Counting digital x-ray image detector with two switchable modes
The embodiments relate to a counting digital x-ray detector for recording x-ray images of an object irradiated by x-ray radiation with at least one detector module, which includes a flat direct converter for converting x-ray radiation into an electrical signal and a matrix with a plurality of counting pixel elements, wherein each counting pixel element includes a charge or signal input, a conversion facility for converting the electrical signal into a count signal, a digital counter for detecting and storing the count signal and a control and readout unit, and wherein the x-ray image detector is embodied such that each pixel element of the x-ray image detector is connected to the corresponding electrodes of the detector material of the direct converter via contacts and in this way is embodied switchably.
1. A counting digital x-ray image detector for recording x-ray images of an object irradiated by x-ray radiation with at least one detector module, the x-ray image detector comprising:
a flat direct converter configured to convert x-ray radiation into an electrical signal and a matrix with a plurality of counting pixel elements, wherein each counting pixel element comprises a charge or signal input;
a conversion facility configured to convert the electrical signal into a count signal;
a digital counter configured to detect and store the count signal; and
a control and readout unit,
wherein the x-ray image detector is configured such that each pixel element of the x-ray image detector is connected to corresponding electrodes of detector material of the flat direct converter via contacts,
wherein the x-ray image detector is configured to be switched over, such that (1) in a first count mode, the sum signals at different crossing points of neighboring pixel elements are determined and the sum signal is assigned to the pixel element having the largest individual signal, and (2) in a second count mode, a number of pixel elements are connected together to form a pixel structure, wherein a sum signal is formed in the pixel elements that is compared to thresholds of the conversion facility of the pixel elements, and counter states are evaluated as a function of the comparison such that only the pixel element, of which the conversion facility is assigned to the threshold corresponding to the maximum input signal of the pixel structure, delivers a value.
2. The x-ray image detector as claimed in claim 1 , wherein a point assigned to one of these pixel elements of the pixel structure is the crossing point of the pixel elements.
3. The x-ray image detector as claimed in claim 2 , wherein the pixel structure is formed by a locally fixed 2-type cluster of 2×2 counting pixel elements.
4. The x-ray image detector as claimed in claim 3 , wherein the conversion facility for converting the electrical signal into a count signal comprises at least one discriminator and at least one threshold generator.
5. The x-ray image detector as claimed in claim 4 , wherein the x-ray image detector comprises at least one application specific integrated circuit (ASIC).
6. The x-ray image detector as claimed in claim 2 , wherein each first memory unit is assigned precisely one second digital memory unit for storage through a transmission process of a copy of the first memory unit at the time of the transmission.
7. The x-ray image detector as claimed in claim 2 , wherein the x-ray image detector comprises at least one application specific integrated circuit (ASIC).
8. The x-ray image detector as claimed in claim 1 , wherein the pixel structure is formed by a locally fixed 2-type cluster of 2×2 counting pixel elements.
9. The x-ray image detector as claimed in claim 8 , wherein the x-ray image detector comprises at least one application specific integrated circuit (ASIC).
10. The x-ray image detector as claimed in claim 8 , wherein the conversion facility for converting the electrical signal into a count signal comprises at least one discriminator and at least one threshold generator.
11. The x-ray image detector as claimed in claim 10 , wherein the x-ray image detector comprises at least one application specific integrated circuit (ASIC).
12. The x-ray image detector as claimed in claim 1 , wherein the conversion facility for converting the electrical signal into a count signal comprises at least one discriminator and at least one threshold generator.
13. The x-ray image detector as claimed in claim 1 , wherein the x-ray image detector comprises at least one application specific integrated circuit (ASIC).
14. The x-ray image detector as claimed in claim 1 , wherein each counting pixel element comprises a number of discriminators and a number of threshold generators.
15. The x-ray image detector as claimed in claim 14 , wherein, in the second count mode, a logic causes only that counter of the discriminators belonging to the pixel elements of the pixel structure, which comprises the highest thresholds that remain exceeded by the signal, to increase by one.
16. The x-ray image detector as claimed in claim 14 , wherein, in the second count mode, the counter state of each counter is increased by one if the signal lies above the threshold of the discriminators and that, by subtraction of the counter states of the counters, the number of x-ray quanta occurring for each of the energy intervals is determined.
17. The x-ray image detector as claimed in claim 14 , wherein the discriminators are window discriminators.
18. The x-ray image detector as claimed in claim 1 , wherein each first memory unit is assigned precisely one second digital memory unit for storage through a transmission process of a copy of the first memory unit at the time of the transmission.