Solid forms of 3-(6-(1-(2,2-difluorobenzo[d][1,3]dioxol-5-yl)cyclopropanecarboxamido)-3-methylpyridin-2-yl) benzoic acid
The present invention relates to a substantially crystalline and free solid state form of 3-(6-(1-(2,2-difluorobenzo[d][1,3]dioxol-5-yl)cyclopropanecarboxamido)-3-methylpyridin-2-yl)benzoic acid (Form I), pharmaceutical compositions thereof, and methods of treatment therewith.
1. A method of treating cystic fibrosis in a patient comprising administering to the patient an effective amount of 3-(6-(1-(2,2-Difluorobenzo[d][1,3]dioxol-5-yl)cyclopropanecarboxamido)-3-methylpyridin-2-yl)benzoic acid characterized as Form I and N-(5-hydroxy-2,4-ditert-butyl-phenyl)-4-oxo-1H-quinoline-3-carboxamide, wherein the patient has a defective gene that causes a deletion of phenylalanine at position 508 of the cystic fibrosis transmembrane conductance regulator amino acid sequence.
2. The method of claim 1 , wherein the patient has two copies of the defective gene.
3. The method of claim 1 , wherein the Form I is characterized by one or more peaks at 15.2 to 15.6 degrees, 16.1 to 16.5 degrees, and 14.3 to 14.7 degrees in an X-ray powder diffraction obtained using Cu K alpha radiation.
4. The method of claim 3 , wherein the Form I is characterized by one or more peaks at 15.4, 16.3, and 14.5 degrees.
5. The method of claim 4 , wherein the Form I is further characterized by a peak at 14.6 to 15.0 degrees.
6. The method of claim 5 , wherein the Form I is further characterized by a peak at 14.8 degrees.
7. The method of claim 5 , wherein the Form I is further characterized by a peak at 17.6 to 18.0 degrees.
8. The method of claim 7 , wherein the Form I is further characterized by a peak at 17.8 degrees.
9. The method of claim 7 , wherein the Form I is further characterized by a peak at 16.4 to 16.8 degrees.
10. The method of claim 9 , wherein the Form I is further characterized by a peak at 16.6 degrees.
11. The method of claim 9 , wherein the Form I is further characterized by a peak at 7.6 to 8.0 degrees.
12. The method of claim 11 , wherein the Form I is further characterized by a peak at 7.8 degrees.
13. The method of claim 11 , wherein the Form I is further characterized by a peak at 25.8 to 26.2 degrees.
14. The method of claim 13 , wherein the Form I is further characterized by a peak at 26.0 degrees.
15. The method of claim 13 , wherein the Form I is further characterized by a peak at 21.4 to 21.8 degrees.
16. The method of claim 15 , wherein the Form I is further characterized by a peak at 21.6 degrees.
17. The method of claim 16 , wherein the Form I is further characterized by a peak at 23.1 to 23.5 degrees.
18. The method of claim 17 , wherein the Form I is further characterized by a peak at 23.3 degrees.
19. The method of claim 1 , wherein the Form I is characterized by a diffraction pattern substantially similar to that of FIG. 1 .
20. The method of claim 1 , wherein the Form I is characterized by a diffraction pattern substantially similar to that of FIG. 2 .
21. The method of claim 1 , wherein the particle size distribution of D90 is about 82 μm or less.
22. The method of claim 1 , wherein the particle size distribution of D50 is about 30 μm or less.