Methods for screening PCD elements for EDM processing and methods for EDM processing such PCD elements
View Patent ↗Methods of screening a polycrystalline diamond element for suitability for electrical discharge machining (“EDM”). The method includes providing a PCD element including a plurality of bonded diamond grains, determining at least one characteristic of the PCD table correlated to electrical conductivity of the PCD element, and EDM the PCD element if the value of the at least one characteristic correlates to an electrical conductivity above a threshold value.
1. A method of electrical discharge machining (“EDM”) a polycrystalline diamond element, the method comprising:
providing the polycrystalline diamond element that includes a polycrystalline diamond (“PCD”) body, the PCD body including a PCD table, at least a portion of the polycrystalline diamond body exhibiting a coercivity of about 115 Oe or more and a metal-solvent catalyst content of less than about 7.5% by weight;
measuring an electrical resistance between a plurality of locations of the PCD body with an electrical impedance tomography system;
calculating a plurality of electrical conductivities of the PCD table at least partially based on the measured electrical resistances; and
EDM the PCD body only if the plurality of electrical conductivities of the PCD table are above a threshold value.
2. The method of claim 1 wherein the coercivity is about 115 Oe to about 250 Oe and the PCD body exhibits a specific magnetic saturation greater than zero G·cm 3 /g to about 15 G·cm 3 /g.
3. The method of claim 2 wherein the coercivity is about 115 Oe to about 175 Oe and the specific magnetic saturation is about 5 G·cm 3 /g to about 15 G·cm 3 /g.
4. The method of claim 1 wherein the metal-solvent catalyst content is about 3% to about 7.5% by weight.
5. The method of claim 1 wherein the metal-solvent catalyst content is about 3% to about 6% by weight.
6. The method of claim 1 wherein the metal-solvent catalyst content is about 1% to about 3% by weight.
7. The method of claim 1 wherein the PCD body is formed by placing a layer consisting essentially of un-bonded diamond particles that consist essentially of diamond adjacent to a cemented carbide substrate, and subjecting the layer and the cemented carbide substrate to a high-pressure/high-temperature process.
8. The method of claim 1 wherein the threshold value is about 200 S/m.
9. The method of claim 1 wherein the threshold value is about 500 S/m.
10. The method of claim 1 wherein the threshold value is about 1000 S/m.
11. The method of claim 1 wherein the threshold value is about 2000 S/m.
12. The method of claim 1 wherein the plurality of electrical conductivities of the PCD body are calculated by measuring a plurality of electrical resistances of the PCD body and calculating the electrical conductivities from the measured electrical resistances, respectively.
13. The method of claim 1 wherein the PCD body forms a PCD table bonded to a carbide substrate that defines a polycrystalline diamond compact.
14. The method of claim 1 , further comprising:
wherein the PCD body is bonded to a cemented carbide substrate that collectively defines a polycrystalline diamond compact (“PDC”); and
brazing at least a portion of the PDC to a radial bearing assembly, wherein the at least one electrical characteristic of the PCD body is determined prior to brazing the at least a portion of the PDC to the radial bearing assembly.
15. A method of screening a polycrystalline diamond compact (“PDC”) for suitability for electrical discharge machining (“EDM”), the method comprising:
forming the PDC, the PDC including a polycrystalline diamond (“PCD”) table bonded to a cemented carbide substrate, wherein forming the PDC includes:
subjecting a plurality of un-bonded diamond particles and a cemented carbide substrate to a high-pressure/high-temperature process, thereby sweeping in a metal-solvent catalyst from the cemented carbide substrate to create diamond-to-diamond bonding between the un-bonded diamond particles and forming the PCD table, at least a portion of the PCD table having a metal-solvent catalyst content of about 7.5 weight percent or less;
performing electrical impedance testing with an electrical impedance tomography system on the PDC to determine a plurality of electrical conductivities of the PCD table; and
EDM the PDC only if the plurality of electrical conductivities of the PCD table are above a threshold value.
16. The method of claim 15 wherein the metal-solvent catalyst content is about 3% to about 6% by weight.
17. The method of claim 15 wherein the metal-solvent catalyst content is about 1% to about 3% by weight.
18. The method of claim 15 wherein the plurality of electrical conductivities of the PCD table are calculated by measuring a plurality of electrical resistances of the PCD table and calculating the electrical conductivities from the measured electrical resistances.
19. A method of screening a polycrystalline diamond compact (“PDC”) for suitability for electrical discharge machining (“EDM”), the method comprising:
forming the PDC, the PDC including a polycrystalline diamond (“PCD”) table bonded to a cemented carbide substrate, wherein forming the PDC includes:
subjecting a plurality of un-bonded diamond particles and a cemented carbide substrate to a high-pressure/high-temperature process at a pressure of at least 7 GPa, thereby sweeping in a metal-solvent catalyst from the cemented carbide substrate to create diamond-to-diamond bonding between the un-bonded diamond particles and forming the PCD table, at least a portion of the PCD table having a metal-solvent catalyst concentration of about 7.5 weight percent or less and a coercivity of about 115 Oe or more, wherein the PCD table includes a matrix of bonded diamond grains having an average grain size of less than about 30 μm;
performing electrical impedance testing on the PCD table with an electrical impedance tomography system to determine a plurality of electrical conductivities of the PCD table; and
EDM the PDC only if the electrical conductivities of the PCD table are above a threshold value.
20. The method of claim 19 wherein the coercivity is about 115 Oe to about 250 Oe and the PCD table exhibits a specific magnetic saturation greater than zero G·cm 3 /g to about 15 G·cm 3 /g.
21. The method of claim 20 wherein the coercivity is about 115 Oe to about 175 Oe and the specific magnetic saturation is about 5 G·cm 3 /g to about 15 G·cm 3 /g.
22. The method of claim 20 wherein the coercivity is about 155 Oe to about 175 Oe and the specific magnetic saturation is about 10 G·cm 3 /g to about 15 G·cm 3 /g.
23. The method of claim 19 wherein the pressure is about 9.0 GPa to about 12.0 GPa.
24. The method of claim 19 wherein the matrix of bonded diamond grains consists essentially of diamond.
25. The method of claim 1 wherein:
the PCD body includes a substrate bonded to the PCD table; and
measuring the electrical resistance between the plurality of location of the PCD body includes:
contacting an upper surface of the polycrystalline diamond table of the PCD body with a first plurality of probes; and
contacting a surface of the substrate of the PCD body with a second plurality of probes.
26. The method of claim 25 wherein the number of probes in the first plurality of probes exceeds the number of probes in the second plurality of probes.