Method and apparatus for estimating scatter in a positron emission tomography scan at multiple bed positions
View Patent ↗A method is provided for estimating scatter in a positron emission tomography (PET) scan at multiple bed positions, the method comprising calculating a first scatter sinogram based on scatter data obtained at a first bed position, calculating a second scatter sinogram based on scatter data obtained at a second bed position, and deriving a third scatter sinogram for a third bed position between the first bed position and the second bed position, wherein the third scatter sinogram is derived from the first scatter sinogram according to a first percentage of overlap of the first bed position with the third bed position, and from the second scatter sinogram according to a second percentage of overlap of the second bed position with the third bed position.
1. A method for estimating scatter in a positron emission tomography (PET) scan at multiple bed positions, the method comprising:
calculating a first scatter sinogram based on scatter data obtained at a first bed position;
calculating a second scatter sinogram based on scatter data obtained at a second bed position; and
deriving a third scatter sinogram for a third bed position between the first bed position and the second bed position, wherein
the third scatter sinogram is derived from the first scatter sinogram according to a first percentage of overlap of the first bed position with the third bed position, and from the second scatter sinogram according to a second percentage of overlap of the second bed position with the third bed position.
2. The method according to claim 1 , wherein the step of deriving the third scatter sinogram comprises:
determining a first portion to copy, the first portion being equal to the first percentage of the first scatter sinogram;
determining a second portion to copy, the second portion being equal to the second percentage of the second scatter sinogram; and
copying the first portion and the second portion to the third scatter sinogram.
3. The method according to claim 2 , wherein
the first scatter sinogram, the second scatter sinogram and the third scatter sinogram have the same dimensions as one another, and
when a sum of the first percentage of overlap and the second percentage of overlap is less than 100%, the step of deriving the third scatter sinogram further comprises:
determining a remaining portion of the third scatter sinogram, the remaining portion having an area that is equal to a difference between an area of the third scatter sinogram and a sum of an area of the first portion and an area of the second portion;
interpolating the remaining portion of the third scatter sinogram to create an interpolated portion; and
copying the interpolated portion to the third scatter sinogram, wherein the third scatter sinogram includes the first portion, the second portion, and the interpolated portion.
4. The method according to claim 2 , wherein
the first scatter sinogram, the second scatter sinogram and the third scatter sinogram have the same dimensions as one another, and
when a sum of the first percentage of overlap and the second percentage of overlap is greater than 100%, the step of deriving the third scatter sinogram further comprises:
determining an overlapping portion of the third scatter sinogram, the overlapping portion including a first part of the first portion that overlaps with a second part of the second portion;
averaging the first part and the second part of the overlapping portion to create an averaged portion; and
copying the averaged portion to the third scatter sinogram, wherein the third scatter sinogram includes the averaged portion, a first remaining part of the first portion that does not include the first part, and a second remaining part of the second portion that does not include the second part.
5. The method according to claim 2 , wherein the step of copying the first portion and the second portion to the third scatter sinogram comprises:
determining a first position for the first portion in the third scatter sinogram;
determining a second position for the second portion in the third scatter sinogram; and
copying the first portion to the first position and the second portion to the second position, wherein
a size of the third scatter sinogram is equal to a size of the first scatter sinogram and equal to a size of the second scatter sinogram.
6. The method according to claim 3 , wherein the step of copying the interpolated portion to the third scatter sinogram comprises:
determining a position for the interpolated portion in the third scatter sinogram, the position of the interpolated portion being determined based on positions of the first portion and the second portion; and
copying the interpolated portion to the position in the third scatter sinogram.
7. The method according to claim 4 , wherein the step of copying the averaged portion to the third scatter sinogram comprises:
determining a position for the averaged portion in the third scatter sinogram, the position of the averaged portion being determined based on positions of the first portion and the second portion; and
copying the averaged portion to the position in the third scatter sinogram.
8. The method according to claim 1 , wherein the first scatter sinogram and the second scatter sinogram are calculated using a model-based scatter estimation (MBSE), a background subtraction method or a convolution subtraction method.
9. The method according to claim 1 , wherein the first scatter sinogram and the second scatter sinogram are calculated using Monte Carlo-based scatter estimation.
10. The method according to claim 2 , wherein the step of deriving the third scatter sinogram further includes rescaling the third scatter sinogram for the third bed position.
11. The method according to claim 1 , wherein the PET scan is performed with continuous bed movement.
12. The method according to claim 1 , wherein the PET scan is performed using step-and-shoot bed movement.
13. The method according to claim 1 , further comprising:
determining each bed position within the multiple bed positions of the PET scan.
14. The method according to claim 1 , further comprising:
determining the first percentage of overlap; and
determining the second percentage of overlap.
15. A non-transitory computer readable medium storing computer executable instructions that, when executed by a processor, cause the processor to perform a method for estimating scatter in a positron emission tomography (PET) scan at multiple bed positions, the method comprising, the method comprising:
calculating a first scatter sinogram based on scatter data obtained at a first bed position;
calculating a second scatter sinogram based on scatter data obtained at a second bed position; and
deriving a third scatter sinogram for a third bed position between the first bed position and the second bed position, wherein
the third scatter sinogram is derived from the first scatter sinogram according to a first percentage of overlap of the first bed position with the third bed position, and from the second scatter sinogram according to a second percentage of overlap of the second bed position with the third bed position.
16. An apparatus for estimating scatter in a positron emission tomography (PET) scan at multiple bed positions, the apparatus comprising:
processing circuitry configured to
calculate a first scatter sinogram based on scatter data obtained at a first bed position;
calculate a second scatter sinogram based on scatter data obtained at a second bed position; and
derive a third scatter sinogram for a third bed position between the first bed position and the second bed position, wherein
the processing circuitry derives the third scatter sinogram from the first scatter sinogram according to a first percentage of overlap of the first bed position with the third bed position, and from the second scatter sinogram according to a second percentage of overlap of the second bed position with the third bed position.
17. The apparatus according to claim 16 , wherein the processing circuitry is further configured to
determine a first portion to copy, the first portion being from the first scatter sinogram;
determine a second portion to copy, the second portion being from the second scatter sinogram; and
copy the first portion and the second portion to the third scatter sinogram.
18. The apparatus according to claim 17 , wherein
the first scatter sinogram, the second scatter sinogram and the third scatter sinogram have the same dimensions as one another, and
when a sum of the first percentage of overlap and the second percentage of overlap is less than 100%, the processing circuitry is further configured to
determine a remaining portion of the third scatter sinogram, the remaining portion having an area that is equal to a difference between an area of the third scatter sinogram and a sum of an area of the first portion and an area of the second portion;
interpolate the remaining portion of the third scatter sinogram to create an interpolated portion; and
copy the interpolated portion to the third scatter sinogram, wherein the third scatter sinogram includes the first portion, the second portion, and the interpolated portion.
19. The apparatus according to claim 17 , wherein
the first scatter sinogram, the second scatter sinogram and the third scatter sinogram have the same dimensions as one another, and
when a sum of the first percentage of overlap and the second percentage of overlap is greater than 100%, the processing circuitry is further configured to
determine an overlapping portion of the third scatter sinogram, the overlapping portion including a first part of the first portion that overlaps with a second part of the second portion;
average the first part and the second part of the overlapping portion to create an averaged portion; and
copy the averaged portion to the third scatter sinogram, wherein the third scatter sinogram includes the averaged portion, a first remaining part of the first portion that does not include the first part, and a second remaining part of the second portion that does not include the second part.
20. The apparatus according to claim 17 , wherein the processing circuitry is further configured to
determine a first position for the first portion in the third scatter sinogram;
determine a second position for the second portion in the third scatter sinogram; and
copy the first portion at the first position and the second portion at the second position, wherein
a size of the third scatter sinogram is equal to a size of the first scatter sinogram and equal to a size of the second scatter sinogram.