IP Library Granted Patent US 9,385,057
Granted Patent B2
US 9,385,057 · App. 14/485,927 · Granted Jul 5, 2016

Semiconductor device

View Patent ↗
Loading inventors, assignments & file history…
Monitor This Case
Get email alerts when status or documents change.
Order Certified Copies
Most orders are placed with the USPTO same day — all within 24 business hours.
Order via The Patent Place →
Pre-filled with this patent's details
Quick Facts
Patent No.
US 9,385,057
App. No.
14/485,927
Granted
Jul 5, 2016
Kind
B2
Abstract

A semiconductor flat package has a semiconductor chip, leads connected to the semiconductor chip, and an encapsulation resin covering the semiconductor chip and partially covering the leads. Outer end surfaces of the leads are exposed from the encapsulation resin and covered with a plated layer, and a side end surface of the plated layer and a side end surface of the encapsulation resin are flush with each other. A material with good solder wettability is formed at a lead cut portion of the semiconductor flat package, to thereby improve solder connection strength with a circuit board. A solder fillet is formed from the lead cut portion of the semiconductor package, to thereby enable adaptation of solder automatic visual inspection after mounting.

Claims (21)

1. A semiconductor device, comprising:

a semiconductor chip mounted on an island;

an encapsulation resin for covering the semiconductor chip; and

a lead that is partially covered with the encapsulation resin and is electrically connected to the semiconductor chip, the lead having an end surface all of which is spaced inwardly from a side end surface of the encapsulation resin; and

a plated layer completely covering the end surface of the lead, a side end surface of the plated layer being flush with the side end surface of the encapsulation resin.

2. A semiconductor device according to claim 1 , wherein the plated layer is formed also on a bottom surface of the lead to form a standoff on a lower surface of the island.

3. A semiconductor device according to claim 1 , further comprising a bump formed on a surface of the semiconductor chip,

wherein the semiconductor chip and the lead exposed from the encapsulation resin are electrically connected to each other via the bump.

4. A semiconductor device according to claim 1 , wherein the end surface of the lead extends from a top surface of the lead to a bottom surface of the lead.

5. A semiconductor device according to claim 1 , including a plurality of said leads.

6. A semiconductor device comprising:

a semiconductor chip mounted on an island;

leads electrically connected to the semiconductor chip, each lead having top and bottom surfaces and side surfaces interconnecting the top and bottom surfaces, the side surfaces including an outer end surface facing outwardly away from the semiconductor chip;

an encapsulation resin covering the semiconductor chip and partially covering the leads, the outer end surfaces of the leads being completely exposed from and not covered by the encapsulation resin; and

a plated layer formed on and completely covering the outer end surfaces of the leads, the plated layer being flush with a side surface of the encapsulation resin.

7. A semiconductor device according to claim 6 , wherein the outer end surfaces of the leads are flat from the top surface to the bottom surface.

8. A semiconductor device according to claim 7 , wherein the plated layer is also formed on the bottom surfaces of the leads.

9. A semiconductor device according to claim 8 , wherein the plated layer on the bottom surfaces of the leads forms a standoff on a lower surface of the island.

10. A semiconductor device according to claim 6 , wherein a bottom surface of the semiconductor chip is provided with electrically conductive bumps electrically connected to respective ones of the leads.

11. A semiconductor device according to claim 6 , wherein the plated layer is also formed on the bottom surfaces of the leads.

12. A semiconductor device according to claim 11 , wherein the plated layer on the bottom surfaces of the leads forms a standoff on a lower surface of the island.

Assignments (4)
CHANGE OF ADDRESS Recorded Jun 8, 2023
From: ABLIC INC.
To: ABLIC INC.
Reel/Frame 064021/0575 →
CHANGE OF NAME Recorded Mar 12, 2018
From: SII SEMICONDUCTOR CORPORATION
To: ABLIC INC.
Reel/Frame 045567/0927 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Mar 10, 2016
From: SEIKO INSTRUMENTS INC.
To: SII SEMICONDUCTOR CORPORATION
Reel/Frame 038058/0892 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Sep 15, 2014
From: YOSHINO, TOMOYUKI
To: SEIKO INSTRUMENTS INC.
Reel/Frame 033737/0471 →