The present invention includes an apparatus for preparing samples for measurement by x-ray fluorescence spectrometry. The apparatus comprises a plate having one or more holes passing through the plate. The holes are covered by a film on one side of the plate. The holes are less than 500 micrometers across in one dimension where the film covers the holes. The film is translucent to x-rays. The present invention also includes an apparatus for preparing samples for measurement by x-ray fluorescence spectrometry. The apparatus comprises a plate having one or more holes passing through the plate. The holes are covered on one side of the plate by a detachable cover forming a water-tight seal against the plate. The cover is substantially free of the elements osmium, yttrium, iridium, phosphorus, zirconium, platinum, gold, niobium, mercury, thallium, molybdenum, sulfur, lead, bismuth, technetium, ruthenium, chlorine, rhodium, palladium, argon, silver, and thorium. The holes are less than about 500 micrometers across in one dimension where the cover covers the holes. The present invention also includes a method for preparing samples for measurement by x-ray fluorescence spectrometry. The method comprises providing a solution of with less than 10 micromolar solute and a volume of between about 2 microliters and about 2 milliliters. The solution is concentrated and analyzed using x-ray fluorescence spectrometry.
1. An apparatus for preparing one or more samples for measurement by X-ray fluorescence spectrometry, the apparatus comprising:
a plate having at least one hole penetrating said plate;
a film covering said hole oriented normal to said film; and
said hole having a diameter between 10 micrometers and two millimeters in at least one dimension parallel to said film at the location where said hole adjoins said film; and wherein said film is permanently attached to said plate; and
said film has less that about 4% by weight of at least one of the elements selected from sulfur, phosphorus, and chlorine.
2. The apparatus of claim 1 , wherein the plates are chemically inert under the conditions of use.
3. The apparatus of claim 1 , wherein the hole is shaped so that the length of a contact line diminishes for at least a portion of a time in which the volume of a solution in the hole is reduced, and wherein the contact line is defined by the solution and the solid surf ace of the hole.
4. The apparatus of claim 1 , wherein the film deforms by a minimum distance of 100 nm from the plane defined by the perimeter of where the hole adjoins the film.
5. The apparatus of claim 1 , wherein the hole is configured to allow volumes of solution between 2 microliters and 2 milliliters to be prepared for measurement by X-ray fluorescence.
6. The apparatus of claim 1 , wherein the hole is configured to allow volumes of solution between 10 microliters and 250 microliters to be prepared for measurement by X-ray fluorescence.
7. The apparatus of claim 1 , wherein the diameter of the hole at the location where said hole adjoins said film is within a factor of 100 times greater or 100 times smaller than the area of an X-ray excitation beam as it illuminates the samples.
8. An apparatus for preparing one or more samples for measurement by X-ray fluorescence spectrometry, the apparatus comprising:
a plate having at least one hole penetrating said plate;
a film covering said hole oriented normal to said film; and
wherein the hole is shaped so that the length of a contact line diminishes for at least a portion of a time during which the volume of a solution in the hole is reduced, and
the contact line is defined by the solution and the solid surface of the holes; and
wherein the hole is wider where it adjoins the film than where the hole is at its narrowest; and
wherein said film is permanently attached to said plate.
9. The apparatus of claim 8 , wherein said hole has a diameter between 10 micrometers and two millimeters in at least one dimension parallel to said film at the location where said hole adjoins said film.
10. The apparatus of claim 8 , wherein the film has less that about 4% by weight of at least one of the elements selected from sulfur, phosphorus, and chlorine.
11. The apparatus of claim 8 , wherein the film deforms by a minimum distance of 100 nm from the plane defined by the perimeter of where the hole adjoins the film.
12. The apparatus of claim 8 , wherein the hole is configured to allow a volume of solution between 2 microliters and 2 milliliters to be prepared for measurement by X-ray fluorescence.
13. The apparatus of claim 8 , wherein the hole is configured to allow a volume of solution between 10 microliters and 250 microliters to be prepared for measurement by X-ray fluorescence.
14. The apparatus of claim 8 , wherein the diameter of the hole at the location where said hole adjoins said film is within a factor of 100 times greater or 100 times smaller than the area of an X-ray excitation beam as it illuminates the sample.