IP Library Granted Patent US 9,638,761
Granted Patent B2
US 9,638,761 · App. 14/518,427 · Granted May 2, 2017

Magnetic sensor circuit with power supply fluctuation detection

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Quick Facts
Patent No.
US 9,638,761
App. No.
14/518,427
Granted
May 2, 2017
Kind
B2
Abstract

To provide a magnetic sensor circuit that outputs a desired detection pulse while preventing an erroneous detection/erroneous release pulse output when a fluctuation in a power supply voltage occurs within an operating power supply voltage range. A magnetic sensor circuit is configured to include a detection circuit that detects a fluctuation in a power supply voltage or an internal power supply voltage and so as not to latch a determination output of a comparator by a latch circuit that, on the basis of a power supply fluctuation detection signal output from the detection circuit, holds the logic of a control clock signal output from an oscillation circuit for a prescribed period of time and determines the output logic of an output terminal.

Claims (25)

1. A magnetic sensor circuit, comprising:

a magnetoelectric transducer;

a switch group configured to switch a current supply terminal pair and a voltage output terminal pair of the magnetoelectric transducer;

an amplifier circuit configured to amplify a voltage output from the magnetoelectric transducer, said voltage being obtained through the switch group;

at least one sampling capacitor configured to hold the output voltage of the amplifier circuit to perform an offset cancellation operation;

an oscillation circuit configured to generate a control clock signal;

a reference voltage circuit configured to generate a reference voltage used in magnetism determination, corresponding to a prescribed applied magnetic flux density;

a comparison circuit having a first inversion input connected to the sampling capacitor and a switch connected between an output terminal and the first inversion input of the comparison circuit, and configured to compare and determining the size relationship between a voltage proportional to an applied magnetic flux density after offset cancellation, said voltage being held in the sampling capacitor, and the reference voltage generated by the reference voltage circuit depending upon an open or closed configuration of the switch;

a latch circuit configured to hold an output signal of the comparison circuit, based on the control clock signal;

an output terminal configured to output an output signal of the magnetic sensor circuit to the outside, based on an output logic of the latch circuit; and

a power supply fluctuation detecting circuit configured to detect that an amount of fluctuation in a power supply voltage exceeds a prescribed amount, and outputs a detection signal,

wherein the oscillation circuit stops an oscillation operation by the detection signal output from the power supply fluctuation detecting circuit during a prescribed period and maintains an output voltage of the control clock signal for a predetermined period of time to thereby fix the output logic of the latch circuit.

2. A magnetic sensor circuit, comprising:

a magnetoelectric transducer;

a switch group configured to switch a current supply terminal pair and a voltage output terminal pair of the magnetoelectric transducer;

an amplifier circuit configured to amplify a voltage output from the magnetoelectric transducer, said voltage being obtained through the switch group;

at least one sampling capacitor configured to hold the output voltage of the amplifier circuit to perform an offset cancellation operation;

an oscillation circuit configured to generate a control clock signal;

a reference voltage circuit configured to generate a reference voltage used in magnetism determination, corresponding to a prescribed applied magnetic flux density;

a comparison circuit configured to compare and determining the size relationship between a voltage proportional to an applied magnetic flux density after offset cancellation, said voltage being held in the sampling capacitor, and the reference voltage generated by the reference voltage circuit;

a latch circuit configured to hold an output signal of the comparison circuit, based on the control clock signal;

an output terminal configured to output an output signal of the magnetic sensor circuit to the outside, based on an output logic of the latch circuit; and

a voltage regulator connected between the magnetoelectric transducer and an internal power supply fluctuation detecting circuit, the voltage regulator configured to supply an internal power supply voltage, and

the internal power supply fluctuation detecting circuit configured to detect that an amount of fluctuation in the internal power supply voltage exceeds a prescribed amount, and outputs a detection signal,

wherein the oscillation circuit stops an oscillation operation by the detection signal output from the internal power supply fluctuation detecting circuit during a prescribed period and maintains an output voltage of the control clock signal for a prescribed period of time to thereby fix the output logic of the latch circuit.

Assignments (5)
CHANGE OF ADDRESS Recorded Jun 8, 2023
From: ABLIC INC.
To: ABLIC INC.
Reel/Frame 064021/0575 →
CHANGE OF NAME Recorded Mar 12, 2018
From: SII SEMICONDUCTOR CORPORATION
To: ABLIC INC.
Reel/Frame 045567/0927 →
CORRECTIVE ASSIGNMENT TO CORRECT THE EXECUTION DATE PREVIOUSLY RECORDED AT REEL: 037783 FRAME: 0166. ASSIGNOR(S) HEREBY CONFIRMS THE ASSIGNMENT. Recorded Feb 23, 2016
From: SEIKO INSTRUMENTS INC
To: SII SEMICONDUCTOR CORPORATION
Reel/Frame 037903/0928 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Feb 11, 2016
From: SEIKO INSTRUMENTS INC
To: SII SEMICONDUCTOR CORPORATION .
Reel/Frame 037783/0166 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Oct 21, 2014
From: HIKICHI, TOMOKI; MURAOKA, DAISUKE; ARIYAMA, MINORU; FUKAI, KENTARO
To: SEIKO INSTRUMENTS INC.
Reel/Frame 033990/0583 →