IP Library Granted Patent US 9,983,396
Granted Patent B2
US 9,983,396 · App. 14/543,394 · Granted May 29, 2018

Scanning microscope having focal position adjustment unit which includes a deflecting element

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Quick Facts
Patent No.
US 9,983,396
App. No.
14/543,394
Granted
May 29, 2018
Kind
B2
Abstract

A scanning microscope includes a collecting lens that takes in a detection light, a focal position adjustment unit that moves in an optical axis direction of the collecting lens to make the collecting lens move in the optical axis direction, a detector positioned at a location that is optically conjugate to a pupil of the collecting lens, and a relay optical system that relays the pupil to the detector. The relay optical system includes a first optical element with a positive power, the first optical element being positioned in the focal position adjustment unit and converting the detection light that was converted by the collecting lens into a parallel light flux, into a convergent light flux to be emitted outside of the focal position adjustment unit, and a second optical element that is positioned outside of the focal position adjustment unit and between the detector and the first optical element.

Claims (50)

1. A multi-photon excitation laser scanning microscope comprising:

a collecting lens configured to take in a detection light from a sample and convert the detection light into a parallel light flux;

a detector positioned at a location that is optically conjugate to a pupil of the collecting lens, the detector being disposed at a body of the microscope;

a relay optical system that relays the pupil of the collecting lens to the detector, the relay optical system including a plurality of optical elements; and

a focal position adjustment unit configured to move in an optical axis direction of the collecting lens together with the collecting lens and some of the plurality of optical elements of the relay optical system, so as to move the collecting lens and said some of the plurality of optical elements of the relay optical system in the optical axis direction,

wherein the detector is disposed at the body of the microscope so as not be movable by the focal position adjustment unit, such that the focal position adjustment unit is configured to move the collecting lens and said some of the plurality of optical elements of the relay optical system in the optical axis direction with respect to the detector,

wherein the relay optical system comprises:

a first optical element having a positive power, the first optical element being positioned in the focal position adjustment unit and configured to convert the detection light that was converted by the collecting lens into the parallel light flux, into a convergent light flux to be emitted outside of the focal position adjustment unit;

a wavelength branching element configured to reflect the detection light and to transmit an illumination light, wherein the wavelength branching element branches, according to wavelength, an optical path of the detection light and an optical path of the illumination light, and wherein the wavelength branching element is positioned in the focal position adjustment unit and between the collecting lens and the first optical element;

a deflection element that deflects the detection light in a direction that is parallel to the optical axis of the collecting lens, the deflection element being positioned in the focal position adjustment unit and between the detector and the wavelength branching element; and

a second optical element having a positive power, the second optical element being positioned outside of the focal position adjustment unit and between the detector and the first optical element,

wherein said some of the plurality of optical elements of the relay optical system which are configured to be moved together with the collecting lens in the optical axis direction by the focal position adjustment unit comprise the first optical element, the wavelength branching element, and the deflection element, and

wherein the second optical element, which is positioned outside of the focal position adjustment unit, is configured so as not to be movable by the focal position adjustment unit.

2. The multi-photon excitation laser scanning microscope according to claim 1 , wherein the first optical element is an optical system in which a focal length is variable.

3. The multi-photon excitation laser scanning microscope according to claim 1 , wherein the focal position adjustment unit is provided in an epi-illumination detection optical path.

4. The multi-photon excitation laser scanning microscope according to claim 1 , wherein the focal position adjustment unit is provided in a transmission detection optical path.

5. The multi-photon excitation laser scanning microscope according to claim 1 , wherein the focal position adjustment unit further comprises a housing,

wherein the first optical element is provided in the housing, and

wherein the second optical element is provided outside of the housing.

6. The multi-photon excitation laser scanning microscope according to claim 5 , wherein the collecting lens is provided outside of the housing.

7. The multi-photon excitation laser scanning microscope according to claim 6 , wherein the focal position adjustment unit further comprises:

a revolver arm on which the housing is provided; and

a revolver supported by the revolver arm, and

wherein the collecting lens is attached to the revolver.

8. The multi-photon excitation laser scanning microscope according to claim 1 , wherein the focal position adjustment unit further comprises a housing,

wherein the first optical element and the wavelength branching element are provided in the housing, and

wherein the second optical element is provided outside of the housing.

9. The multi-photon excitation laser scanning microscope according to claim 1 , wherein the focal position adjustment unit further comprises a housing,

wherein the first optical element, the wavelength branching element, and the deflection element are provided in the housing, and

wherein the second optical element is provided outside of the housing.

10. The multi-photon excitation laser scanning microscope according to claim 9 , further comprising another deflection element which is positioned to receive the detection light deflected by the deflection element and deflect the detection light toward the second optical element,

wherein said another deflection element is provided outside of the housing.

11. The multi-photon excitation laser scanning microscope according to claim 1 , further comprising another deflection element which is positioned to receive the detection light deflected by the deflection element and deflect the detection light toward the second optical element.

12. A multi-photon excitation laser scanning microscope comprising:

a collecting lens configured to take in a detection light from a sample and convert the detection light into a parallel light flux;

a detector positioned at a location that is optically conjugate to a pupil of the collecting lens, the detector being disposed at a body of the microscope;

a relay optical system that relays the pupil of the collecting lens to the detector, the relay optical system including a plurality of optical elements; and

a focal position adjustment unit configured to move in an optical axis direction of the collecting lens together with the collecting lens and some of the plurality of optical elements of the relay optical system, so as to move the collecting lens and said some of the plurality of optical elements of the relay optical system in the optical axis direction,

wherein the detector is disposed at the body of the microscope so as not be movable by the focal position adjustment unit, such that the focal position adjustment unit is configured to move the collecting lens and said some of the plurality of optical elements of the relay optical system in the optical axis direction with respect to the detector,

wherein the relay optical system comprises:

a first optical element having a positive power, the first optical element being positioned in the focal position adjustment unit, configured to convert the detection light that was converted by the collecting lens into the parallel light flux, into a convergent light flux, and configured to deflect the detection light in a direction that is parallel to the optical axis of the collecting lens to be emitted outside of the focal position adjustment unit;

a wavelength branching element configured to reflect the detection light and to transmit an illumination light, wherein the wavelength branching element branches, according to wavelength, an optical path of the detection light and an optical path of the illumination light, and wherein the wavelength branching element is positioned in the focal position adjustment unit and between the collecting lens and the first optical element; and

a second optical element having a positive power, the second optical element being positioned outside of the focal position adjustment unit and between the detector and the first optical element,

wherein said some of the plurality of optical elements of the relay optical system which are configured to be moved together with the collecting lens in the optical axis direction by the focal position adjustment unit comprise the first optical element and the wavelength branching element, and

wherein the second optical element, which is positioned outside of the focal position adjustment unit, is configured so as not to be movable by the focal position adjustment unit.

13. The multi-photon excitation laser scanning microscope according to claim 12 , wherein the first optical element is a concave mirror.

14. The multi-photon excitation laser scanning microscope according to claim 12 , wherein the first optical element is a deformable mirror.

15. The multi-photon excitation laser scanning microscope according to claim 12 , wherein the first optical element is an optical system in which a focal length is variable.

16. The multi-photon excitation laser scanning microscope according to claim 12 , wherein the focal position adjustment unit is provided in an epi-illumination detection optical path.

17. The multi-photon excitation laser scanning microscope according to claim 12 , wherein the focal position adjustment unit is provided in a transmission detection optical path.

Assignments (3)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jan 25, 2023
From: OLYMPUS CORPORATION
To: EVIDENT CORPORATION
Reel/Frame 062492/0267 →
CHANGE OF ADDRESS Recorded Jun 15, 2017
From: OLYMPUS CORPORATION
To: OLYMPUS CORPORATION
Reel/Frame 042821/0621 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Nov 17, 2014
From: TAMANO, SHINGO
To: OLYMPUS CORPORATION
Reel/Frame 034190/0127 →