Coating inspection method
View Patent ↗A reflectometry method and other methods for detecting discontinuities in a chemical vapor deposition (CVD) coating are disclosed. The method includes several steps. A thermoplastic vessel wall ( 710 ) is provided having an outside surface, an inside surface, and a CVD coating on at least one of the inside and outside surfaces. The vessel wall and the CVD coating have different indices of refraction. Electromagnetic energy ( 718 ) is impinged on multiple positions of the CVD coating under conditions effective to cause energy to reflect from the multiple positions of the CVD coating. The reflected energy is analyzed to determine whether the reflected energy includes at least one artifact of a discontinuity in the CVD coating.
1. A reflectometry method for detecting discontinuities in a chemical vapor deposition (CVD) coating comprising:
providing a thermoplastic vessel wall having an outside surface, an inside surface, and a CVD coating on at least one of the inside and outside surfaces, the vessel wall and the CVD coating having different indices of refraction;
impinging electromagnetic energy on multiple positions of the CVD coating under conditions effective to cause energy to reflect from the multiple positions of the CVD coating;
analyzing the reflected energy to determine whether the reflected energy includes at least one artifact of a discontinuity in the CVD coating.
2. The method of claim 1 , in which the energy source provides energy within at least a portion of the wavelength range from 40 to 1100 nm.
3. The method of claim 1 , further comprising mapping the reflected energy to the multiple positions of the CVD coating.
4. The method of claim 3 , further comprising recording the map of the reflected energy.
5. The method of claim 4 , in which the map is recorded by a charge-coupled device image sensor configured for converting the recorded map to a data stream.
6. The method of claim 1 , in which the analyzing step is carried out by a computer processor programmed for analyzing the data stream to find at least one artifact representing a discrete area of the image of contrasting brightness relative to the background of the discrete area, representing a discontinuity.
7. The method of claim 6 , in which analyzing comprises determining the area of the discontinuity.
8. The method of claim 6 , in which the processor is configured to determine the aggregate area of all discontinuities detected in the CVD coating.
9. The method of claim 1 , in which the impinging energy is polychromatic.
10. The method of claim 1 , in which the reflected energy contains interference patterns resulting from its interaction with the CVD coating.
11. The method of claim 1 , in which the color of the reflected energy differs from the color of the impinging energy.
12. The method of claim 1 , in which the vessel wall is at least partially transparent.
13. The method of claim 12 , in which the vessel wall is positioned such that the impinging energy passes through the vessel wall to reach the CVD coating.
14. The method of claim 12 , in which the vessel wall is positioned such that the reflected energy passes through the vessel wall before the reflected energy is analyzed.
15. The method of claim 12 , in which the vessel wall is positioned such that the impinging energy impinges inwardly on the outside of the vessel wall and reflects from a CVD coating positioned on the inside of the vessel wall.