Fuse sense circuit and method
View Patent ↗A sense circuit and method for use in measuring the blown or unblown state of fusible links (fuses), particularly in integrated circuits. Embodiments include at least one additional reference resistance to allow for a greater margin of error in determining the actual state of a fuse. By having two or more reference resistances that can be independently selectable, additional combinations of reference resistance values are available to compare against the resistance of a fuse being tested.
1. A method for determining at least one of the unblown or blown states of a fuse in an electronic circuit, the unblown state being associated with a first range of resistances, and the blown state being associated with a second range of resistances, and wherein the fuse may be in an intermediate state having a resistance between the first and second first range of resistances, including:
(a) comparing the resistance of the fuse to a plurality of different reference resistances, at least two of the different reference resistances each having an associated resistance value greater than the first range of resistances and less than the second range of resistances; and
(b) determining at least one of the blown or unblown states of the fuse by requiring that at least one such state meet or exceed at least two separate comparisons.
2. The method of claim 1 , wherein the plurality of reference resistances are generated by a variable resistance device.
3. The method of claim 2 , wherein the variable resistance device is a field effect transistor.
4. A circuit for sensing at least one of the unblown or blown states of a fuse in an electronic circuit, the unblown state being associated with a first range of resistances, and the blown state being associated with a second range of resistances, and wherein the fuse may be in an intermediate state having a resistance between the first and second first range of resistances, including:
(a) a plurality of different reference resistances, at least two of the different reference resistances each having an associated resistance value greater than the first range of resistances and less than the second range of resistances; and
(b) testing circuitry, coupled to the fuse and to select ones of the different reference resistances, for determining at least one of the blown or unblown states of the fuse by requiring that at least one such state meet or exceed at least two separate comparisons.
5. The circuit of claim 4 , wherein the plurality of reference resistances are generated by a variable resistance device.
6. The circuit of claim 5 , wherein the variable resistance device is a field effect transistor.