IP Library Granted Patent US 9,818,549
Granted Patent B2
US 9,818,549 · App. 14/482,384 · Granted Nov 14, 2017

Conductive polymer dispersions for solid electrolytic capacitors

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Quick Facts
Patent No.
US 9,818,549
App. No.
14/482,384
Granted
Nov 14, 2017
Kind
B2
Abstract

A capacitor with an anode and a dielectric over the anode. A first conductive polymer layer is over the dielectric wherein the first conductive polymer layer comprises a polyanion and a first binder. A second conductive polymer layer is over the first conductive polymer layer wherein the second conductive polymer layer comprises a polyanion and a second binder and wherein the first binder is more hydrophilic than the second binder.

Claims (38)

1. A method for forming a capacitor comprising:

providing an anode with a dielectric coating thereon;

applying a first dispersion over said dielectric coating thereby forming a first conductive polymer layer over said dielectric coating,

wherein said first conductive polymer layer comprises a dopant and a hydrophilic material,

wherein said hydrophilic material is selected from the group consisting of poly(ethylene oxide), poly(vinyl alcohol), polyethylene oxide-polyvinyl alcohol-cellulose, polyvinylpyrrolidone, poly(hydroxyethyl methacrylate), polyurethane, poly(ethylene glycol), poly(propylene glycol), xanthan, methyl cellulose, starch, poly(acrylic acid), carboxymethyl cellulose, hydroxypropyl methyl cellulose, acrylic acid, methacrylic acid, chitosan, αβ-glycerophosphate, polyphosphazenes, polypeptides, poly(vinyl methyl ether), and poly(N-isopropyl acrylamide), and

wherein said hydrophilic material is crosslinked with a conductive polymer of said first conductive polymer layer; and

applying a second dispersion over said first conductive polymer layer thereby forming a second conductive polymer layer over said first conductive polymer layer.

2. The method for forming a capacitor of claim 1 wherein said second conductive polymer layer comprises a hydrophobic material.

3. The method for forming a capacitor of claim 2 wherein said hydrophobic material is selected from the group consisting of thermosetting materials, fluoro-polymers and their copolymers, silicone polymers and their copolymers, silicone polyester, crosslinkable polyester, and crosslinkable epoxies.

4. The method for forming a capacitor of claim 3 wherein said hydrophobic material is polytetrafluoroethylene.

5. The method for forming a capacitor of claim 1 wherein said first conductive polymer layer has a moisture content of at least 21 wt %.

6. The method for forming a capacitor of claim 1 wherein said second conductive polymer layer has a moisture content of no more than 15 wt % at 125° C.

7. The method for forming a capacitor of claim 1 wherein said first conductive polymer layer comprises at least one hydrophilic material is selected from the group consisting of poly(ethylene oxide), and poly(vinyl alcohol).

8. The method for forming a capacitor of claim 1 wherein said hydrophilic material is crosslinked with a crosslinking agent.

9. The method for forming a capacitor of claim 8 wherein said crosslinking agent comprises functional groups selected from hydroxyl and carboxyl.

10. The method for forming a capacitor of claim 1 wherein at least one of said first conductive polymer or said second conductive polymer comprises a moisture retaining component.

11. The method for forming a capacitor of claim 1 wherein at least one of said first conductive polymer layer or said second conductive polymer layer has a moisture loss of no more than 5 wt % upon heating from 125° C. to 175° C.

12. The method for forming a capacitor of claim 11 wherein said moisture loss is no more than 3 wt %.

13. The method for forming a capacitor of claim 11 wherein said moisture loss is no more than 1 wt %.

14. The method for forming a capacitor of claim 1 wherein said first conductive polymer layer has a moisture content which is at least 110 wt % of a moisture content of said second conductive polymer layer.

15. The method for forming a capacitor of claim 14 wherein said first conductive polymer layer has a moisture content which is at least 150 wt % of the moisture content of said second conductive polymer layer.

16. The method for forming a capacitor of claim 15 wherein said first conductive polymer layer has a moisture content which is at least 200 wt % of the moisture content of said second conductive polymer layer.

17. A method for forming a capacitor comprising:

providing an anode with a dielectric coating thereon;

applying a first dispersion over said dielectric coating thereby forming a first conductive polymer layer over said dielectric coating,

wherein said first conductive polymer layer comprises a dopant and a hydrophilic material; and

applying a second dispersion over said first conductive polymer layer thereby forming a second conductive polymer layer over said first conductive polymer layer,

wherein at least one of said first conductive polymer or said second conductive polymer comprises a moisture retaining component, and

wherein said moisture retaining component is a material selected from the group consisting of a hydrogel, a molecular sieve, and a molecular container.

18. A method for forming a capacitor comprising:

providing an anode with a dielectric coating thereon;

applying a first dispersion over said dielectric coating thereby forming a first conductive polymer layer over said dielectric coating,

wherein said first conductive polymer layer comprises a dopant and a hydrophilic material; and

applying a second dispersion over said first conductive polymer layer thereby forming a second conductive polymer layer over said first conductive polymer layer,

wherein at least one of said first conductive polymer or said second conductive polymer comprises a moisture retaining component, and

wherein at least said moisture retaining component is encapsulated in a polymeric encapsulant.

19. The method for forming a capacitor of claim 18 wherein said polymeric encapsulant has a Tg of at least 100° C.

20. The method for forming a capacitor of claim 19 wherein said polymeric encapsulant has a Tg of at least 150° C.

Assignments (3)
RELEASE OF SECURITY INTEREST Recorded Nov 8, 2018
From: BANK OF AMERICA, N.A.
To: KEMET CORPORATION,; KEMET ELECTRONICS CORPORATION; KEMET BLUE POWDER CORPORATION
Reel/Frame 047450/0926 →
SECURITY AGREEMENT Recorded May 22, 2017
From: KEMET CORPORATION; KEMET ELECTRONICS CORPORATION; KEMET BLUE POWDER CORPORATION
To: BANK OF AMERICA, N.A., AS COLLATERAL AGENT
Reel/Frame 042523/0639 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Sep 10, 2014
From: CHACKO, ANTONY P.
To: KEMET ELECTRONICS CORPORATION
Reel/Frame 033712/0790 →