Super-resolution microscope and modulation optical element
View Patent ↗A super-resolution microscope includes a modulation optical element ( 10 ) that is disposed in an illumination optical system along a light path traveled by first illumination light and second illumination light and spatially modulates the second illumination light. In the modulation optical element ( 10 ), a plurality of optical substrates exhibiting anisotropy in a refractive index distribution are joined in a coplanar manner, and at least two of the optical substrates have a different refractive index with respect to a polarization direction of the second illumination light.
1. A super-resolution microscope for observing a sample including a molecule having at least two excited quantum states, the super-resolution microscope comprising:
an illumination optical system configured to collect first illumination light and second illumination light on the sample by partially spatially overlapping the lights to irradiate the sample, the first illumination light being for exciting the molecule from a stable state to a first quantum state and the second illumination light being for causing the molecule to transition further to another quantum state;
a scanning unit configured to scan the sample by displacing the sample relative to the first illumination light and the second illumination light;
a detection unit configured to detect a light response signal generated by the sample due to irradiation with the first illumination light and the second illumination light; and
a modulation optical element disposed in the illumination optical system along a light path traveled by the first illumination light and the second illumination light and configured to spatially modulate the second illumination light, wherein
in the modulation optical element, a plurality of optical substrates exhibiting anisotropy in a refractive index distribution are joined in a coplanar manner, each optical substrate includes a birefringent medium, and at least two of the optical substrates have a different refractive index with respect to a polarization direction of the second illumination light, and wherein the optical substrates are quartz substrates, and at least two of the quartz substrates are joined so that directions of phase advancing axes thereof intersect.
2. The super-resolution microscope according to claim 1 , wherein
the first illumination light and the second illumination light are incident on the modulation optical element coaxially.
3. The super-resolution microscope according to claim 1 , wherein
the optical substrates are joined concentrically.
4. The super-resolution microscope according to claim 1 , wherein
the modulation optical element has a thickness functioning as a half-wave plate for the second illumination light.
5. The super-resolution microscope according to claim 1 , wherein
the modulation optical element modulates linearly-polarized second illumination light to be linearly-polarized light such that an oscillation axis of an electric field is in the same direction and an orientation of the electric field is reversed.
6. The super-resolution microscope according to claim 1 , wherein
the modulation optical element has a thickness functioning as a full-wave plate for the first illumination light.
7. The super-resolution microscope according to claim 1 , wherein
the modulation optical element includes an antireflection film to prevent reflection of the second illumination light.
8. The super-resolution microscope according to claim 1 , further comprising
a quarter-wave plate for the second illumination light disposed at an incident side of the modulation optical element.
9. The super-resolution microscope according to claim 8 , wherein
the quarter-wave plate is rotationally adjustable around an optical axis of the illumination optical system.
10. A super-resolution microscope for observing a sample including a molecule having at least two excited quantum states, the super-resolution microscope comprising:
an illumination optical system configured to collect first illumination light and second illumination light on the sample by partially spatially overlapping the lights to irradiate the sample, the first illumination light being for exciting the molecule from a stable state to a first quantum state and the second illumination light being for causing the molecule to transition further to another quantum state;
a scanning unit configured to scan the sample by displacing the sample relative to the first illumination light and the second illumination light;
a detection unit configured to detect a light response signal generated by the sample due to irradiation with the first illumination light and the second illumination light; and
a modulation optical element disposed in the illumination optical system along a light path traveled by the first illumination light and the second illumination light and configured to spatially modulate the first illumination light and the second illumination light, wherein
in the modulation optical element, a plurality of optical substrates having different polarization properties with respect to the first illumination light and the second illumination light are joined in a coplanar manner, each optical substrate includes a birefringent medium, and each optical substrate has stacked thereon an optical thin film with different optical properties, and wherein the optical substrates are quartz substrates, and at least two of the quartz substrates are joined so that directions of phase advancing axes thereof intersect.
11. The super-resolution microscope according to claim 10 , wherein
the first illumination light and the second illumination light are incident on the modulation optical element coaxially.
12. The super-resolution microscope according to claim 10 , wherein
the optical substrates are joined concentrically.
13. The super-resolution microscope according to claim 10 , wherein
the modulation optical element has a thickness functioning as a quarter-wave plate for the second illumination light, and
at least two of the quartz substrates are joined so that directions of phase advancing axes thereof are perpendicular.
14. The super-resolution microscope according to claim 13 , wherein
the modulation optical element modulates linearly-polarized second illumination light with at least two of the quartz substrates to be circularly-polarized light rotating in opposite directions.
15. The super-resolution microscope according to claim 10 , wherein
the modulation optical element has a thickness functioning as a full-wave plate for the first illumination light.
16. The super-resolution microscope according to claim 10 , wherein
the optical thin film rotates a phase of the second illumination light around an optical axis by an integer multiple of 2π.
17. The super-resolution microscope according to claim 16 , wherein
the optical thin films corresponding to at least two of the optical substrates rotate a phase of the second illumination light in opposite directions.
18. The super-resolution microscope according to claim 10 , wherein
the absolute value of a difference between a maximum and a minimum of a phase distribution on a pupil plane of the first illumination light passing through the modulation optical element is a quarter of a wavelength or less.