IP Library Granted Patent US 9,230,681
Granted Patent B2
US 9,230,681 · App. 14/526,833 · Granted Jan 5, 2016

Selective activation of programming schemes in analog memory cell arrays

Inventors: Dotan Sokolov (Ra'anana, IL); Naftali Sommer (Rishon Lezion, IL); Uri Perlmutter (Ra'anana, IL); Ofir Shalvi (Ra'anana, IL)
Assignee: Apple Inc.
G11C27/005G11C7/02G11C11/5628G11C16/3418
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Quick Facts
Patent No.
US 9,230,681
App. No.
14/526,833
Granted
Jan 5, 2016
Kind
B2
Abstract

A method for data storage includes defining a first programming scheme that programs a group of analog memory cells while reducing interference caused by at least one memory cell that neighbors the group, and a second programming scheme that programs the group of the analog memory cells and does not reduce all of the interference reduced by the first programming scheme. One of the first and second programming schemes is selected based on a criterion defined with respect to the analog memory cells. Data is stored in the group of the analog memory cells using the selected programming scheme.

Claims (33)

1. An apparatus, comprising:

a plurality of memory cells; and

circuitry configured to:

select one of a first programming scheme and a second programming scheme dependent upon a criterion;

wherein peak power consumed while programming using the first programming scheme is greater than peak power consumed while programming using the second programming scheme; and

store data in a subset of the plurality of memory cells using the selected programming scheme.

2. The apparatus of claim 1 , wherein a programming speed while programming using the first programming scheme is faster than a programming speed while programming using the second programming scheme.

3. The apparatus of claim 1 , wherein the criterion depends on a number of memory cells included in the subset of the plurality of memory cells.

4. The apparatus of claim 1 , wherein the criterion depends on a number of Programming and Erasure (P/E) cycles previously applied to memory cells included in the subset of the plurality of memory cells.

5. The apparatus of claim 1 , wherein the criterion depends on a number of read errors encountered when reading memory cells included in the subset of the plurality of memory cells.

6. The apparatus of claim 1 , wherein a number of memory cells programmed in parallel using the first programming scheme is greater than a number of memory cells programmed in parallel using the second programming scheme.

7. A method for operating a memory, wherein the memory includes a plurality of memory cells, the method comprising:

selecting one of a first programming scheme and a second programming scheme dependent upon a criterion;

wherein peak power consumed while programming using the first programming scheme is greater than peak power consumed while programming using the second programming scheme; and

storing data in a subset of the plurality of memory cells using the selected programming scheme.

8. The method of claim 7 , wherein a programming speed while programming using the first programming scheme is faster than a programming speed while programming using the second programming scheme.

9. The method of claim 7 , wherein the criterion depends on a number of memory cells included in the subset of the plurality of memory cells.

10. The method of claim 7 , wherein the criterion depends on a number of Programming and Erasure (P/E) cycles previously applied to memory cells included in the subset of the plurality of memory cells.

11. The method of claim 7 , wherein the criterion depends on a number of read errors encountered when reading memory cells included in the subset of the plurality of memory cells.

12. The method of claim 7 , wherein a number of memory cells programmed in parallel using the first programming scheme is greater than a number of memory cells programmed in parallel using the second programming scheme.

13. The method of claim 7 , wherein the criterion depends on a supply voltage of the memory.

14. The method of claim 7 , wherein the criterion depends on a temperature of each memory cell in the subset of the plurality of memory cells.

15. A system, comprising:

a memory device including a plurality of memory cells; and

a controller configured to:

select one of a first programming scheme and a second programming scheme dependent upon a criterion;

wherein peak power consumed while programming using the first programming scheme is greater than peak power consumed while programming using the second programming scheme; and

store data in a subset of the plurality of memory cells using the selected programming scheme.

16. The system of claim 15 , wherein a programming speed while programming using the first programming scheme is faster than a programming speed while programming using the second programming scheme.

17. The system of claim 15 , wherein the criterion depends on a number of memory cells included in the subset of the plurality of memory cells.

18. The system of claim 15 , wherein the criterion depends on a number of Programming and Erasure (P/E) cycles previously applied memory cells included in the subset of the plurality of memory cells.

19. The system of claim 15 , wherein the criterion depends on a number of read errors encountered when reading memory cells included in the subset of the plurality of memory cells.

20. The system of claim 15 , wherein a number of memory cells programmed in parallel using the first programming scheme is greater than a number of memory cells programmed in parallel using the second programming scheme.

Continuity (4)
Continuation 13532700 · Jun 25, 2012
Division 12714501 · Feb 28, 2010
Provisional Application 61156520 · Mar 1, 2009
Related Publication 20150055388A1 · Feb 26, 2015