IP Library Granted Patent US 9,124,292
Granted Patent B2
US 9,124,292 · App. 14/537,532 · Granted Sep 1, 2015

System, method and recording medium for analog to digital converter calibration

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Quick Facts
Patent No.
US 9,124,292
App. No.
14/537,532
Granted
Sep 1, 2015
Kind
B2
Abstract

A calibration system for an analog-to-digital converter (ADC) an internal ADC that receives an analog input and converts the analog input to digital multi-bit data. The calibration system also includes a reference shuffling circuit that shuffles reference values of comparators of the internal ADC. Further, the calibration system includes a calibration circuit that calibrates the comparators of the internal ADC. The calibration system includes a digital block that measures an amplitude based on the digital multi-bit data. Additionally, the calibration system includes calibration logic that controls the calibration circuit based on an output of the digital block.

Claims (30)

1. A calibration method for an analog-to-digital converter (ADC), the method comprising:

receiving an analog input;

converting the analog input to digital multi-bit data at the ADC;

receiving, at the ADC, a training signal where the statistics of the signal are known and cause states of the ADC to experience transitions over time;

measuring an amplitude based on the digital multi-bit data; and

adjusting a calibration circuit of the ADC based on the amplitude.

2. The calibration method of claim 1 , wherein the adjusting the calibration circuit changes an offset of the ADC.

3. The calibration method of claim 1 , wherein the measuring is implemented in conjunction with a power meter that estimates an output power of the ADC by sub-sampling an output of the ADC.

4. The calibration method of claim 1 , wherein the method is performed with calibration logic implemented as an off-chip architecture.

5. The calibration method of claim 1 , wherein the analog input is received from a noise source.

6. The calibration method of claim 5 , wherein the noise source is a loop filter.

7. The calibration method of claim 1 , wherein the method is performed with calibration logic implemented as an on-chip architecture.

8. An apparatus that performs a calibration method for an analog-to-digital converter (ADC), the apparatus comprising:

means for converting an analog input to digital multi-bit data and for receiving a training signal where the statistics of the signal are known and cause states of the means for converting to experience transitions over time;

means for measuring an amplitude based on the digital multi-bit data; and

means for adjusting the means for converting, based on the amplitude.

9. The apparatus of claim 8 , wherein the means for adjusting changes an offset of the means for converting.

10. The apparatus of claim 8 , wherein the means for measuring is implemented in conjunction with means for estimating an output power of the ADC by sub-sampling an output of the means for converting.

11. The apparatus of claim 8 , wherein the means for adjusting is implemented as an off-chip architecture.

12. The apparatus of claim 8 , wherein the means for converting receives the analog input from means for providing noise.

13. An apparatus that performs a calibration, the apparatus comprising:

an analog-to-digital converter (ADC) that converts an analog input to digital multi-bit data and receives a training signal, wherein statistics of the training signal are known, and the training signal causes states of the ADC to experience transitions over time;

a calibration circuit that calibrates a plurality of comparators of the ADC;

a digital block that measures an amplitude of the digital multi-bit data; and

calibration logic configured to control the calibration circuit, based on the amplitude.

14. The apparatus of claim 13 , wherein the calibration logic changes an offset of the ADC.

15. The apparatus of claim 13 , wherein the digital block is implemented in conjunction with a power meter that estimates an output power of the ADC by sub-sampling an output of the ADC.

16. The apparatus of claim 13 , wherein the calibration logic is implemented as an off-chip architecture.

17. The apparatus of claim 13 , wherein the ADC receives the analog input from a noise source.

18. The apparatus of claim 13 , wherein an output of the digital block includes at least one of a root mean square of the amplitude of the digital multi-bit data and a mean of the amplitude of the digital multi-bit data.

Assignments (3)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Feb 25, 2022
From: ANALOG DEVICES GLOBAL UNLIMITED COMPANY
To: ANALOG DEVICES INTERNATIONAL UNLIMITED COMPANY
Reel/Frame 059103/0863 →
CHANGE OF NAME Recorded Feb 24, 2022
From: ANALOG DEVICES GLOBAL
To: ANALOG DEVICES GLOBAL UNLIMITED COMPANY
Reel/Frame 059094/0332 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jan 21, 2015
From: LI, ZHAO; BHAL, SHIPRA; GARD, KEVIN GLENN; ALLDRED, DAVID NELSON; MAYER, CHRISTOPHER; CALDWELL, TREVOR CLIFFORD; MCLAURIN, DAVID J.; KOZLOV, VICTOR
To: ANALOG DEVICES GLOBAL
Reel/Frame 034780/0552 →