Systems and methods for profiling of hardware components of computing devices
View Patent ↗Aspects of the present invention include telemetry measurement in a networking device. In embodiments of the present invention, fine granularity power measurement can be achieved at a component level within a networking device without additional hardware like a multi meter. Coarse level granularity of power management can also be achieved in embodiments of the present invention.
1. A power measurement system in a computing device, comprising:
a power measurement circuitry including point of load circuitry for measuring telemetry data associated with each component of a plurality of components within the computing device while the computing device is operational;
a processing module communicatively coupled via a bus to the power measurement circuitry for accessing telemetry data from the power management circuitry about a component from the plurality of components; and
a profiling component for profiling telemetry data measured about at least one component from the plurality of components.
2. The power measurement system of claim 1 wherein the system is used to design a networking device.
3. The power measurement system of claim 1 wherein the system is used in a deployed network.
4. The power measurement system of claim 1 wherein at least some of the telemetry data measured is related to temperature.
5. The power measurement system of claim 2 wherein the temperature measured is instantaneous or near instantaneous.
6. The power measurement system of claim 2 wherein the temperature measured represents an average over a time period.
7. The power measurement system of claim 1 wherein at least some of the telemetry data measured is related to current.
8. The power measurement system of claim 1 wherein at least some of the telemetry data measured is related to voltage.
9. A method for power management in a computing device, comprising:
using a data processor communicatively coupled to a measurement circuitry via a bus to gather telemetry data associated with each component of a plurality of components within the computing device while the computing device is operational;
using at least some of the telemetry data measured about at least one of the components from the plurality of components to create a profile of the at least one of the components.
10. The method of claim 9 wherein at least some of the telemetry data measured is related to temperature.
11. The method of claim 9 wherein at least some of the telemetry data measured is related to voltage.
12. The method of claim 9 wherein at least some of the telemetry data measured is related to current.
13. The method of claim 9 further comprising load balancing across a network based on the processed telemetry measured.
14. The method of claim 9 wherein the telemetry measured is used in design of a computing device.
15. The method of claim 9 wherein the profile of the at least one of the components is a profile over time regarding one or more telemetry metrics about one component.
16. A measurement system for measuring one or more metrics about one or more components in a computing device, the measurement system comprising:
for each component from a set of components from the computing device:
a measurement circuitry for measuring data related to one or more metrics associated with the component; and
a bus communicatively coupling the measurement circuitry to a data processor for communicating data with the measurement circuitry; and
the data processor communicatively coupled via buses to the measurement circuitries for communicating data with the measurement circuitry about one or more of the components from the set of components.
17. The measurement system of claim 16 wherein the measurement circuitry comprises a point of load component.
18. The measurement system of claim 17 wherein a point of load component controls power delivered to the component associated with the point of load device.
19. The measurement system of claim 16 further comprising:
a profiling component that uses at least some of the data to generate a profile about a component.
20. The measurement system of claim 19 wherein the profiling component uses at least some of the data to generate a profile about two or more components.