Integrated thinfilm resistor and MIM capacitor with a low serial resistance
View Patent ↗An electronic device comprising a semiconductor structure having a back end capacitor and a back end thin film resistor and a method of manufacturing the same. The semiconductor structure includes a first dielectric layer, a bottom plate of the capacitor and a thin film resistor body. The bottom plate and the resistor body are laterally spaced apart portions of the same thin film layer. The bottom plate further includes a conductive layer overlying the thin film layer. A second dielectric layer is disposed on the conductive layer of the bottom plate of the capacitor. A top plate of the capacitor is disposed on the second dielectric layer.
1. A method of manufacturing an electronic device comprising the steps of:
depositing a first dielectric layer over a semiconductor substrate;
depositing a thin film layer for a bottom plate of a capacitor and a resistor body;
depositing a first conductive layer directly on the thin film layer;
depositing a second dielectric layer on the first conductive layer;
depositing a second conductive layer on the second dielectric layer;
patterning and etching to remove the second conductive layer and the second dielectric layer in a resistor area and form a top plate of the capacitor and a capacitor dielectric;
removing the first conductive layer in the resistor area leaving a portion of the first conductive layer in the capacitor;
etching a portion of the thin film layer to form the resistor body and the bottom plate of the capacitor, wherein the bottom plate further includes the portion of the first conductive layer;
wherein both the bottom plate and the resistor body layer are deposited on the first dielectric layer in a common process step, and wherein the bottom plate and the resistor body are laterally spaced apart portions of the same thin film layer.
2. The method of claim 1 , wherein the method further comprises the steps of:
forming a first metallization level over the semiconductor substrate prior to depositing the first dielectric layer,
depositing a third dielectric layer on the top plate of the capacitor,
forming a second metallization level over the third dielectric layer.
3. The method of claim 1 , wherein the step of patterning and etching to remove the second conductive layer and the second dielectric layer includes:
forming a first hard mask layer over the second conductive layer;
forming a first mask pattern over the first hard mask layer; and
etching the second conductive layer and the second dielectric layer using the first mask pattern.
4. The method of claim 3 , wherein the step of removing the first conductive layer in the resistor area includes wet etching the first conductive layer using the first hard mask layer to protect the capacitor.
5. The method of claim 3 , wherein etching the second conductive layer and the second dielectric layer comprises:
dry etching the first hard mask layer;
dry etching the second conductive layer stopping on the second dielectric layer; and
dry etching the second dielectric layer stopping on the first conductive layer.
6. A method of manufacturing an electronic device comprising the steps of:
depositing a first dielectric layer over a semiconductor substrate;
depositing a thin film layer for a bottom plate of a capacitor and a resistor body;
depositing a first conductive layer over the thin film layer;
depositing a second dielectric layer on the first conductive layer;
depositing a second conductive layer on the second dielectric layer;
patterning and etching to remove the second conductive layer and the second dielectric layer in a resistor area and form a top plate of the capacitor and a capacitor dielectric;
removing the first conductive layer in the resistor area leaving a portion of the first conductive layer in the capacitor;
etching a portion of the thin film layer to form the resistor body and the bottom plate of the capacitor, wherein the bottom plate further includes the portion of the first conductive layer;
wherein both the bottom plate and the resistor body layer are deposited on the first dielectric layer in a common process step, and wherein the bottom plate and the resistor body are laterally spaced apart portions of the same thin film layer;
wherein the step of patterning and etching to remove the second conductive layer and the second dielectric layer includes:
forming a first hard mask layer over the second conductive layer;
forming a first mask pattern over the first hard mask layer; and
etching the second conductive layer and the second dielectric layer using the first mask pattern;
wherein etching the second conductive layer and the second dielectric layer comprises:
dry etching the first hard mask layer;
dry etching the second conductive layer stopping on the second dielectric layer; and
dry etching the second conductive layer stopping on the first conductive layer;
and wherein etching the portion of the thin film layer to form the resistor body and the bottom plate of the capacitor comprises:
depositing a second hard mask layer over the thin film layer and top plate of the capacitor;
forming a second mask pattern over the second hard mask layer;
etching the second hard mask layer stopping on the thin film layer using the second mask pattern;
removing the second mask pattern; and
then, etching the thin film layer using the etched second hard mask layer as a mask.
7. A method of manufacturing an electronic device comprising the steps of:
depositing a first dielectric layer over a semiconductor substrate;
depositing a thin film layer for a bottom plate of a capacitor and a resistor body;
depositing a first conductive layer over the thin film layer;
depositing a second dielectric layer on the first conductive layer;
depositing a second conductive layer on the second dielectric layer;
forming a first mask pattern over the second conductive layer;
etching to remove the second conductive layer and the second dielectric layer in a resistor area and form a top plate of the capacitor and a capacitor dielectric using the first mask pattern;
removing the first mask pattern;
after removing the first mask pattern, removing the first conductive layer in the resistor area using a wet etch leaving a portion of the first conductive layer in the capacitor;
etching a portion of the thin film layer to form the resistor body and the bottom plate of the capacitor, wherein the bottom plate further includes the portion of the first conductive layer;
wherein both the bottom plate and the resistor body layer are deposited on the first dielectric layer in a common process step, and wherein the bottom plate and the resistor body are laterally spaced apart portions of the same thin film layer.
8. The method of claim 7 , wherein the method further comprises the steps of:
forming a first metallization level over the semiconductor substrate prior to depositing the first dielectric layer,
depositing a third dielectric layer on the top plate of the capacitor,
forming a second metallization level over the third dielectric layer.
9. The method of claim 7 , further comprising:
forming a first hard mask layer over the second conductive layer prior to etching the second conductive layer and the second dielectric layer;
forming the first mask pattern over the first hard mask layer; and
etching the first hard mask layer using the first mask pattern.
10. The method of claim 7 , wherein the step of removing the first conductive layer in the resistor area includes wet etching the first conductive layer using the first hard mask layer to protect the capacitor.
11. The method of claim 9 , wherein:
the step of etching the first hard mask layer includes dry etching the first hard mask layer; and
the step of etching to remove the second conductive layer and the second dielectric layer includes:
dry etching the second conductive layer stopping on the second dielectric layer; and
dry etching the second dielectric layer stopping on the first conductive layer.