Compound microscope
A compound microscope of an optical microscope and a scanning probe microscope includes a stage to support a sample substrate holding a sample, and a cantilever chip having a substrate, a cantilever supported by the substrate, and a probe provided at the free end of the cantilever. The compound microscope further includes a scanner to hold the cantilever chip so that the probe faces the sample substrate and so that the substrate is inclined with respect to the sample substrate and to three-dimensionally scan the cantilever chip with respect to the sample substrate, a displacement sensor to optically detect the displacement of the cantilever, and an illumination light source to apply illumination light for observation by the optical microscope to the sample through the space between the substrate and the sample substrate.
1. A compound microscope of an optical microscope and a scanning probe microscope, the compound microscope comprising:
a stage to support a sample substrate holding a sample;
a cantilever chip comprising a substrate, a cantilever supported by the substrate, a probe provided at a free end of the cantilever;
a scanner to hold the cantilever chip so that the probe faces the sample substrate and so that the substrate is inclined with respect to the sample substrate and to three-dimensionally scan the cantilever chip with respect to the sample substrate;
a displacement sensor to optically detect the displacement of the cantilever; and
an illumination light source to apply illumination light for observation by the optical microscope to the sample through a space between the substrate and the sample substrate, the illumination light source being arranged such that the illumination light is emitted from an end of the substrate opposite to the free end of the cantilever.
2. The compound microscope according to claim 1 , comprising a housing holding the scanner and the displacement sensor,
wherein the housing has an inclined plane inclined with respect to the sample substrate, and the inclination angle of the inclined plane with respect to the sample substrate is equal to or more than the inclination angle of the substrate with respect to the sample substrate, and
the illumination light source applies the illumination light to the sample through the space between the inclined plane and the stage.
3. The compound microscope according to claim 2 , wherein the illumination light source is held on the inclined plane.
4. The compound microscope according to claim 1 , comprising a housing holding the scanner and the displacement sensor,
wherein the housing has a mirror surface inclined with respect to the sample substrate, and the inclination angle of the mirror surface with respect to the sample substrate is equal to or less than the inclination angle of the substrate with respect to the sample substrate, and
the illumination light source applies the illumination light to the sample via reflection by the mirror surface.
5. The compound microscope according to claim 1 , wherein the illumination light source includes light-emitting elements, and the light-emitting elements are arranged so that the optical axes thereof extend over from the sample.
6. The compound microscope according to claim 1 , wherein the inclination angle of the substrate with respect to the sample substrate is 5 degrees to 15 degrees.
7. The compound microscope according to claim 1 , wherein the optical microscope comprises an inverted optical microscope configured to observe the sample through the sample substrate.
8. The compound microscope according to claim 1 , comprising an illumination light source that emits light for observing the sample through the optical microscope, the illumination light source and the cantilever chip being arranged such that the illumination light is reflected towards the sample from at least one of the substrate and the cantilever.