductive via from the silicon substrate.

32 . The via of claim 29 , wherein the first conductive layer has an inner surface, the via further comprising a third conductive layer covering the inner surface, the third conductive layer having the second electrical conductivity.

33 . The via of claim 32 , further comprising a dielectric region, wherein the inner surface of the first conductive layer surrounds the dielectric region.

34 . The via of claim 33 , wherein the via is cylindrical and the first conductive layer is cylindrical and wherein the center of the via is filled with dielectric.

33 . The via of claim 33 , wherein the via is cylindrical and the first conductive layer is cylindrical and wherein the center of the via is filled with carbon nanotubes.

36 . The via of claim 33 , wherein the via is cylindrical and the first conductive layer is cylindrical and wherein the center of the via is filled with a plurality of cylindrical tubes having the first electrical conductivity.

36 . The via of claim 36 , wherein the tubes of the plurality of cylindrical tubes each have a higher conductivity skin layer on an outer surface.

38 . The via of claim 36 , wherein the tubes of the plurality of cylindrical tubes each have a higher conductivity skin layer on an inner surface.

39 . The via of claim 36 , wherein the tubes of the plurality of cylindrical tubes are concentric and are isolated from each other each by one of a plurality of concentric dielectric layers.

40 . The via of claim 29 , wherein the first conductive layer is copper and the second conductive layer is silver.

29 . The via of claim 29 , wherein the first conductive layer is copper and the second conductive layer is graphene.

42 . A method comprising:

creating a via through a silicon substrate;

depositing a dielectric on a surface of the via;

depositing a second conductive layer having a second electrical conductivity on the dielectric surface;

depositing a first conductive layer having a first lower electrical conductivity within the via surrounded by and adjacent to the second conductive layer; and

applying metallization to the via to form electrical connections to the via.

43 . The method of claim 42 , wherein depositing a second conductive layer comprises filling the via.

43 . The method of claim 43 , further comprising creating a cylindrical opening in the center of the via and filling the opening with a dielectric.

45 . The method of claim 42 , wherein depositing a first conductive layer comprises depositing a plurality of concentric cylindrical layers with a concentric cylindrical layer having the second electrical conductivity between each concentric cylindrical layer of the first conductive layer.

46 . A computer system comprising:

a user interface to receive input from a user;

a display to display results to the user;

a processor in a package to receive the user inputs and generates results to provide to the display, the processor package having a plurality of through silicon vias, at least one of the through silicon vias having a channel through a silicon substrate, a first conductive layer extending through the via, the first conductive layer having an outer surface and a first electrical conductivity, and a second conductive layer covering the outer surface of the first conductive layer, the second conductive layer having a second electrical conductivity higher than the first. electrical conductivity.

46 . The system of claim 46 , wherein the via further comprises a plurality of additional conductive layers of the first electrical conductivity formed concentrically within the via and each separated by an additional conductive layer of the second electrical conductivity.

47 . The system of claim 47 , wherein the plurality of additional conductive layers are further separated each by an additional dielectric layer.

Assignments (1)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jun 28, 2021
From: INTEL IP CORPORATION
To: INTEL CORPORATION
Reel/Frame 056701/0807 →