Production line monitoring device
View Patent ↗A production line monitoring device that identifies a cause of a production defect, reduces the amount of analysis data and computation, and performs real-time processing, is provided. The production line monitoring device includes a defect indication detection unit that detects an indication of a production defect of a production line, and a defect cause identification unit that identifies a cause of the production defect. The defect indication detection unit collects measurement information measured by an inspection apparatus for each reference that identifies a position on products, and detects an indication of the production defect from the change with time of the measurement information at the references. The defect cause identification unit performs stratified analysis based on production information related to the reference when the defect indication detection unit detects an indication of a production defect, and identifies a cause of a production defect from a result of the analysis.
1. A production line monitoring device comprising:
a defect indication detection unit that detects an indication of a production defect of a production line; and
a defect cause identification unit that identifies a cause of the production defect,
wherein the defect indication detection unit collects measurement information that is measured by an inspection apparatus for each reference that identifies a position on products, and detects an indication of the production defect from a change with time of the measurement information at the references, the defect indication detection unit detects the indication of the production defect when a first process capability index of one of the references calculated from the measurement information or an incidence of the production defect of the one of the references calculated from the measurement information is not within a first predetermined standard range, and
the defect cause identification unit performs stratified analysis based on production information that is related to the one of the references when the defect indication detection unit detects the indication of the production defect, and identifies a cause of the production defect when a second process capability index calculated from a result of the stratified analysis of the production information related to the one of the references or an incidence of the production information of the one of the references is not within a second predetermined standard range.
2. The production line monitoring device according to claim 1 ,
wherein the production information is at least one of information about facilities of the production line, information about a raw material to be supplied to the production line, information about an operator operating the production line, and information about a producing procedure of the production line.
3. The production line monitoring device according to claim 1 ,
wherein the production line is a substrate production line including a solder printer that performs printing on a substrate with solder paste, a component mounting machine that mounts a component on the substrate, and a reflow machine that solders the component mounted on the substrate, and
the inspection apparatus is provided in the substrate production line.