IP Library Granted Patent US 9,406,835
Granted Patent B2
US 9,406,835 · App. 14/411,926 · Granted Aug 2, 2016

Light emitting diode with light emitting layer containing nitrogen and phosphorus

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Quick Facts
Patent No.
US 9,406,835
App. No.
14/411,926
Granted
Aug 2, 2016
Kind
B2
Abstract

Embodiments of the invention include an n-type region, a p-type region, and a light emitting layer disposed between the n-type region and the p-type region. The light emitting layer is a III-V material comprising nitrogen and phosphorus. The device also includes a graded region disposed between the light emitting layer and one of the p-type region and the n-type region. The composition of materials in the graded region is graded.

Claims (45)

1. A device comprising:

an n-type region;

a p-type region;

a light emitting layer, wherein the light emitting layer is disposed between the n-type region and the p-type region, wherein the light emitting layer is a III-V material comprising nitrogen and phosphorus;

a first graded region disposed between the light emitting layer and the p-type region, wherein a composition in the first graded region is graded; and

a second graded region disposed between the light emitting layer and the n-type region, wherein a composition in the second graded region is graded.

2. The device of claim 1 wherein the light emitting layer is InGaN x P 1-x , wherein 0<X≦0.03.

3. The device of claim 1 wherein the light emitting layer has a composition that when forward biased emits light having a peak wavelength in a range of green to red.

4. The device of claim 1 wherein the composition in the first graded region is graded from GaP in a portion of the first graded region closest to the p-type region to AlGaP in a portion of the first graded region closest to the light emitting layer.

5. The device of claim 1 wherein the composition in the second graded region is graded from a composition of GaP in a portion of the second graded region closest to the n-type region to a composition of AlGaP in a portion of the second graded region closest to the light emitting layer.

6. The device of claim 1 wherein the n-type region and the p-type region are GaP.

7. The device of claim 1 wherein the n-type region, light emitting layer, and first and second graded regions are grown over a p-type GaP substrate.

8. A device comprising:

an n-type region;

a p-type region;

a light emitting layer, wherein the light emitting layer is disposed between the n-type region and the p-type region, wherein the light emitting layer is a III-V material comprising nitrogen and phosphorus; and

a graded region disposed between the light emitting layer and one of the p-type region and the n-type region, wherein a composition in the graded region is graded;

wherein the graded region comprises a portion of constant composition disposed between two portions of graded composition.

9. A device comprising:

an n-type region;

a p-type region;

a light emitting layer, wherein the light emitting layer is disposed between the n-type region and the p-type region, wherein the light emitting layer is a III-V material comprising nitrogen and phosphorus; and

a graded region disposed between the light emitting layer and one of the p-type region and the n-type region, wherein a composition in the graded region is graded;

wherein:

the graded region is disposed between the p-type region and the light emitting layer;

the graded region comprises:

a first portion of constant composition disposed in direct contact with the light emitting layer; and

a second portion of graded composition disposed in direct contact with the p-type region; and

the second portion is AlGaP and a composition of aluminum is graded.

10. The device of claim 9 wherein the light emitting layer is between 2 nm and 10 nm thick.

11. The device of claim 1 wherein:

the first graded region is Al x Ga 1-x P, wherein x is graded from 0 to 1; and

the second graded region is Al x Ga 1-x P, wherein x is graded from 1 to 0.

12. The device of claim 11 wherein the light emitting layer is between 10 nm and 100 nm thick.

13. The device of claim 1 wherein:

the first graded region is Al x Ga 1-x P;

0≦x≦1; and

the composition of Al is graded.

14. A method comprising:

growing a light emitting layer disposed between an n-type region and a p-type region, wherein the light emitting layer is a III-V material comprising nitrogen and phosphorus; and

growing a graded region disposed between the light emitting layer and one of the p-type region and the n-type region, wherein a composition in the graded region is graded;

wherein the graded region comprises a portion of constant composition disposed between two portions of graded composition.

15. The method of claim 14 wherein growing a graded region comprises varying a growth temperature to vary a composition in the graded region.

16. The method of claim 14 wherein growing a graded region comprises varying flow rates of precursor materials.

17. The method of claim 14 wherein growing a graded region comprises varying relative flow rates of different precursor materials.

Assignments (5)
RELEASE OF SECURITY INTEREST Recorded Jan 29, 2025
From: SOUND POINT AGENCY LLC
To: LUMILEDS LLC; LUMILEDS HOLDING B.V.
Reel/Frame 070046/0001 →
SECURITY INTEREST Recorded Jan 5, 2023
From: LUMILEDS LLC; LUMILEDS HOLDING B.V.
To: SOUND POINT AGENCY LLC
Reel/Frame 062299/0338 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Nov 9, 2017
From: KONINKLIJKE PHILIPS N.V.
To: LUMILEDS LLC
Reel/Frame 044416/0019 →
SECURITY INTEREST Recorded Jul 7, 2017
From: LUMILEDS LLC
To: DEUTSCHE BANK AG NEW YORK BRANCH, AS COLLATERAL AGENT
Reel/Frame 043108/0001 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Dec 30, 2014
From: TURCOTTE, STEPHANE
To: KONINKLIJKE PHILIPS N.V.
Reel/Frame 034597/0678 →