IP Library Granted Patent US 9,768,346
Granted Patent B2
US 9,768,346 · App. 14/437,433 · Granted Sep 19, 2017

Light-emitting device

Inventors: Dae Seob Han (Seoul, KR); Yong Tae Moon (Seoul, KR); Kwang Sun Baek (Seoul, KR); A Ra Cho (Seoul, KR)
Assignee: LG INNOTEK CO., LTD.
H01L33/06H01L33/04H01L33/24H01L33/32H01L33/325H01L2224/48091
View Patent ↗
Loading inventors, assignments & file history…
Monitor This Case
Get email alerts when status or documents change.
Order Certified Copies
Most orders are placed with the USPTO same day — all within 24 business hours.
Order via The Patent Place →
Pre-filled with this patent's details
Quick Facts
Patent No.
US 9,768,346
App. No.
14/437,433
Granted
Sep 19, 2017
Kind
B2
Abstract

A light-emitting device and a lighting system includes a first conductivity type semiconductor layer, a gallium nitride-based super lattice layer on the first conductivity type semiconductor layer, an active layer, on the gallium nitride-based super lattice layer, a second conductivity type gallium nitride-based layer on the active layer, and a second conductivity type semiconductor layer, on the second conductivity type gallium nitride-based layer. The second conductivity type gallium nitride-based layer can include a second conductivity type Al x Ga (1−x) N/Al y Ga (1−y) N, such as Al x Ga (1−x) N/Al y Ga (1−y) N, on the active layer.

Claims (27)

1. A light-emitting device comprising:

a first conductivity type semiconductor layer;

a gallium nitride-based superlattice layer on the first conductivity type semiconductor layer;

an active layer on the gallium nitride-based superlattice layer;

a second conductivity type gallium nitride-based layer on the active layer; and

a second conductivity type semiconductor layer on the second conductivity type gallium nitride-based layer,

wherein the second conductivity type gallium nitride-based layer comprises:

a second conductivity type Al x Ga (1−x) N/Al y Ga (1−y) N superlattice layer (where, 0<x<1, 0<y<1) on the active layer,

wherein a concentration (x) of Al in Al x Ga (1−x) N is higher than a concentration (y) of Al in Al y Ga (1−y) N in the second conductivity type Al x Ga (1−x) N/Al y Ga (1−y) N superlattice layer,

wherein the second conductivity type Al x Ga (1−x) N/Al y Ga (1−y) N superlattice layer has a plurality of cycles,

wherein the gallium nitride-based superlattice layer has a bandgap energy level which varies from the first conductivity type semiconductor layer toward the active layer, and

wherein the gallium nitride-based superlattice layer comprises:

a first-group gallium nitride-based superlattice layer having a first bandgap energy; and

a second-group gallium nitride-based superlattice layer having a second bandgap energy lower than the first bandgap energy on the first-group gallium nitride-based superlattice layer; and

a third-group gallium nitride-based superlattice layer having a third bandgap energy on a second-group gallium nitride-based superlattice layer,

wherein the second conductivity type Al x Ga (1−x) N/Al y Ga (1−y) N superlattice layer comprises a first second conductivity type Al x1 Ga (1−x1) N/Al y Ga (1−y) N superlattice layer, a second conductivity type Al x2 Ga (1−x2) N/Al y Ga (1−y) N superlattice layer, a third second conductivity type Al x3 Ga (1−x3) N/Al y Ga (1−y) N superlattice layer, and a fourth second conductivity type Al x4 Ga (1−x4) N/Al y Ga (1−y) N superlattice layer that are sequentially laminated,

wherein a concentration (x1) of Al in Al x1 Ga (1−x1) N of the first second conductivity type Al x Ga (1−x) N/Al y Ga (1−y) N superlattice layer, a concentration (x2) of Al in Al x2 Ga (1−x2) N of the second conductivity type Al x2 Ga (1−x2) N/Al y Ga (1−y) N superlattice layer, a concentration (x3) of Al in Al x3 Ga (1−x3) N of the third second conductivity type Al x3 Ga (1−x3) N/Al y Ga (1−y) N superlattice layer, and a concentration (x4) of Al in Al x4 Ga (1−x4) N of the fourth second conductivity type Al x4 Ga (1−x4) N/Al y Ga (1−y) N superlattice layer are different, and

wherein the first-group gallium nitride-based superlattice layer has a thickness less than a thickness of the second-group gallium nitride-based superlattice layer.

2. The light-emitting device of claim 1 , wherein the concentration (x) of the Al in the Al x Ga (1−x) N is varies from the active layer toward the second conductivity type semiconductor layer, and the concentration (y) of the Al in the Al y Ga (1−y) N is constant.

3. The light-emitting device of claim 1 , wherein the concentration (x1) of Al in Al x1 Ga (1−x1) N of the first second conductivity type Al x1 Ga (1−x1) N/Al y Ga (1−y) N superlattice layer is lower than the concentration (x2) of Al in Al x2 Ga (1−x2) N of the second conductivity type Al x2 Ga (1−x2) N/Al y Ga (1−y) N superlattice layer, and

wherein the concentration (x4) of Al in Al x4 Ga (1−x4) N of the fourth second conductivity type Al x4 Ga (1−x4 )N/Al y Ga (1−y) N superlattice layer is lower than the concentration (x3) of Al in Al x3 Ga (1−x3) N of the third second conductivity type Al x3 Ga (1−x3) N/Al y Ga (1−y) N superlattice layer.

4. The light-emitting device of claim 1 , wherein the second conductivity type gallium nitride-based layer comprises:

a second conductivity type In x Al y Ga (1−x−y) N layer (where, 0<x<1, 0<y<1) ( 127 ) having a second concentration of second conductivity type impurities on the active layer;

a second conductivity type GaN layer having a first concentration of second conductivity type impurities on the second conductivity type In x Al y Ga (1−x−y) N layer having the second concentration; and

the second conductivity type Al x Ga (1−x) N/Al y Ga (1−y) N superlattice layer on the second conductivity type GaN layer having the first concentration.

5. The light-emitting device of claim 4 , wherein the second conductivity type Al x Ga (1−x) N/Al y Ga (1−y) N superlattice layer is a second conductivity type Al x Ga (1−x) N/Al y Ga (1−y) N superlattice layer having a third concentration of second conductivity type impurities, and the first concentration is higher than the second concentration and the third concentration.

6. The light-emitting device of claim 1 , wherein the concentration (x) of the Al in the Al x Ga (1−x) N and the concentration (y) of the Al in the Al y Ga (1−y) N are constant.

Assignments (3)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Mar 14, 2025
From: SUZHOU LEKIN SEMICONDUCTOR CO., LTD.
To: BOE HC SEMITEK LIMITED(HENGQIN)
Reel/Frame 070521/0027 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded May 25, 2021
From: LG INNOTEK CO., LTD.
To: SUZHOU LEKIN SEMICONDUCTOR CO., LTD.
Reel/Frame 056366/0335 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Apr 22, 2015
From: HAN, DAE SEOB; MOON, YONG TAE; BAEK, KWANG SUN; CHO, A RA
To: LG INNOTEK CO., LTD.
Reel/Frame 035476/0331 →
Priority Claims (1)
KR 10-2012-0117081 · Oct 22, 2012 · national
Continuity (1)
Related Publication 20150287876A1 · Oct 8, 2015